Wafer producing apparatus and carrying tray

US10910241B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10910241-B2
Application numberUS-201816209285-A
CountryUS
Kind codeB2
Filing dateDec 4, 2018
Priority dateDec 12, 2017
Publication dateFeb 2, 2021
Grant dateFeb 2, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A wafer producing apparatus includes: an ingot grinding unit configured to grind and planarize an upper surface of an ingot held by a first holding table; a laser applying unit configured to apply a laser beam of such a wavelength as to be transmitted through the ingot to the ingot, with a focal point of the laser beam positioned at a depth corresponding to the thickness of a wafer to be produced from an upper surface of the ingot held by a second holding table, to form a peel-off layer; a wafer peeling unit configured to hold the upper surface of the ingot held by a third holding table and peel off the wafer from the peel-off layer; and a carrying tray having an ingot support section configured to support the ingot and a wafer support section configured to support the wafer.

First claim

Opening claim text (preview).

What is claimed is: 1. A wafer producing apparatus for producing a wafer from a hexagonal single crystal ingot, the wafer producing apparatus comprising: an ingot grinding unit configured to include (i) a first holding table adapted to hold the hexagonal single crystal ingot, and (ii) grinding means grinding and planarizing an upper surface of the ingot held by the first holding table; a laser applying unit configured to include (i) a second holding table adapted to hold the hexagonal single crystal ingot, and (ii) laser applying means applying a laser beam of such a wavelength as to be transmitted into the hexagonal single crystal ingot held by the second holding table with a focal point of the laser beam positioned at a depth from the upper surface of the hexagonal single crystal ingot corresponding to a thickness of the wafer to be produced to form a peel-off layer; a wafer peeling unit configured to include (i) a third holding table adapted to hold the hexagonal single crystal ingot, and (ii) wafer peeling means holding the upper surface of the hexagonal single crystal ingot held by the third holding table and peeling off the wafer from the peel-off layer; a carrying tray including (i) an ingot support section configured to support the hexagonal single crystal ingot, and (ii) a wafer support section adapted to support the peeled wafer; a belt conveyor unit configured to carry the hexagonal single crystal ingot supported by the carrying tray between the ingot grinding unit and the laser applying unit and the wafer peeling unit; a cassette stocker in which a cassette adapted to accommodate the peeled wafer is accommodated; and accommodating means transferring the wafer supported by the wafer support section of the carrying tray into the cassette accommodated in the cassette stocker. 2. The wafer producing apparatus according to claim 1 , further comprising an ingot stocker adapted to accommodate the hexagonal single crystal ingot. 3. The wafer producing apparatus according to claim 2 , wherein the accommodating means carries the hexagonal single crystal ingot accommodated in the ingot stocker to the belt conveyor unit. 4. The wafer producing apparatus according to claim 2 , wherein the hexagonal single crystal ingot is accommodated in the ingot stocker in a state of being supported by the carrying tray. 5. The wafer producing apparatus of claim 1 , wherein the carrying tray includes a casing having an upper wall, a lower wall, a pair of side walls connecting the upper wall and the lower wall, and a cavity penetrating between the pair of side walls, and one of the upper wall and the lower wall of the casing is provided with the ingot support section, and other of the lower wall or the upper wall is provided with the wafer support section. 6. The wafer producing apparatus of claim 1 , wherein the ingot support section has concentric recesses corresponding to ingots of two or more sizes, and the wafer support section has concentric recesses corresponding to wafers of two or more sizes. 7. A wafer producing apparatus for producing a wafer from a hexagonal single crystal ingot, the wafer producing apparatus comprising: an ingot grinding unit comprising (i) a first holding table adapted to hold the hexagonal single crystal ingot, and (ii) grinding means for grinding and planarizing an upper surface of the ingot held by the first holding table; a laser applying unit configured to include (i) a second holding table adapted to hold the ingot, and (ii) a laser applying a laser beam of such a wavelength as to be transmitted into the ingot held by the second holding table with a focal point of the laser beam positioned at a depth from the upper surface of the ingot corresponding to a thickness of the wafer to be produced to form a peel-off layer; a wafer peeling unit configured to include (i) a third holding table adapted to hold the ingot, and (ii) wafer peeling means holding the upper surface of the ingot held by the third holding table and peeling off the wafer from the peel-off layer; a carrying tray including (i) an ingot support section configured to support the ingot, and (ii) a wafer support section adapted to support the peeled wafer; a belt conveyor unit configured to carry the ingot supported by the carrying tray between the ingot grinding unit and the laser applying unit and the wafer peeling unit; a cassette stocker in which a cassette adapted to accommodate the peeled wafer is accommodated; and accommodating means transferring the wafer supported by the wafer support section of the carrying tray into the cassette accommodated in the cassette stocker.

Assignees

Inventors

Classifications

  • Storage means · CPC title

  • Mechanical parts of transfer devices · CPC title

  • Conveying cassettes, containers or carriers · CPC title

  • Mechanical details, e.g. rollers or belts · CPC title

  • comprising at least one polishing chamber · CPC title

Patent family

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Frequently asked questions

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What does patent US10910241B2 cover?
A wafer producing apparatus includes: an ingot grinding unit configured to grind and planarize an upper surface of an ingot held by a first holding table; a laser applying unit configured to apply a laser beam of such a wavelength as to be transmitted through the ingot to the ingot, with a focal point of the laser beam positioned at a depth corresponding to the thickness of a wafer to be produc…
Who is the assignee on this patent?
Disco Corp
What technology area does this patent fall under?
Primary CPC classification H10P72/0428. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 02 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 10 related publications on this page (citations in our corpus or others sharing the same primary CPC).