Light emitting diode chip having temperature compensation of the wavelength
US-10217896-B2 · Feb 26, 2019 · US
US11094844B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11094844-B2 |
| Application number | US-201816482487-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 22, 2018 |
| Priority date | Feb 24, 2017 |
| Publication date | Aug 17, 2021 |
| Grant date | Aug 17, 2021 |
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An optoelectronic semiconductor chip includes a p-type semiconductor region, an n-type semiconductor region, an active layer disposed between the p-type semiconductor region and the n-type semiconductor region and formed as a multiple quantum well structure and having alternating quantum well layers and barrier layers, the quantum well layers emitting a first radiation in a first wavelength range, and at least one further quantum well layer disposed outside the multiple quantum well structure that emits a second radiation in a second wavelength range, wherein the first wavelength range is in an infrared spectral range invisible to a human eye, and the second wavelength range includes wavelengths at least partially visible to the human eye.
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The invention claimed is: 1. An optoelectronic semiconductor chip comprising: a p-type semiconductor region, an n-type semiconductor region, an active layer disposed between the p-type semiconductor region and the n-type semiconductor region and formed as a multiple quantum well structure and having alternating quantum well layers and barrier layers, the quantum well layers emitting a first radiation in a first wavelength range, and at least one further quantum well layer disposed outside of and directly adjoining the multiple quantum well structure that emits a second radiation in a second wavelength range, wherein the first wavelength range is in an infrared spectral range invisible to a human eye, and the second wavelength range comprises wavelengths at least partially visible to the human eye. 2. The optoelectronic semiconductor chip according to claim 1 , wherein the second radiation has an intensity maximum at a wavelength of 750 nm to 850 nm. 3. The optoelectronic semiconductor chip according to claim 1 , wherein the first radiation has an intensity maximum at a wavelength of 850 nm to 1000 nm. 4. The optoelectronic semiconductor chip according to claim 1 , wherein the at least one further quantum well layer has an electronic band gap E QW2 larger than an electronic band gap E QW1 of the quantum well layers of the multiple quantum well structure, and E QW2 -E QW1 ≥0.1 eV applies. 5. The optoelectronic semiconductor chip according to claim 1 , wherein the quantum well layers of the multiple quantum well structure and the at least one further quantum well layer each comprise In x Al y Ga 1−x−y As or In x Al y Ga 1−x−y P with 0≤x≤1, 0≤y≤1 and x+y≤1. 6. The optoelectronic semiconductor chip according to claim 5 , wherein aluminum content y of the at least one further quantum well layer is greater than aluminum content y of the quantum well layers of the multiple quantum well structure. 7. The optoelectronic semiconductor chip according to claim 5 , wherein indium content x of the at least one further quantum well layer is smaller than indium content x of the quantum well layers of the multiple quantum well structure. 8. The optoelectronic semiconductor chip according to claim 1 , wherein the at least one further quantum well layer has a thickness less than the quantum well layers of the multiple quantum well structure. 9. The optoelectronic semiconductor chip according to claim 1 , wherein the at least one further quantum well layer is arranged on a side of the multiple quantum well structure facing the n-type semiconductor region. 10. The optoelectronic semiconductor chip according to claim 1 , wherein the at least one further quantum well layer is disposed on a side of the multiple quantum well structure facing the p-type semiconductor region. 11. The optoelectronic semiconductor chip according to claim 10 , wherein the multiple quantum well structure is disposed between a p-side confinement layer and an n-side confinement layer, and the p-side confinement layer is disposed between the multiple quantum well structure and the at least one further quantum well layer. 12. The optoelectronic semiconductor chip according to claim 1 , wherein a number of the further quantum well layer(s) provided for emission of the second radiation is 1 to 3. 13. The optoelectronic semiconductor chip according to claim 1 , wherein a number of quantum well layers provided for emission of the first radiation is 3 to 30. 14. The optoelectronic semiconductor chip according to claim 1 , wherein a number of the quantum well layers provided for emission of the first radiation is at least five times greater than a number of further quantum well layer(s) provided for emission of the second radiation. 15. The optoelectronic semiconductor chip according to claim 1 , wherein the first radiation has a power of at least 4.5 W. 16. An optoelectronic semiconductor chip comprising: a p-type semiconductor region, an n-type semiconductor region, an active layer disposed between the p-type semiconductor region and the n-type semiconductor region and formed as a multiple quantum well structure and having alternating quantum well layers and barrier layers, the quantum well layers emitting a first radiation in a first wavelength range, and at least one further quantum well layer disposed outside of and directly adjoining the multiple quantum well structure that emits a second radiation in a second wavelength range, wherein the first wavelength range is in an infrared spectral range invisible to a human eye, the second wavelength range comprises wavelengths at least partially visible to the human eye, the second radiation has an intensity maximum at a wavelength of 750 nm to 850 nm, the first radiation has an intensity maximum at a wavelength of 850 nm to 1000 nm, a number of the further quantum well layer(s) provided for emission of the second radiation is 1 to 3, and a number of quantum well layers provided for emission of the first radiation is 3 to 30.
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