Method for characterization of photonic devices, and associated device

Patent metadata

Field	Value
Publication number	US-11131602-B2
Application number	US-201816188537-A
Country	US
Kind code	B2
Filing date	Nov 13, 2018
Priority date	Jul 28, 2016
Publication date	Sep 28, 2021
Grant date	Sep 28, 2021

Abstract

An intermediate signal is separated into a first sub-signal and a second sub-signal according to a separation coefficient having a known real value. The first sub-signal is delivered to a first photonic circuit containing at least one photonic device to be characterized and a first photonic part. The second sub-signal is delivered to a second photonic circuit containing a second photonic part having a same transfer function as the first photonic part but lacking the at least one photonic device. Optical output signals from the first and second photonic circuits are converted into first and second electrical signals. Losses of the at least one photonic device are determined from processing the electrical signals and from the known real value of the separation coefficient.

First claim

The invention claimed is:

1. A circuit, comprising:
a first optical separator configured to separate a first signal derived from an optical input signal into a first sub-signal and a second sub-signal according to a separation coefficient having a theoretical value;
a second optical separator configured to separate the second sub-signal into a third sub-signal and a fourth sub-signal according to the separation coefficient having the theoretical value;
a third optical separator configured to separate the fourth sub-signal into a fifth sub-signal and a sixth sub-signal according to the separation coefficient having the theoretical value;
a first photonic circuit configured to receive the fifth sub-signal and containing at least one photonic device and a first photonic part;
a second photonic circuit configured to receive the sixth sub-signal and containing a second photonic part having a same transfer function as the first photonic part and lacking the at least one photonic device;
circuitry configured to convert the first and third sub-signals into first and second electrical signals, respectively, and convert output optical signals from the first and second photonic circuits into third and fourth electrical signals, respectively; and
a processing circuit configured to determine a real value of the separation coefficient from the first and second electrical signals and determine optical losses of the at least one photonic device from the third and fourth electrical signals and the determined real value of the separation coefficient.

2. The circuit of claim 1 , wherein the determined optical losses represent a transfer function of the at least one photonic device.

3. The circuit of claim 1 , wherein the processing circuit determines optical losses by calculating a ratio of third electrical signal power to fourth electrical signal power and multiplying the ratio by a constant derived from the determined real value of the separation coefficient.

4. The circuit of claim 1 , wherein the circuitry configured to convert comprises photosensing circuits that receive the first and third sub-signals and generate the first and second electrical signals.

5. The circuit of claim 4 , wherein the photosensing circuits are photodiodes.

6. The circuit of claim 1 , wherein said processing circuit determines the real value of the separation coefficient by calculating a ratio of second electrical signal power to first electrical signal power.

7. The circuit claim 1 , wherein the circuitry configured to convert the first and third sub-signals comprises photosensing circuits that receive the first and third sub-signals and generate the first and second electrical signals.

8. The circuit of claim 7 , wherein the photosensing circuits are photodiodes.

9. The circuit claim 1 , wherein the first and second optical separators are identical to each other and are supported on a semiconductor wafer.

10. The circuit of claim 1 , wherein the first, second and third optical separators are identical to each other and are supported on a semiconductor wafer.

11. A circuit, comprising:
a first optical separator configured to separate a first signal derived from an optical input signal into a first sub-signal and a second sub-signal according to a first separation coefficient having a theoretical value;
a second optical separator configured to separate the second sub-signal into a third sub-signal and a fourth sub-signal according to a second separation coefficient having the same theoretical value;
a third optical separator configured to separate the fourth sub-signal into a fifth sub-signal and a sixth sub-signal according to a third separation coefficient having the same theoretical value;
a first photonic circuit configured to receive the fifth sub-signal and containing at least one photonic device and a first photonic part;
a second photonic circuit configured to receive the sixth sub-signal and containing a second photonic part having a same transfer function as the first photonic part and lacking the at least one photonic device;
circuitry configured to convert the first and third sub-signals into first and second electrical signals, respectively, and convert output optical signals from the first and second photonic circuits into third and fourth electrical signals, respectively; and
a processing circuit configured to determine a real value of the first and second separation coefficients from the first and second electrical signals and determine optical losses of the at least one photonic device from the third and fourth electrical signals and the determined real value of the first and second separation coefficients.

12. The circuit of claim 11 , wherein the determined optical losses represent a transfer function of the at least one photonic device.

13. The circuit of claim 11 , wherein the processing circuit determines optical losses by calculating a ratio of third electrical signal power to fourth electrical signal power and multiplying the ratio by a constant derived from the determined real value of the first and second separation coefficients.

14. The circuit of claim 11 , wherein the circuitry configured to convert comprises photosensing circuits that receive the first and third sub-signals and generate the first and second electrical signals.

15. The circuit of claim 14 , wherein the photosensing circuits are photodiodes.

16. The circuit of claim 11 , wherein the first, second and third optical separators are identical to each other and are supported on a semiconductor wafer.

17. The circuit of claim 11 , wherein said processing circuit determines the real value of the first and second separation coefficient by calculating a ratio of second electrical signal power to first electrical signal power.

18. The circuit claim 11 , wherein the circuitry configured to convert the first and third sub-signals comprises photosensing circuits that receive the first and third sub-signals and generate the first and second electrical signals.

19. The circuit of claim 18 , wherein the photosensing circuits are photodiodes.

20. The circuit claim 11 , wherein the first and second optical separators are identical to each other and are supported on a semiconductor wafer.

Assignees

• St Microelectronics Crolles 2 Sas

Inventors

• Le Maitre Patrick
• Carpentier Jean-Francois

Classifications

• G01M11/33 Primary

  with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face · CPC title

• G01M11/30

  Testing of optical devices, constituted by fibre optics or optical waveguides · CPC title

• H04B10/07

  Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems · CPC title

• H04B10/0795 Primary

  Performance monitoring; Measurement of transmission parameters · CPC title