Optical inspection apparatus

US10901134B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10901134-B2
Application numberUS-201916288301-A
CountryUS
Kind codeB2
Filing dateFeb 28, 2019
Priority dateSep 14, 2018
Publication dateJan 26, 2021
Grant dateJan 26, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.

First claim

Opening claim text (preview).

The invention claimed is: 1. An optical inspection apparatus comprising: an imaging optical system opposed to an inspection target; one or more light sources provided around the imaging optical system and spaced away from one another; a light guide extending cylindrically along an optical axis of the imaging optical system, and an end face of the light guide opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target, wherein the total reflecting surface and the transmission surface are on a medium forming the inner surface of the light guide. 2. The optical inspection apparatus of claim 1 , wherein the total reflecting surface includes an area that is closer to the one or more light sources than the transmission surface. 3. The optical inspection apparatus of claim 1 , wherein the inner surface of the light guide is located outside a view range of the imaging optical system. 4. The optical inspection apparatus of claim 1 , wherein a thickness between the inner surface and the outer surface of the light guide decreases as the light guide moves away from the imaging optical system. 5. The optical inspection apparatus of claim 1 , wherein the one or more light sources are arranged on a circumference of one circle with the optical axis centered. 6. The optical inspection apparatus of claim 1 , wherein the light guide is cylindrical. 7. The optical inspection apparatus of claim 1 , wherein a diameter of the inner surface of the light guide increases as the light guide moves away from the one or more light sources. 8. The optical inspection apparatus of claim 1 , wherein the mirror surface of the light guide is an arc surface projected in a direction away from the optical axis. 9. The optical inspection apparatus of claim 1 , wherein the inner surface of the light guide is an arc surface projected in a direction close to the optical axis. 10. The optical inspection apparatus of claim 1 , wherein the light guide is shaped like a square tube. 11. The optical inspection apparatus of claim 10 , wherein the one or more light sources are provided at corners of the light guide shaped like a square tube. 12. The optical inspection apparatus of claim 1 , wherein the mirror surface is formed on a chamfered portion outside an end portion of the light guide alongside the inspection target. 13. The optical inspection apparatus of claim 1 , further comprising a heat sink thermally connected to the one or more light sources. 14. The optical inspection apparatus of claim 1 , further comprising a substrate mounted with the one or more light sources and including a through-hole portion through which the imaging optical system passes. 15. The optical inspection apparatus of claim 1 , wherein the one or more light sources include a plurality of light sources, and the plurality of light sources have different colors. 16. The optical inspection apparatus of claim 1 , wherein the one or more light sources include a plurality of light sources, and the plurality of light sources are turned on independently of one another. 17. The optical inspection apparatus of claim 1 , wherein the inner surface of the light guide is an arc surface that is projected in a direction approaching the optical axis. 18. An optical inspection apparatus comprising: an imaging optical system opposed to an inspection target; one or more light sources provided around the imaging optical system and spaced away from one another; a light guide extending cylindrically along an optical axis of the imaging optical system, and an end face of the light guide opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target, wherein when a distance from an incident pupil surface of the imaging optical system to the inspection target is 1, a light distribution angle of a main light beam emitted from the light guide is θ, a closest distance from the optical axis to the inner surface is R, and an extension distance of the light guide from the incident pupil surface along the optical axis is L, a following expression is satisfied: l - R tan ⁢ ⁢ θ < L < l . ( numerical ⁢ ⁢ expression ⁢ ⁢ 1 ) 19. An optical inspection apparatus comprising: an imaging optical system opposed to an inspection target; one or more light sources provided around the imaging optical system and spaced away from one another; a light guide extending cylindrically along an optical axis of the imaging optical system, and an end face of the light guide opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target; and a cylindrical light guide convex portion protruding toward the one or more light sources from the end face along the inner surface of the light guide and provided continuously with the light guide, and wherein a thickness of the light guide convex portion is smaller than the thickness between the inner surface and the outer surface.

Assignees

Inventors

Classifications

  • G02B6/00Primary

    Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings · CPC title

  • Specially adapted optical and illumination features · CPC title

  • Apparatus characterised by sensor details · CPC title

  • Testing the surface pattern, e.g. relief · CPC title

  • Means for removing heat created by the light source from the package · CPC title

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What does patent US10901134B2 cover?
According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light stru…
Who is the assignee on this patent?
Toshiba Kk
What technology area does this patent fall under?
Primary CPC classification G02B6/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 26 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).