Roundness measuring device

US11041707B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11041707-B2
Application numberUS-201816179227-A
CountryUS
Kind codeB2
Filing dateNov 2, 2018
Priority dateNov 13, 2017
Publication dateJun 22, 2021
Grant dateJun 22, 2021

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  1. Title

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Abstract

Official abstract text for this publication.

A roundness measuring device includes an annular ring, and a plurality of displacement sensors (comparative length measuring devices) provided on the ring at predetermined intervals. The displacement sensors are arranged such that lines along which measurement axes of the displacement sensors extend intersect at a single point.

First claim

Opening claim text (preview).

What is claimed is: 1. A roundness measuring device comprising: a circular band; and a plurality of displacement sensors provided on the band at predetermined intervals, wherein the plurality of displacement sensors is arranged such that a respective line along which a measurement axis of each displacement sensor of the plurality of displacement sensors extends, intersects at a single point. 2. The roundness measuring device according to claim 1 , wherein the plurality of displacement sensors comprise at least eight displacement sensors. 3. The roundness measuring device according to claim 2 , wherein: each displacement sensor of the plurality of displacement sensors includes a spindle having a stylus head at a distal end thereof, the spindle being capable of advancing and retreating in an axis direction, each displacement sensor of the plurality of displacement sensors is configured so as to detect displacement of the spindle and output the displacement as measurement data, and each displacement sensor of the plurality of displacement sensors is arranged such that a projection direction of each said respective spindle is oriented toward an interior of the band. 4. The roundness measuring device according to claim 1 , wherein: each displacement sensor of the plurality of displacement sensors includes a spindle having a stylus head at a distal end thereof, the spindle being capable of advancing and retreating in an axis direction, each displacement sensor of the plurality of displacement sensors is configured so as to detect displacement of the spindle and output the displacement as measurement data, and each displacement sensor of the plurality of displacement sensors is arranged such that a projection direction of each said respective spindle is oriented toward an interior of the band. 5. A cylindricity measuring device comprising: a plurality of the roundness measuring sensors stacked on top of each other in a vertical direction, each roundness measuring sensor of the plurality of the roundness measuring sensors comprising: a circular band; and a plurality of displacement sensors provided on the band at predetermined intervals, wherein the plurality of displacement sensors is arranged such that a respective line along which a measurement axis of each displacement sensor of the plurality of displacement sensors extends, intersects at a single point. 6. The cylindricity measuring device according to claim 5 , wherein the plurality of displacement sensors comprise at least eight displacement sensors. 7. The cylindricity measuring device according to claim 6 , wherein: each displacement sensor of the plurality of displacement sensors includes a spindle having a stylus head at a distal end thereof, the spindle being capable of advancing and retreating in an axis direction, each displacement sensor of the plurality of displacement sensors is configured so as to detect displacement of the spindle and output the displacement as measurement data, and each displacement sensor of the plurality of displacement sensors is arranged such that a projection direction of each said respective spindle is oriented toward an interior of the band. 8. The cylindricity measuring device according to claim 5 , wherein: each displacement sensor of the plurality of displacement sensors includes a spindle having a stylus head at a distal end thereof, the spindle being capable of advancing and retreating in an axis direction, each displacement sensor of the plurality of displacement sensors is configured so as to detect displacement of the spindle and output the displacement as measurement data, and each displacement sensor of the plurality of displacement sensors is arranged such that a projection direction of each said respective spindle is oriented toward an interior of the band. 9. The cylindricity measuring device according to claim 5 , wherein the plurality of displacement sensors stacked on top of each other in a vertical direction are configured to measure a cylindricity of a work piece. 10. A roundness measuring method using a roundness measuring device having an annular ring, and a plurality of displacement sensors provided on the ring at predetermined intervals, wherein the plurality of displacement sensors is arranged such that a respective line along which a measurement axis of each displacement sensor of the plurality of displacement sensors extends, intersects at a single point, the method comprising: setting the displacement sensors to zero with a master that is a perfect circle and serves as a reference; measuring, by the displacement sensors, a measurable object; calculating, as eccentricity, offset between a position of the master during calibration and a position of the measured object during the measurement; and subtracting the eccentricity obtained in the eccentricity calculating from measured values of the displacement sensors obtained in the measuring, and calculating offset of the measured object from a perfect circle. 11. The roundness measuring method according to claim 10 , wherein the plurality of displacement sensors comprise at least eight displacement sensors. 12. The roundness measuring method according to claim 11 , wherein: each displacement sensor of the plurality of displacement sensors includes a spindle having a stylus head at a distal end thereof, the spindle being capable of advancing and retreating in an axis direction, each displacement sensor of the plurality of displacement sensors is configured so as to detect displacement of the spindle and output the displacement as measurement data, and each displacement sensor of the plurality of displacement sensors is arranged such that a projection direction of each said respective spindle is oriented toward an interior of the ring. 13. The roundness measuring method according to claim 10 , wherein: each displacement sensor of the plurality of displacement sensors includes a spindle having a stylus head at a distal end thereof, the spindle being capable of advancing and retreating in an axis direction, each displacement sensor of the plurality of displacement sensors is configured so as to detect displacement of the spindle and output the displacement as measurement data, and each displacement sensor of the plurality of displacement sensors is arranged such that a projection direction of each said respective spindle is oriented toward an interior of the ring. 14. The roundness measuring method according to claim 10 , wherein in the eccentricity calculation, when the eccentricity is split into an X axis component and a Y axis component and expressed by (ΔCx, ΔCy), the eccentricity (ΔCx, ΔCy) is found by Δ Cx= 2×(Σ i=1 i=n {di ·cos θ i })/ n Δ Cy= 2×(Σ i=1 i=n {di ·sin θ i })/ n wherein: di is a measured value for each displacement sensor of the plurality of displacement sensors; the X axis is a reference line; and an angle formed by the X axis and the measurement axis of each displacement sensor of the plurality of displacement sensors is represented by θi.

Assignees

Inventors

Classifications

  • Ring or other apertured gauges, e.g. "go/no-go" gauge · CPC title

  • Micrometers · CPC title

  • G01B7/282Primary

    for measuring roundness · CPC title

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Frequently asked questions

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What does patent US11041707B2 cover?
A roundness measuring device includes an annular ring, and a plurality of displacement sensors (comparative length measuring devices) provided on the ring at predetermined intervals. The displacement sensors are arranged such that lines along which measurement axes of the displacement sensors extend intersect at a single point.
Who is the assignee on this patent?
Mitutoyo Corp
What technology area does this patent fall under?
Primary CPC classification G01B7/282. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 22 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).