Apparatus and methods for testing devices

Patent metadata

Field	Value
Publication number	US-10989748-B2
Application number	US-202016931912-A
Country	US
Kind code	B2
Filing date	Jul 17, 2020
Priority date	Jun 14, 2016
Publication date	Apr 27, 2021
Grant date	Apr 27, 2021

Abstract

The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.

First claim

What is claimed is:

1. An apparatus, comprising:
a first portion including a number of sidewalls positioned to at least partially surround a device under test; and
a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction, wherein second portion is comprised of an electrically conductive fabric; and
a connector coupled to an antenna, wherein the connector is coupled to the second portion and wherein the connector and antenna are configured to move in the x-direction, y-direction, and z-direction within the apparatus.

2. The apparatus of claim 1 , wherein conductive tape electrically couples the first portion to the second portion.

3. The apparatus of claim 1 , wherein the upper surface of the first portion is electrically coupled to the second portion via a metallic gasket.

4. The apparatus of claim 1 , wherein the first portion is soldered to the second portion to electrically couple the first portion to the second portion.

5. The apparatus of claim 1 , wherein an antenna is coupled to the second portion to measure electromagnetic interference (EMI) and/or radio frequency (RF) noise from the device under test within the apparatus.

6. An apparatus, comprising:
a first portion including a number of sidewalls positioned to at least partially surround a device under test;
a second portion having a number of sidewalls positioned to at least partially surround the first portion and the device under test, wherein the number of sidewalls of the second portion are electrically coupled to the first portion and configured to move in the z-direction with respect to the number of sidewalls of the first portion;
a third portion positioned on an upper surface of the second portion, wherein the third portion is electrically coupled to second portion and the third portion includes an opening;
a fourth portion position on an upper surface of the third portion, wherein the fourth portion is electrically coupled to the third portion and the fourth portion is configured to move in the x-direction and the y-direction with respect to the upper surface of the third portion; and
an antenna coupled to the fourth portion.

7. The apparatus of claim 6 , wherein the first portion, the second portion, the third portion, and the fourth portion surround the device under test and block electromagnetic signals and radio frequency signals that are outside of the first portion, the second portion, the third portion, and fourth portion.

8. The apparatus of claim 6 , wherein the upper surface of the second portion is electrically coupled to the third portion via a metallic gasket.

9. The apparatus of claim 6 , wherein the antenna is configured to move in the x and y direction within the opening.

10. The apparatus of claim 6 , wherein an antenna is coupled to the fourth portion via a connector and is configured to measure electromagnetic signals and radio frequency signals emitted by the device under test.

11. The apparatus of claim 6 , wherein the first portion is electrically coupled to a test board and the device under test is coupled to the test board.

12. The apparatus of claim 6 , wherein the device under test is configured to receive signals from an automatic test equipment a via a test board.

13. An apparatus, comprising:
a first portion coupled to a second portion, wherein the first portion is configured to move in the z-direction with respect to the second portion, wherein the first portion includes a number of sidewalls positioned to surround the second portion and a device under test and wherein the second portion includes a number of sidewalls position to surround the device under test;
a third portion electrically coupled to the first portion; and
an antenna coupled to the third portion, wherein the third portion and antenna are configured to move in the x-direction and the y-direction with respect to the first portion, wherein the third portion is positioned on the upper surface of the fourth portion.

14. The apparatus of claim 13 , wherein the third portion is electrically coupled to a fourth portion comprising an opening and wherein the third portion and the antenna are configured to move within the opening of the fourth portion.

15. The apparatus of claim 13 , wherein the third portion is configured to move in the x-direction via a first motor and wherein moving the third portion is configured to move in the y direction via a second motor.

16. The appartus of claim 15 , wherein the first portion is configured to move in the z direction via a third motor.

17. The apparatus of claim 13 , wherein the antenna is configured to sense signals emitted by the device under test.

18. The apparatus of claim 17 , wherein the antenna is configured to send the signals emitted by the device under test to automatic test equipment.

Assignees

• Micron Technology Inc

Inventors

• Gregory Paul E
• Richards Randon K

Classifications

• G01R31/002 Primary

  where the device under test is an electronic circuit · CPC title

• G01R31/001 Primary

  Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing (measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14) · CPC title

• G01R1/04

  Housings; Supporting members; Arrangements of terminals · CPC title

• G01R31/44

  Testing lamps · CPC title

• G01R1/06705

  Apparatus for holding or moving single probes (for moving multiple probe heads or ICs under test G01R31/2886) · CPC title