Apparatus and method of testing performance of battery cell

Patent metadata

Field	Value
Publication number	US-10884065-B2
Application number	US-201716070701-A
Country	US
Kind code	B2
Filing date	Jun 29, 2017
Priority date	Aug 26, 2016
Publication date	Jan 5, 2021
Grant date	Jan 5, 2021

Abstract

Provided are apparatus and method of testing electrochemical performance of a battery cell in a nondestructive manner The apparatus according to an embodiment of the present disclosure includes: a memory configured to store first profile data, second profile data, a first positive electrode upper limit, a first positive electrode lower limit, a first negative electrode upper limit, and a first negative electrode lower limit that are determined in advance through a preliminary experiment with respect to each of a plurality of reference cells; a sensing unit configured to measure an open-circuit voltage of a test cell according to a variation in a state of charge (SOC) of the test cell; and a controller electrically connected to the memory and the sensing unit. The controller is configured to test performance of the test cell in a nondestructive manner based on data regarding the reference cells and data measured by the sensing unit stored in the memory.

First claim

What is claimed is:

1. An apparatus for nondestructively testing performance of a battery cell, the apparatus comprising:
a memory configured to store first profile data, second profile data, a first positive electrode upper limit, a first positive electrode lower limit, a first negative electrode upper limit, and a first negative electrode lower limit that are determined in advance through a preliminary experiment with respect to each of a plurality of reference cells;
a sensing unit configured to measure an open-circuit voltage of a test cell according to a variation in a state of charge (SOC) of the test cell; and
a controller electrically connected to the memory and the sensing unit and configured to test performance of the test cell in a nondestructive manner,
wherein the first profile data indicates a variation in an open-circuit voltage of a positive electrode of the reference cell according to a variation in an amount of lithium ions stored in the positive electrode of the reference cell,
wherein the second profile data indicates a variation in an open-circuit voltage of a negative electrode of the reference cell according to a variation in an amount of lithium ions stored in the negative electrode of the reference cell,
wherein the first positive electrode upper limit corresponds to the amount of lithium ions stored in the positive electrode of the reference cell at an upper limit within a predetermined SOC range,
wherein the first positive electrode lower limit corresponds to the amount of lithium ions stored in the positive electrode of the reference cell at a lower limit within the predetermined SOC range,
wherein the first negative electrode upper limit corresponds to the amount of lithium ions stored in the negative electrode of the reference cell at an upper limit within the predetermined SOC range, and
wherein the first negative electrode lower limit corresponds to the amount of lithium ions stored in the negative electrode of the reference cell at a lower limit within the predetermined SOC range,
wherein the controller is configured to:
generate third profile data indicating a variation in the open-circuit voltage of each of the plurality of the reference cells with respect to the predetermined SOC range, based on the first profile data, the second profile data, the first positive electrode upper limit, the first positive electrode lower limit, the first negative electrode upper limit, and the first negative electrode lower limit;
generate fourth profile data indicating a variation in an open-circuit voltage at opposite ends of the test cell with respect to the predetermined SOC range measured by the sensing unit;
estimate a first test result including a second positive electrode upper limit and a second positive electrode lower limit of the test cell, and a second test result including a second negative electrode upper limit and a second negative electrode lower limit of the test cell, based on the third profile data and the fourth profile data; and

wherein the second positive electrode upper limit corresponds to the amount of lithium ions stored in a positive electrode of the test cell at an upper limit within the predetermined SOC range,
wherein the second positive electrode lower limit corresponds to an amount of lithium ions stored in the positive electrode of the test cell at a lower limit within the predetermined SOC range,
wherein the second negative electrode upper limit corresponds to an amount of lithium ions stored in a negative electrode of the test cell at an upper limit within the predetermined SOC range,
wherein the second negative electrode lower limit corresponds to an amount of lithium ions stored in the negative electrode of the test cell at a lower limit of the predetermined SOC range, and
wherein the apparatus further comprises an output unit configured to output the first test result indicating performance of a positive electrode of the test cell and the second test result indicating performance of a negative electrode of the test cell.

2. The apparatus of claim 1 , wherein the controller is configured to declare a cost function indicating a sum of squares of a residual between the third profile data and the fourth profile data with respect to a plurality of sample values within the predetermined SOC range, and to estimate the second positive electrode upper limit, the second positive electrode lower limit, the second negative electrode upper limit, and the second negative electrode lower limit of the test cell, which make a value of the cost function minimum through a predetermined probability model.

3. The apparatus of claim 2 , wherein the controller is configured to estimate the second positive electrode upper limit, the second positive electrode lower limit, the second negative electrode upper limit, and the second negative electrode lower limit of the test cell, which make the value of the cost function minimum, by using an optimization algorithm given in advance or a Bayesian estimation method.

4. The apparatus of claim 1 , wherein the memory is configured to further store a maximum capacity value of the test cell, and
the controller is configured to calculate a first capacity value indicating a maximum capacity of the positive electrode of the test cell by using equation 1 below, and to calculate a second capacity value indicating a maximum capacity of the negative electrode of the test cell by using equation 2 below
[Equation 1]
Q t P =Q t F /( p f ′−p i ′)

[Equation 2]
Q t N =Q t F /( n f ′−n i ′),

where Q t F denotes the maximum capacity value, p f ′ denotes the second positive electrode upper limit, p i ′ denotes the second positive electrode lower limit, n f ′ denotes the second negative electrode upper limit, n i ′ denotes the second negative electrode lower limit, Q t P denotes the first capacity value, and Q t N denotes the second capacity value.

5. The apparatus of claim 4 , wherein the controller is configured to calculate an irreversible capacity of the test cell by using equation 3 below
[Equation 3]
Q loss =( Q t P ×p i ′)−( Q t N ×n i ′),

where Q loss denotes the irreversible capacity.

6. The apparatus of claim 4 , wherein the controller is configured to calculate a ratio between the maximum capacity of the negative electrode of the test cell and the maximum capacity of the positive electrode of the test cell by using equation 4 below
[Equation 4]
R NP =Q t N /Q t P =( p f ′p i ′)/( n f ′−n i ′),

where R NP denotes the ratio between the maximum capacity of the negative electrode of the test cell and the maximum capacity of the positive electrode of the test cell.

7. The apparatus of claim 1 , wherein the controller is configured to generate the fourth profile data by averaging a voltage profile during charging the test cell and a voltage profile during discharging the test cell within the predetermined SOC range.

8. The apparatus of claim 1 , wherein the controller is configured to generate the fourth profile data based on a voltage at opposite ends of the test cell, which is measured through a voltage relaxation method, within the predetermined SOC range.

9. A method of nondestructively testing performance of a battery cell, the method comprising:
(a) storing, by a memory, first profile data, second profile data, a first positive electrode upper limit, a first positive electrode lower limit, a first negative electrode upper limit, and a first negative electrode lower limit that are determined in advance through a preliminary experiment with respect to each of a plurality of reference cells;
(b) generating, by a controller

Assignees

• Lg Chemical Ltd

Inventors

• Lim Jin-Hyung
• Yoon Du-Seong
• Joe Won-Tae
• Choi Yong-Seok

Classifications

• H01M10/48

  Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte (constructional details of current conducting connections for detecting conditions inside cells or batteries, e.g. details of voltage sensing terminals, H01M50/569) · CPC title

• H01M10/482 Primary

  for several batteries or cells simultaneously or sequentially · CPC title

• G01R31/3648 Primary

  comprising digital calculation means, e.g. for performing an algorithm · CPC title

• G01R31/3842

  combining voltage and current measurements · CPC title

• G01R31/3835

  involving only voltage measurements · CPC title