Characterization and correction of voltage probe, current probe and cable

Patent metadata

Field	Value
Publication number	US-9618599-B2
Application number	US-201113247568-A
Country	US
Kind code	B2
Filing date	Sep 28, 2011
Priority date	Sep 28, 2011
Publication date	Apr 11, 2017
Grant date	Apr 11, 2017

Abstract

Responses of voltage and current probes are characterized or corrected. A voltage probe method includes measuring output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected, measuring a second output of the through with the voltage probe disconnected, and characterizing the response of the voltage probe using the output of the voltage probe and the first and/or second outputs. A current probe method includes measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe connected in series, measuring second output current of the through with the current probe disconnected, and characterizing the response of the current probe using the output current of the current probe and the first and/or second output currents of the through.

First claim

What is claimed is:

1. A method for at least one of characterizing and correcting a response of a voltage probe, the method comprising:
measuring an output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe physically connected to a probe point of the through, the voltage probe comprising a first point that makes physical contact with a signal to be measured and a second point that makes physical contact to ground;
measuring a second output of the through in response to the input signal, with the voltage probe disconnected from the probe point;
characterizing the response of the voltage probe, comprising determining a transfer function of the voltage probe based on the measured output of the voltage probe and the measured first output of the through; and
correcting the transfer function of the voltage probe, comprising:
generating a filter correction for the voltage probe responsive to the measured output of the voltage probe and the measured first output of the through, wherein generating the filter correction comprises defining an ideal frequency response of the voltage probe, the filter correction comprising the ideal frequency response divided by the transfer function of the voltage probe; and
applying the filter correction to an output of the voltage probe generated in response to connection of the voltage probe to a probed system.

2. A method for at least one of characterizing and correcting a response of a voltage probe, the method comprising:
measuring an output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected to a probe point of the through;
measuring a second output of the through in response to the input signal, with the voltage probe disconnected from the probe point; and
characterizing the response of the voltage probe using the measured output of the voltage probe and at least one of the measured first output and the measured second output of the through,
wherein characterizing the voltage probe comprises determining an input impedance of the voltage probe based on the measured first output of the through with the probe connected and the measured second output of the through with the probe disconnected.

3. The method as claimed in claim 2 , further comprising:
correcting a system response of a probed system using the determined input impedance of the voltage probe.

4. The method as claimed in claim 3 , wherein correcting the system response of the probed system comprises:
generating a filter correction for the voltage probe responsive to the determined input impedance of the voltage probe; and
applying the filter correction to an output of the voltage probe generated in response to connection of the voltage probe to the probed system.

5. The method as claimed in claim 2 , wherein the input signal comprises one of a fast step signal and a fast impulse signal.

6. The method of claim 2 , wherein measuring the first and second outputs of the through is performed using a first oscilloscope channel, and measuring the output of the voltage probe is performed using a second oscilloscope channel.

7. The method as claimed in claim 2 , wherein the input signal comprises one of a fast step signal and a fast impulse signal.

8. The method of claim 2 , wherein measuring the first and second outputs of the through is performed using a first oscilloscope channel, and measuring the output of the voltage probe is performed using a second oscilloscope channel.

9. A method for at least one of characterizing and correcting a response of a current probe, the method comprising:
measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe physically connected in series between front-end and back-end transmission lines of the through;
measuring second output current of the through in response to the input signal, with the current probe disconnected from the through;
characterizing the response of the current probe, using comprising determining a transfer function of the current probe based on the measured output current of the current probe and the measured first output current of the through; and
correcting the transfer function of the current probe, comprising:
generating a filter correction for the current probe responsive to the measured output current of the current probe and the measured first output of the through, wherein generating the filter correction comprises defining an ideal frequency response of the current probe, the filter correction comprising the ideal frequency response divided by the transfer function of the current probe; and
applying the filter correction to an output of the current probe generated in response to connection of the current probe to a probed system.

10. A method for at least one of characterizing and correcting a response of a current probe, the method comprising:
measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe physically connected in series between front-end and back-end transmission lines of the through;
measuring second output current of the through in response to the input signal, with the current probe disconnected from the through; and
characterizing the response of the current probe using the measured output current of the current probe and at least one of the measured first output current and the measured second output current of the through,
wherein characterizing the current probe comprises determining an input impedance of the current probe based on the measured first output current of the through with the current probe connected and the measured second output current of the through with the current probe disconnected.

11. The method as claimed in claim 10 , further comprising:
correcting a system response of a probed system using the determined input impedance of the current probe.

12. The method as claimed in claim 10 , wherein the input signal comprises one of a fast step signal and a fast impulse signal.

13. The method of claim 10 , wherein measuring the first and second output currents of the through is performed using a first oscilloscope channel, and measuring the output of the current probe is performed using a second oscilloscope channel.

Assignees

• Dascher David
• Keysight Technologies Inc

Inventors

• Dascher David

Classifications

• G01R35/00 Primary

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title