Processes to reduce interfacial enrichment of alloying elements under anodic oxide films and improve anodized appearance of heat treatable alloys

Patent metadata

Field	Value
Publication number	US-11111594-B2
Application number	US-201615135458-A
Country	US
Kind code	B2
Filing date	Apr 21, 2016
Priority date	Jan 9, 2015
Publication date	Sep 7, 2021
Grant date	Sep 7, 2021

Abstract

Anodic oxide coatings and methods for forming anodic oxide coatings on metal alloy substrates are disclosed. Methods involve post-anodizing processes that improve the appearance of the anodic oxide coating or increase the strength of the underlying metal alloy substrates. In some embodiments, a diffusion promoting process is used to promote diffusion of one or more types of alloying elements enriched at an interface between the anodic oxide coating and the metal alloy substrate away from the interface. The diffusion promoting process can increase an adhesion strength of the anodic oxide film to the metal alloy substrate and reduce an amount of discoloration due to the enriched alloying elements. In some embodiments, a post-anodizing age hardening process is used to increase the strength of the metal alloy substrate and to improve cosmetics of the anodic oxide coatings.

First claim

What is claimed is:

1. An enclosure for an electronic device, comprising: an aluminum alloy substrate containing zinc, comprising:
a bulk portion having a bulk concentration of a zinc alloying element;
an enrichment layer having a thickness between 1 nanometer and 2 nanometers, the enrichment layer having an enrichment concentration of the zinc alloying element that is higher than the bulk concentration;
a diffusion portion disposed between the bulk portion and the enrichment layer and having a thickness between 1.5 nanometers and 7.12 nanometers, a concentration of the zinc alloying element transitioning from the enrichment concentration to the bulk concentration across the diffusion portion; an anodic oxide layer overlaying the enrichment layer.

2. The enclosure of claim 1 , wherein the anodic oxide layer is free of thermally-induced cracks.

3. The enclosure of claim 1 , wherein the aluminum alloy substrate further comprises a copper alloying element.

4. The enclosure of claim 1 , wherein the aluminum alloy substrate comprises a 2000 series aluminum alloy.

5. The enclosure of claim 1 , wherein the aluminum alloy substrate comprises a 7000 series aluminum alloy.

6. The enclosure of claim 1 , wherein the diffusion portion has a thickness between 1.5 nanometers and 2.2 nanometers.

7. The enclosure of claim 1 , wherein the diffusion portion has a thickness between 2.2 nanometers and 7.12 nanometers.

8. An enclosure for an electronic device, the enclosure comprising a zinc-containing aluminum alloy substrate, the zinc-containing aluminum alloy substrate comprising:
a bulk portion having a bulk concentration of a zinc alloying element;
an enrichment layer having a thickness between 1 nanometer and 2 nanometers, the enrichment layer having an enrichment concentration of the zinc alloying element that is higher than the bulk concentration;
a diffusion portion disposed between the bulk portion and the enrichment layer and having a thickness between 1.5 nanometers and 7.12 nanometers, a concentration of the zinc alloying element transitioning from the enrichment concentration to the bulk concentration across the diffusion portion; and
an anodic oxide layer overlaying the enrichment layer;
wherein the anodic oxide layer is substantially transparent to visible light.

9. The enclosure of claim 8 , wherein the anodic oxide layer is free of thermally-induced cracks.

10. The enclosure of claim 8 , wherein the aluminum alloy substrate further comprises a copper alloying element.

11. The enclosure of claim 8 , wherein the aluminum alloy substrate comprises a 2000 series aluminum alloy.

12. The enclosure of claim 8 , wherein the aluminum alloy substrate comprises a 7000 series aluminum alloy.

13. The enclosure of claim 8 , wherein the diffusion portion has a thickness between 1.5 nanometers and 2.2 nanometers.

14. The enclosure of claim 8 , wherein the diffusion portion has a thickness between 2.2 nanometers and 7.12 nanometers.

Assignees

• Apple Inc

Inventors

• Curran James A
• Counts William A
• Hamann Eric W

Classifications

• C25D11/18 Primary

  After-treatment, e.g. pore-sealing · CPC title

• C25D11/24

  Chemical after-treatment · CPC title

• C25D11/02 Primary

  Anodisation · CPC title

• C22C21/08

  with silicon · CPC title

• C22F1/047

  of alloys with magnesium as the next major constituent · CPC title