Mass analyser having extended flight path

Patent metadata

Field	Value
Publication number	US-10950425-B2
Application number	US-201716325965-A
Country	US
Kind code	B2
Filing date	Aug 11, 2017
Priority date	Aug 16, 2016
Publication date	Mar 16, 2021
Grant date	Mar 16, 2021

Abstract

A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (30-35) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane. The ion-optical elements in each cell are configured to generate electric fields that either (i) have mirror symmetry in the deflection plane about a line in the deflection plane that is perpendicular to a mean ion path through the cell at a point half way along the mean ion path through the cell, or (ii) have point symmetry in the deflection plane about a point in the deflection plane that is half way along the mean ion path through the cell. The ion-optical elements are arranged and configured such that, in the frame of reference of the ions, the ions are guided through the deflection plane in the ion-optical cells along mean flight paths that are of the same shape and length in each ion-optical cell.

First claim

The invention claimed is:

1. A time-of-flight or electrostatic trap mass analyzer comprising:
an ion flight region comprising a plurality of ion-optical elements for guiding ions through the flight region in a deflection (x-y) plane;
wherein said ion-optical elements are arranged so as to define a plurality of identical ion-optical cells;
wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location;
wherein each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane;
wherein the ion-optical elements in each cell are configured to generate electric fields that either (i) have mirror symmetry in the deflection plane about a line in the deflection plane that is perpendicular to a mean ion path through the cell at a point half way along the mean ion path through the cell, or (ii) have point symmetry in the deflection plane about a point in the deflection plane that is half way along the mean ion path through the cell; and
wherein the ion-optical elements are arranged and configured such that, in the frame of reference of the ions, the ions are guided through the deflection plane in the ion-optical cells along mean flight paths that are of the same shape and length in each ion-optical cell.

2. The analyser of claim 1 , wherein the parallel-to-point focusing, or point-to-parallel focusing, is focusing to the first order approximation.

3. The analyser of claim 1 , wherein said ion-optical elements are arranged and configured such that said ions travel through said ion-optical cells such that they are subjected to one or more cycle, wherein each cycle comprises either: (i) said parallel-to-point focusing by one of said cells and then said point-to-parallel focusing by another successive one of said cells; or (ii) said point-to-parallel focusing by one of said cells and then said parallel-to-point focusing by another successive one of said cells.

4. The analyzer of claim 3 , wherein said ion-optical elements are arranged and configured such that said ions are subjected to an even, integer number of said cycles.

5. The analyzer of claim 1 , wherein said ion-optical elements are arranged and configured such that, in use, said ions pass through each of said ion-optical cells in a spatially achromatic and/or energy isochronous mode to a first order approximation.

6. The analyzer of claim 1 , wherein each of said ion-optical cells comprises at least three electrostatic sectors having at least two different deflection radii.

7. The analyzer of claim 1 , wherein the ion-optical elements are arranged and configured in any given ion-optical cell such that for ions entering the cell as a parallel beam, the flight time of these ions through the cell is independent, to the second order approximation, of the distance of the ions from a beam ion-optic axis on entering the cell, at least in the deflection (x-y) plane.

8. The analyzer of claim 1 , wherein the ion-optical elements are arranged and configured in any given ion-optical cell so as to provide second order focusing of ion flight time with respect to energy spread in ion bunches passing through the cell.

9. The analyzer of claim 1 , comprising an ion accelerator for accelerating ions into the flight region and/or an ion detector for detecting ions exiting the flight region.

10. The analyzer of claim 1 , comprising a drift electrode arranged and configured to cause ions to drift through the analyzer in a drift (z−) dimension perpendicular to the deflection (x-y) plane as the ions travel through the ion-optical elements.

11. The analyzer of claim 10 , wherein the ion-optical elements are arranged and configured to cause the ions to have a looped flight path in the deflection plane and to perform a plurality of loops in the deflection plane; and wherein the analyzer comprises one or more drift lens arranged in the flight region so that the ions pass through the one or more drift lens as the ions loop around the deflection plane, and wherein the one or more drift lens is configured to focus the ions in the drift (z−) dimension so as to limit the divergence of the ions in said drift dimension as they drift along the drift dimension.

12. The analyzer of claim 11 , wherein the analyzer comprises a plurality of said drift lenses spaced along said drift dimension.

13. The analyzer of claim 10 , wherein said drift electrode is arranged on a first side, in the drift (z−) dimension, of the ion-optical elements and the ion detector is arranged on a second opposite side, in said drift dimension, of the ion-optical elements.

14. The analyzer of claim 10 , wherein said drift electrode and ion detector are arranged on a first side, in the drift dimension, of the ion-optical elements and one or more reflector electrode is arranged on a second opposite side, in said drift dimension, of the ion-optical elements; wherein said reflector electrode is configured to reflect ions back in the drift dimension towards the detector.

15. The analyzer of claim 13 , wherein one or more reflector electrode is arranged on each side, in the drift dimension, of the ion-optical elements and are configured to reflect the ions along the drift dimension as the ions pass through the ion-optical elements.

16. The analyzer of claim 1 , wherein each of the electrostatic sectors is a cylindrical sector having its axis of cylindrical rotation aligned in the dimension orthogonal to the deflection (x-y) plane.

17. The analyzer of claim 1 , wherein said analyzer is one of:
(i) a time-of-flight mass analyzer comprising an ion accelerator for pulsing ions into said flight region and an ion detector, wherein said flight region is arranged between said ion accelerator and detector such that ions separate according to mass to charge ratio in the flight region;
(ii) an open trap mass analyzer configured such that ions enter a first end of the flight region and exit the flight region at a second, opposite end;
(iii) an electrostatic trap mass analyzer having an image current detector for detecting ions; or
(iv) an electrostatic trap mass analyzer having an ion detector arranged for detecting only a portion of the ions passing the detector.

18. A mass spectrometer comprising an analyzer as claimed in claim 1 .

19. A method of time of flight or electrostatic trap mass analysis comprising:
transmitting ions through a flight region comprising a plurality of ion-optical elements that guide the ions in a deflection (x-y) plane;
wherein said ion-optical elements are arranged so as to define a plurality of identical ion-optical cells;
wherein the ion-optical elements in each ion-optical cell generate electric fields that either focus ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or focus ions diverging from a point at the ion entrance location to travel parallel at the ion exit location;
wherein each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii that bend the flight path of the ions in the deflection (x-y) plane;
wherein the ion-optical elements in each cell generate electric fields that either (i) have mirror symmetry in the d

Assignees

• Micromass Ltd
• Leco Corp

Inventors

• Verenchikov Anatoly
• Yavor Mikhail

Classifications

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/408 Primary

  with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight · CPC title

• H01J49/4245

  Electrostatic ion traps (H01J49/422 takes precedence) · CPC title

• H01J49/061

  Ion deflecting means, e.g. ion gates · CPC title