Side mounted interconnect bridges
US-2019341349-A1 · Nov 7, 2019 · US
US11031341B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11031341-B2 |
| Application number | US-201716474005-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 29, 2017 |
| Priority date | Mar 29, 2017 |
| Publication date | Jun 8, 2021 |
| Grant date | Jun 8, 2021 |
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A device and method of utilizing an interconnect bridge to electrically couple two semiconductor dies located on different surfaces. Integrated circuit packages using an interconnect bridge to electrically couple a semiconductor die on a substrate to a semiconductor die on a motherboard are shown. Integrated circuit packages using an interconnect bridge to electrically couple a semiconductor die on a top surface of a substrate to a semiconductor die on a bottom surface of a substrate are shown. Methods of electrically coupling semiconductor dies on different surfaces using interconnect bridges are shown.
Opening claim text (preview).
The invention claimed is: 1. A semiconductor device, comprising: a substrate; a motherboard attached to the substrate; a first semiconductor die attached to the substrate, wherein the substrate includes multi-layer break out pads; a silicon interconnect bridge attached to a side surface of the substrate and wherein the silicon interconnect bridge is electrically coupled to the first semiconductor die via the multi-layer break out pads; a second semiconductor die electrically coupled to a second end of the silicon interconnect bridge, wherein the second semiconductor die is attached to the motherboard and wherein the motherboard includes a cavity; wherein the second end of the interconnect bridge extends into the cavity of the motherboard; wherein the silicon interconnect bridge is attached to the motherboard within the cavity of the motherboard; and wherein the silicon interconnect bridge is electrically coupled to the second semiconductor die via the motherboard. 2. The semiconductor device of claim 1 , wherein the second semiconductor die is a memory die. 3. The semiconductor device of claim 1 , wherein the first semiconductor die is a central processing unit. 4. The semiconductor device of claim 1 , wherein the interconnect bridge is attached to the substrate orthogonal to the first semiconductor die. 5. A computing device, comprising: a mass storage device; a substrate; a motherboard attached to the substrate; a first semiconductor die attached to a top surface of the substrate, wherein the substrate includes multi-layer break out pads; a silicon interconnect bridge attached to a side surface of the substrate, the side surface orthogonal to the top surface, and wherein a first end of the silicon interconnect bridge is electrically coupled to the first semiconductor die via the multi-layer break out pads; and a second semiconductor die electrically coupled to a second end of the silicon interconnect bridge, wherein the second semiconductor die is attached to the motherboard and wherein the motherboard includes a cavity; wherein the second end of the interconnect bridge extends into the cavity of the motherboard; wherein the silicon interconnect bridge is attached to the motherboard within the cavity of the motherboard; and wherein the silicon interconnect bridge is electrically coupled to the second semiconductor die via the motherboard. 6. The semiconductor device of claim 5 , wherein the computing device is a cellular telephone. 7. A method comprising: attaching a first semiconductor die to a top surface of a substrate; attaching a first end of a silicon interconnect, bridge to a side surface of the substrate using a set of multi-layer break out pads of the substrate, wherein the first end of the silicon interconnect bridge is electrically coupled to the first semiconductor die; and coupling, electrically, a second semiconductor die to a second end of the interconnect bridge; attaching a bottom surface of the substrate to a motherboard, wherein the motherboard includes a cavity; wherein the second end of the interconnect bridge extends into the cavity; and wherein coupling the second semiconductor die to the second end of the interconnect bridge includes attaching the second end of the interconnect bridge to the motherboard with the cavity.
between a chip and a stacked insulating package substrate, interposer or RDL · CPC title
the stacked chips being on both top and bottom sides of a package substrate, interposer or RDL · CPC title
Package configurations · CPC title
comprising multiple insulating layers · CPC title
on sidewalls or bottom surfaces of the package substrates, interposers or redistribution layers · CPC title
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