Test arrangement and test method

Patent metadata

Field	Value
Publication number	US-10884045-B2
Application number	US-201816203019-A
Country	US
Kind code	B2
Filing date	Nov 28, 2018
Priority date	Mar 29, 2018
Publication date	Jan 5, 2021
Grant date	Jan 5, 2021

Abstract

Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

First claim

What we claim is:

1. A test device for analyzing a symmetric probe, the test device comprising:
a main signal line connectable to a first terminal of the symmetric probe, the main signal line comprises a test signal source interface, electrically connected to a first end of the main signal line and adapted to receive a test signal, and a first impedance, adapted to terminate a second end of the main signal line;
at least one symmetrical signal line, each symmetrical signal line being a further signal line connectable to a second terminal of the symmetric probe, each symmetrical signal line comprising a second impedance, adapted to terminate a first end of the respective symmetrical signal line; and
a dielectric support substrate, wherein the main signal line and the at least one symmetrical signal line are electrically conductive structures arranged on the dielectric support substrate.

2. The test device of claim 1 , further comprising a test signal source adapted to generate a ground referenced test signal and to provide the test signal to the main signal line.

3. The test device of claim 2 , wherein the ground referenced test signal comprises a predetermined source impedance.

4. The test device of claim 3 , wherein a value of the predetermined source impedance corresponds to a value of the first impedance.

5. The test device of claim 3 , wherein a value of the second impedance corresponds to a value of an impedance of a parallel connection of the predetermined source impedance and the first impedance.

6. The test device of claim 1 , wherein each symmetrical signal line further comprises a third impedance, adapted to terminate a second end of the respective symmetrical signal line.

7. The test device of claim 6 , wherein a value of the second impedance corresponds to a value of the third impedance.

8. The test device of claim 1 , comprising two symmetrical signal lines, arranged on opposite sides of the main signal line.

9. The test device of claim 1 , comprising a fastening device adapted to fasten the symmetric probe to the test device.

10. The test device of claim 1 , comprising a connector adapted to connect a measurement device to the main signal line and to at least one symmetrical signal line.

11. The test device of claim 1 , wherein the main signal line and the at least one symmetrical signal line are arranged as coplanar conducting paths.

12. The test device of claim 1 , comprising an analyzer adapted to receive a first measurement signal applied to the main signal line, to receive a second measurement signal measured by the symmetric probe, the symmetric probe being connected to the main signal line and at least one symmetrical signal line, and to determine a characteristic value of the symmetric probe based on the first measurement signal and the second measurement signal.

13. The test device of claim 12 , wherein the characteristic value of the symmetric probe comprises at least one of an impedance of the symmetric probe or a frequency response of the symmetric probe.

14. A method for analyzing a symmetric probe, the method comprising:
applying a ground referenced test signal with a predetermined test impedance to a main signal line, the main signal line being terminated by a first impedance, and the main signal line comprises an electrically conductive structure arranged on a dielectric support substrate;
measuring a first measurement signal provided by a terminal electrically connected to the main signal line, and the at least one symmetrical signal line comprises an electrically conductive structure arranged on the dielectric support substrate;
measuring, by the symmetric probe, a second measurement signal, wherein a first terminal of the symmetric probe is electrically connected to the main signal line and a second terminal of the symmetric probe is electrically connected to at least one symmetrical signal line terminated by a second impedance; and
determining a characteristic value of the symmetric probe based on the first measurement signal and the second measurement signal.

Assignees

• Rohde & Schwarz

Inventors

• Lippert Benedikt
• Peschke Martin
• Stuka Alexander
• Mittermair Renate
• Kunze Alexander

Classifications

• G01R1/06772

  High frequency probes · CPC title

• G01R35/005 Primary

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G01R1/067

  Measuring probes · CPC title

• G01R35/02

  of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating · CPC title

• H01P3/026

  Coplanar striplines [CPS] · CPC title