Methods for using remote plasma chemical vapor deposition (RP-CVD) and sputtering deposition to grow layers in light emitting devices

US11069525B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11069525-B2
Application numberUS-202016847999-A
CountryUS
Kind codeB2
Filing dateApr 14, 2020
Priority dateMay 20, 2016
Publication dateJul 20, 2021
Grant dateJul 20, 2021

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Abstract

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Described herein are methods for using remote plasma chemical vapor deposition (RP-CVD) and sputtering deposition to grow layers for light emitting devices. A method includes growing a light emitting device structure on a growth substrate, and growing a tunnel junction on the light emitting device structure using at least one of RP-CVD and sputtering deposition. The tunnel junction includes a p++ layer in direct contact with a p-type region, where the p++ layer is grown by using at least one of RP-CVD and sputtering deposition. Another method for growing a device includes growing a p-type region over a growth substrate using at least one of RP-CVD and sputtering deposition, and growing further layers over the p-type region. Another method for growing a device includes growing a light emitting region and an n-type region using at least one of RP-CVD and sputtering deposition over a p-type region.

First claim

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What is claimed is: 1. A method for growing a light emitting device, the method comprising: growing a p-type region over a growth substrate by at least one of RP-CVD and sputtering deposition in at least a reduced hydrogen environment that does not cause inoperability of at least the p-type region; and growing an n-type region over the p-type region using a non-RP-CVD and non-sputtering deposition process, the p-type region and the n-type region comprising III-nitride materials. 2. The method of claim 1 , wherein the growth substrate comprises a non-III nitride material and a GaN film disposed on a non-III nitride material, and the method further comprises growing the GaN film by metal organic chemical vapor deposition (MOCVD). 3. The method of claim 1 , wherein the growth substrate comprises a non-III-nitride material, and the method further comprises: growing the GaN film by at least one of RP-CVD and sputtering deposition. 4. The method of claim 1 , wherein growing the n-type region over the p-type region comprises growing a portion of the n-type region be at least one of RP-CVD and sputtering deposition. 5. The method of claim 1 , wherein growing the n-type region over the p-type region comprises growing the n-type region by MOCVD. 6. A method for growing a light emitting device, the method comprising: growing a hydrogen-free p-type region over a growth substrate by at least one of RP-CVD and sputtering deposition; growing an n-type region over the p-type region, using a non-RP-CVD and non-sputtering deposition process, the p-type region and the n-type region comprising III-nitride materials. 7. The method of claim 6 , wherein the growth substrate comprises a non-III nitride material and a GaN film disposed on a non-III nitride material, and the method further comprises growing the GaN film by metal organic chemical vapor deposition (MOCVD). 8. The method of claim 6 , wherein the growth substrate comprises a non-III-nitride material, and the method further comprises: growing the GaN film by at least one of RP-CVD and sputtering deposition. 9. The method of claim 6 , wherein growing the n-type region over the p-type region comprises growing a portion of the n-type region be at least one of RP-CVD and sputtering deposition. 10. The method of claim 6 , wherein growing the n-type region over the p-type region comprises growing the n-type region by MOCVD. 11. A method for growing a light emitting device, the method comprising: growing a p-type region over a growth substrate by at least one of RP-CVD and sputtering deposition in a gaseous environment comprising one or more of a nitrogen-containing gas and a hydrogen-containing gas that does not cause inoperability of at least the p-type region; and growing an n-type region over the p-type region using a non-RP-CVD and non-sputtering deposition process, the p-type region and the n-type region comprising III-nitride materials. 12. The method of claim 11 , wherein the growth substrate comprises a non-III nitride material and a GaN film disposed on a non-III nitride material, and the method further comprises growing the GaN film by metal organic chemical vapor deposition (MOCVD). 13. The method of claim 11 , wherein the growth substrate comprises a non-III-nitride material, and the method further comprises: growing the GaN film by at least one of RP-CVD and sputtering deposition. 14. The method of claim 11 , wherein growing the n-type region over the p-type region comprises growing a portion of the n-type region be at least one of RP-CVD and sputtering deposition. 15. The method of claim 11 , wherein growing the n-type region over the p-type region comprises growing the n-type region by MOCVD.

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What does patent US11069525B2 cover?
Described herein are methods for using remote plasma chemical vapor deposition (RP-CVD) and sputtering deposition to grow layers for light emitting devices. A method includes growing a light emitting device structure on a growth substrate, and growing a tunnel junction on the light emitting device structure using at least one of RP-CVD and sputtering deposition. The tunnel junction includes a p…
Who is the assignee on this patent?
Lumileds Llc
What technology area does this patent fall under?
Primary CPC classification H10P14/6329. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jul 20 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).