Magnetic particle imaging

Patent metadata

Field	Value
Publication number	US-11204398-B2
Application number	US-201715648401-A
Country	US
Kind code	B2
Filing date	Jul 12, 2017
Priority date	Jul 12, 2016
Publication date	Dec 21, 2021
Grant date	Dec 21, 2021

Abstract

A Magnetic Particle Imaging (MPI) system with a magnet configured to generate a magnetic field with a field free line, the magnet integrated with a flux return designed so that a flux path at approximately the center of the field-free line has a first reluctance and a second flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance to facilitate a high fidelity magnetic field and high fidelity field free line.

First claim

The invention claimed is:

1. A Magnetic Particle Imaging (MPI) system comprising:
a magnet configured to generate a magnetic field comprising:
a field-free line within the magnetic field having an axis and a center; and
a flux return integrated with the magnet configured such that a first magnetic flux path at approximately the center of the field-free line has a first reluctance and a second magnetic flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance, the flux return comprising a pole piece having an end, the end including a step.

2. The magnetic particle imaging system of claim 1 , the flux return further comprising a plurality of laminations, wherein the first magnetic flux path passes through a first lamination and the second magnetic flux path passes through a second lamination and wherein the first lamination and second lamination form the step.

3. The magnetic particle imaging system of claim 1 , the flux return comprising a pole piece with a taper that increases a magnetic flux density near the taper and proximate the field-free line.

4. The magnetic particle imaging system of claim 1 , the flux return comprising:
at least one a flux return arm positioned further from the field-free line than the pole piece.

5. The magnetic particle imaging system of claim 4 , wherein the at least one flux return arm is angled toward the field-free line at the imaging volume.

6. A Magnetic Particle Imaging (MPI) system comprising:
a magnet configured to generate a magnetic field comprising:
a field-free line within the magnetic field having an axis and a center; and
a flux return integrated with the magnet configured such that a first magnetic flux path at approximately the center of the field-free line has a first reluctance and a second magnetic flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance, the flux return including a pole piece having an end, wherein the end is curved or smoothly varying.

7. A Magnetic Particle Imaging (MPI) system comprising:
a magnet configured to generate a magnetic field comprising:
a field-free line within the magnetic field having an axis and a center; and
a flux return integrated with the magnet configured such that a first magnetic flux path at approximately the center of the field-free line has a first reluctance and a second magnetic flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance wherein the second reluctance is lower than the first reluctance at least partially by virtue of the flux return including a lower reluctance material in the vicinity of the second magnetic flux path than the reluctance of the material in the vicinity of the first magnetic flux path.

Assignees

• Magnetic Insight Inc
• Univ California

Inventors

• Goodwill Patrick W

Classifications

• G01R33/0213

  using deviation of charged particles by the magnetic field · CPC title

• G01N27/72

  by investigating magnetic variables · CPC title

• G01R33/1276 Primary

  of magnetic particles, e.g. imaging of magnetic nanoparticles (G01R33/1269 takes precedence) · CPC title

• G01R33/10

  Plotting field distribution {; Measuring field distribution} · CPC title

• A61B5/0515

  Magnetic particle imaging · CPC title