Electric connection device

Patent metadata

Field	Value
Publication number	US-11150268-B2
Application number	US-201816617722-A
Country	US
Kind code	B2
Filing date	May 17, 2018
Priority date	May 30, 2017
Publication date	Oct 19, 2021
Grant date	Oct 19, 2021

Abstract

An electric connection device, includes: a circuit trace-included member (30); a probe (10) including a base that connects to a circuit trace formed in the circuit trace-included member (30) and a tip that comes into contact with an inspection subject (2); a probe head (20) which is provided next to the circuit trace-included member (30) and holds the probe (10); and a fixing component (100) which is located in the probe head (20) with an end protruding from the probe head (20) toward the circuit trace-included member (30), the end being fixed to a fixing surface (301) of the circuit trace-included member (30) that faces the probe head (20) to connect the probe head (20) and the circuit trace-included member (30).

First claim

What is claimed is:

1. An electric connection device, comprising:
a circuit trace-included member comprising a fixing surface, an upper surface opposed to the fixing surface, a circuit trace provided on the fixing surface, and a circuit trace provided on the upper surface;
a probe including a base that connects to the circuit trace provided on the fixing surface of the circuit trace-included member and a tip that comes into contact with an inspection subject;
a probe head which is provided next to the circuit trace-included member and holds the probe; and
a fixing component which is provided in the probe head with an end protruding from the probe head toward the circuit trace-included member, the end being fixed to the fixing surface of the circuit trace-included member that faces the probe head to connect the probe head to the circuit trace-included member;
wherein the circuit trace, which is provided on the fixing surface of the circuit trace-included member and is connected to the base of the probe, is connected to the circuit trace provided on the upper surface of the circuit trace-included member;
wherein a length of a part exposed between the probe head and the circuit trace-included member in the fixing component is controllable to adjust a distance between the probe head and the circuit trace-included member; and
wherein the fixing component penetrates the probe head and is adjustably coupled to the circuit-trace included member.

2. The electric connection device according to claim 1 , wherein
the fixing component is pin-shaped, and
a shaft of the fixing component penetrates the probe head while a head of the fixing component that connects to the shaft is in contact with the probe head.

3. The electric connection device according to claim 1 , wherein
an anchor that connects to the end is provided on the fixing surface.

4. The electric connection device according to claim 3 , wherein
the fixing component is screwed into the anchor.

5. The electric connection device according to claim 3 , wherein
the anchor is provided within a recess provided in the fixing surface of the circuit trace-included member.

6. The electric connection device according to claim 1 , wherein
the circuit trace-included member is a space transformer to allow spacing between circuit traces to be wider than spacing between probes.

Assignees

• Nihon Micronics Kk

Inventors

• Ito Tatsuya

Classifications

• G01R1/07378 Primary

  using an intermediate adapter, e.g. space transformers (G01R1/07371 takes precedence) · CPC title

• G01R1/07307 Primary

  with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card · CPC title

• H01R12/7047

  with a fastener through a screw hole in the coupling device · CPC title

• H01R2201/20

  for testing or measuring purposes · CPC title

• G01R1/0408 Primary

  Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title