Single X-ray grating X-ray differential phase contrast imaging system

Patent metadata

Field	Value
Publication number	US-10859517-B2
Application number	US-201715640092-A
Country	US
Kind code	B2
Filing date	Jun 30, 2017
Priority date	Apr 18, 2016
Publication date	Dec 8, 2020
Grant date	Dec 8, 2020

Abstract

Single X-ray grating differential phase contrast (DPC) X-ray imaging is provided by replacing the conventional X-ray source with a photo-emitter X-ray source array (PeXSA), and by replacing the conventional X-ray detector with a photonic-channeled X-ray detector array (PcXDA). These substitutions allow for the elimination of the G0 and G2 amplitude X-ray gratings used in conventional DPC X-ray imaging. Equivalent spatial patterns are formed optically in the PeXSA and the PcXDA. The result is DPC imaging that only has a single X-ray grating (i.e., the G1 X-ray phase grating).

First claim

The invention claimed is:

1. Apparatus for performing X-ray differential phase contrast imaging, the apparatus comprising:
a PeXSA X-ray source comprising a photo-emitter X-ray source array;
a PcXDA X-ray detector comprising:
a photonic channel X-ray detector array;
a scintillator that converts X-ray photons to optical photons having wavelengths between 400 nm and 1000 nm, creating a corresponding optical photon light pattern;
an optical detector array with a plurality of elements; and
an optical system with a plurality of optical imaging systems between the scintillator and the detector array wherein the optical system images the optical photon light pattern onto an optical detector array using the plurality of optical imaging systems, wherein the PeXSA X-ray source and the PcXDA X-ray detector provide X-ray differential phase contrast imaging.

2. The apparatus of claim 1 , wherein the photo-emitter X-ray source array comprises:
a light source;
a spatial light modulator configured to receive light from the light source and to provide an optical spatially patterned beam;
a photocathode configured to receive the optical spatially patterned beam and to provide patterned electron emission having an electron pattern according to the optical spatially patterned beam;
electron optics configured to receive the patterned electron emission and to provide an electron image of accelerated electrons according to the electron pattern;
an X-ray target disposed to receive the electron image of accelerated electrons and to provide patterned X-ray emission according to the electron image.

3. The apparatus of claim 1 , further comprising:
an optical grating mask configured to mask an optical image according to a grating mask pattern.

4. Apparatus for performing X-ray differential phase contrast imaging, the apparatus comprising:
an X-ray source comprising a photo-emitter X-ray source array;
an X-ray detector comprising a photonic-channeled X-ray detector array, wherein the photonic-channeled X-ray detector array comprises:
a scintillator configured to receive X-rays and to provide corresponding optical radiation;
an optical subsystem configured to receive the optical radiation and to provide an optical image, wherein the optical subsystem comprises:
a first telecentric lens array;
a second telecentric lens array;
a phase coded aperture disposed between the first telecentric lens array and the second telecentric lens array;
wherein the optical subsystem is configured as a 4f imaging system;
wherein a Fourier transform of the optical radiation is formed at the location of the phase coded aperture;
wherein a Fourier transform of optical radiation transmitted through the phase coded aperture is formed as the optical image at the location of the optical grating mask;

an optical detector array configured to receive the optical image and to provide a detector signal corresponding to the optical image; and
an X-ray phase grating disposed between the X-ray source and the X-ray detector;
wherein the apparatus includes no X-ray grating other than the X-ray phase grating.

5. A method of performing X-ray differential phase contrast imaging, the method comprising:
providing an apparatus for performing X-ray differential phase contrast imaging, the apparatus comprising:
a PeXSA X-ray source comprising a photo-emitter X-ray source array;
a PcXDA X-ray detector comprising:
a photonic channel X-ray detector array;
a scintillator that converts X-ray photons to optical photons having wavelengths between 400 nm and 1000 nm, an optical detector array; and
an optical system that images the optical photon light patterns onto an optical detector array using a plurality of optical imaging systems between the scintillator and the detector array and the PcXDA X-ray detector provide X-ray differential phase contrast imaging; and

analyzing X-ray fringe patterns to provide X-ray differential phase contrast imaging.

6. The method of claim 5 , wherein the analyzing X-ray fringe patterns comprises scanning a detected X-ray fringe pattern by scanning an optical fringe pattern within the photo-emitter X-ray source array.

7. The method of claim 5 , wherein the analyzing X-ray fringe patterns comprises scanning a detected X-ray fringe pattern by altering a transmission pattern of an optical grating mask within the photonic-channeled X-ray detector array.

8. The method of claim 7 , wherein the optical grating mask comprises an array of liquid crystal optical transmission devices.

9. The method of claim 5 , wherein the analyzing X-ray fringe patterns comprises analyzing a detected X-ray fringe pattern with an optical detector array, wherein the optical detector array has a pixel size of no more than 0.5 times a pitch of a detected X-ray fringe pattern.

10. The method of claim 5 , wherein the analyzing X-ray fringe patterns comprises analyzing a detected X-ray fringe pattern using an optical grating mask that includes at least three distinct grating sub-mask patterns.

11. The apparatus of claim 3 , wherein the optical grating mask comprises a metal of at least one of Cr, Ti, Au, Pt, Ta, Cu, and Al.

12. The apparatus of claim 3 , wherein the optical grating mask has a thickness of at least 50 nm.

13. The apparatus of claim 3 , wherein the optical grating mask comprises at least three distinct grating sub-mask patterns.

14. The apparatus of claim 1 , further comprising an X-ray phase grating disposed between the PeXSA X-ray source and the PcXDA X-ray detector.

15. The apparatus of claim 14 , wherein the apparatus includes no X-ray grating other than the X-ray phase grating.

16. The apparatus of claim 1 , wherein the optical detector array is located at a conjugate imaging plane of the optical photon light pattern.

17. The method of claim 5 , wherein the optical detector array is located at a conjugate imaging plane of the optical photon light pattern.

Assignees

• Univ Leland Stanford Junior
• Univ Of Arizona

Inventors

• Hesselink Lambertus
• Yuen Max
• Cheng Yao-Te
• Takashima Yuzuru

Classifications

• A61B6/4241

  using energy resolving detectors, e.g. photon counting · CPC title

• A61B6/483

  involving scattered radiation · CPC title

• G01T1/2002

  Optical details, e.g. reflecting or diffusing layers · CPC title

• G01N23/20075 Primary

  by measuring interferences of X-rays, e.g. Borrmann effect · CPC title

• A61B6/484

  involving phase contrast X-ray imaging · CPC title