Apparatus and system configured to correct a cathode current and a voltage between a cathode and an anode for generating X-rays

Patent metadata

Field	Value
Publication number	US-11064600-B2
Application number	US-201816612783-A
Country	US
Kind code	B2
Filing date	May 30, 2018
Priority date	Jun 8, 2017
Publication date	Jul 13, 2021
Grant date	Jul 13, 2021

Abstract

At least one power supply produces a voltage between a cathode and an anode. The cathode and anode are operable such that electrons emitted from the cathode interact with the anode with energies corresponding to the voltage. The electrons interact with the anode at a focal spot to generate X-rays. The power supply provides the cathode with a cathode current. An electron detector is positioned relative to the anode, and a backscatter electron signal is measured from the anode. The measured backscatter electron signal is provided to a processing unit, which determines a cathode current correction and/or a correction to the voltage between the cathode and the anode using the measured backscatter electron signal and a correlation between anode surface roughness and backscatter electron emission.

First claim

The invention claimed is:

1. An apparatus for generating X-rays, comprising:
a cathode;
an anode;
at least one power supply;
an electron detector; and
a processor;
wherein the at least one power supply is configured to produce a voltage between the cathode and the anode;
wherein the at least one power supply is configured to provide the cathode with a cathode current;
wherein the cathode is positioned relative to the anode, and the cathode and the anode are operable such that electrons emitted from the cathode interact with the anode with energies corresponding to the voltage, and wherein the electrons interact with the anode at a focal spot to generate X-rays;
wherein the electron detector is positioned relative to the anode, and is configured to measure a backscatter electron signal from the anode;
wherein the electron detector is configured to provide the measured backscatter electron signal to the processor;
wherein the processor is configured to determine a correction to the cathode current and/or a correction to the voltage between the cathode and the anode by utilizing the measured backscatter electron signal and a correlation between an anode surface roughness and a backscatter electron emission; and
wherein the processor is configured to provide the correction to the cathode current and/or the correction to the voltage between the cathode and the anode to the at least one power supply.

2. The apparatus according to claim 1 , wherein the processor is configured to utilize a correlation between the anode surface roughness and an X-ray emission.

3. The apparatus according to claim 1 , wherein the measured backscatter electron signal comprises a backscatter electron current.

4. The apparatus according to claim 1 , wherein the electron detector comprises a plurality of electron detecting elements and an aperture, and wherein the aperture is positioned between the anode and the plurality of electron detecting elements.

5. The apparatus according to claim 4 , wherein the processor is configured to determine a size of the focal spot by utilizing the measured backscatter electron signal.

6. The apparatus according to claim 5 , wherein the at least one power supply is configured to provide at least one voltage to focus the electrons at the focal spot; and
wherein the processor is configured to determine a correction to the at least one voltage to focus the electrons at the focal spot; and wherein the processor is configured to provide the correction to the at least one power supply.

7. The apparatus according to claim 4 , wherein the processor is configured to determine a location of the focal spot by utilizing the measured backscatter electron signal.

8. The apparatus according to claim 1 , wherein the measured backscatter electron signal comprises a backscatter electron flux.

9. The apparatus according to claim 1 , wherein the electron detector is configured to measure an X-ray flux from the anode.

10. The apparatus according to claim 9 , wherein the electron detector comprises a scintillator.

11. A system for imaging an object, comprising:
an apparatus for generating X-rays according to claim 1 ; and
an X-ray detector configured to acquire image data of an object.

12. A method for generating X-rays, comprising:
producing with at least one power supply a voltage between a cathode and an anode, wherein the cathode is positioned relative to the anode, and the cathode and the anode are operable such that electrons emitted from the cathode interact with the anode with energies corresponding to the voltage, and wherein the electrons interact with the anode at a focal spot to generate X-rays;
providing with the at least one power supply the cathode with a cathode current;
positioning an electron detector relative to the anode, and measuring a backscatter electron signal from the anode;
providing the measured backscatter electron signal to a processor;
determining with the processor a correction to the cathode current and/or a correction to the voltage between the cathode and the anode, wherein the determining comprises a utilization of the measured backscatter electron signal and a correlation between an anode surface roughness and a backscatter electron emission; and
providing the correction to the cathode current and/or the correction to the voltage between the cathode and the anode to the at least one power supply.

Assignees

• Koninklijke Philips Nv

Inventors

• Dokania Anand Kumar
• Behling Rolf Karl Otto

Classifications

• A61B6/4208

  characterised by using a particular type of detector · CPC title

• A61B6/58

  Testing, adjusting or calibrating thereof · CPC title

• A61B6/4021

  involving movement of the focal spot · CPC title

• A61B6/582

  Calibration · CPC title

• H05G1/26

  Measuring, controlling or protecting (measuring X-ray radiation G01T) · CPC title