Charge pump for use in non-volatile flash memory devices

US10847227B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10847227-B2
Application numberUS-201816219424-A
CountryUS
Kind codeB2
Filing dateDec 13, 2018
Priority dateOct 16, 2018
Publication dateNov 24, 2020
Grant dateNov 24, 2020

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Numerous embodiments of an improved charge pump design are disclosed for generating the high voltages necessary to perform erase and program operations in non-volatile flash memory devices. In these embodiments, each boost stage in the charge pump is modified to overcome a deficiency in prior art charge pumps whereby voltage actually would decrease in the final boost stage. These modifications include the addition of one or more of a clock doubling circuit, a local self-precharge circuit, a feed-forward precharge circuit, a feed-backward precharge circuit, and a hybrid circuit comprising NMOS and PMOS transistors and diodes.

First claim

Opening claim text (preview).

What is claimed is: 1. A charge pump for receiving an input voltage and generating an output voltage, the charge pump comprising a plurality of boost stages and each of the plurality of boost stages comprising: an input node for the boost stage; an output node for the boost stage; a first capacitor comprising an input terminal for receiving a first clock signal and an output terminal coupled to the input node; a second capacitor comprising an input terminal for receiving a second clock signal and an output terminal; a pass gate comprising a first terminal coupled to the input node, a second terminal coupled to the output node, and a gate coupled to the output terminal of the second capacitor; a boost gate comprising a first terminal coupled to the input node, a second terminal coupled to the output terminal of the second capacitor, and a gate coupled to the output node; a transistor comprising a first terminal coupled to the input node, a gate coupled to the input node, and a second terminal coupled to the output terminal of the second capacitor; wherein the input node for the boost stage is coupled to an output node of another boost stage in the plurality of boost stages or to a source providing the input voltage; and wherein the output node for the boost stage is coupled to an input node of another boost stage in the plurality of boost stages or provides the output voltage. 2. The charge pump of claim 1 , wherein each of the plurality of boost stages further comprises: a precharge gate comprising a first terminal coupled to a precharge voltage source, a gate coupled to the first terminal, and a second terminal coupled to the output node. 3. The charge pump of claim 1 , wherein each of the plurality of boost stages further comprises: a transistor comprising a first terminal coupled to the input node, a gate coupled to the input node, and a second terminal coupled to the output node. 4. The charge pump of claim 3 , wherein each of the plurality of boost stages further comprises: a precharge gate comprising a first terminal coupled to a precharge voltage source, a gate coupled to the first terminal, and a second terminal coupled to the output node. 5. A charge pump for receiving an input voltage and generating an output voltage, the charge pump comprising a plurality of boost stages and each of the plurality of boost stages comprising: an input node for the boost stage; an output node for the boost stage; a first capacitor comprising an input terminal for receiving a first clock signal and an output terminal coupled to the input node; a second capacitor comprising an input terminal for receiving a second clock signal and an output terminal; a pass gate comprising a first terminal coupled to the input node, a second terminal coupled to the output node, and a gate coupled to the output terminal of the second capacitor; a boost gate comprising a first terminal coupled to the input node, a second terminal coupled to the output terminal of the second capacitor, and a gate coupled to the output node; a diode comprising a first terminal coupled to the input node and a second terminal coupled to the output node. wherein the input node for the boost stage is coupled to an output node of another boost stage in the plurality of boost stages or to a source providing the input voltage; and wherein the output node for the boost stage is coupled to an input node of another boost stage in the plurality of boost stages or provides the output voltage. 6. The charge pump of claim 5 , wherein each of the plurality of boost stages further comprises: a precharge gate comprising a first terminal coupled to a precharge voltage source, a gate coupled to the first terminal, and a second terminal coupled to the output node. 7. A charge pump for receiving an input voltage and generating an output voltage, the charge pump comprising a plurality of boost stages and each of the plurality of boost stages comprising: an input node for the boost stage; an output node for the boost stage; a first capacitor comprising an input terminal for receiving a first clock signal and an output terminal coupled to the input node; a second capacitor comprising an input terminal for receiving a second clock signal and an output terminal; a pass gate comprising a first terminal coupled to the input node, a second terminal coupled to the output node, and a gate coupled to the output terminal of the second capacitor; a boost gate comprising a first terminal coupled to the input node, a second terminal coupled to the output terminal of the second capacitor, and a gate coupled to the output node; a local precharge device comprising a first terminal coupled to another boost stage in the plurality of boost stages or to a voltage source and a second terminal coupled to the output terminal of the second capacitor; wherein the input node for the boost stage is coupled to an output node of another boost stage in the plurality of boost stages or to a source providing the input voltage; and wherein the output node for the boost stage is coupled to an input node of another boost stage in the plurality of boost stages or provides the output voltage. 8. The charge pump of claim 7 , wherein the local precharge device is a Schottky diode or a p/n junction diode. 9. The charge pump of claim 7 , wherein the local precharge device is a diode-connected transistor. 10. The charge pump of claim 7 , wherein each of the plurality of boost stages further comprises: a precharge gate comprising a first terminal coupled to a precharge voltage source, a gate coupled to the first terminal, and a second terminal coupled to the output node. 11. A charge pump for receiving an input voltage and generating an output voltage, the charge pump comprising a plurality of boost stages and each of the plurality of boost stages comprising: an input node for the boost stage; an output node for the boost stage; a first capacitor comprising an input terminal for receiving a first clock signal and an output terminal coupled to the input node; a second capacitor comprising an input terminal for receiving a second clock signal and an output terminal; a pass gate comprising a first terminal coupled to the input node, a second terminal coupled to the output node, and a gate coupled to the output terminal of the second capacitor; a diode comprising a first terminal coupled to the input node and a second terminal coupled to the output terminal of the second capacitor; wherein the input node for the boost stage is coupled to an output node of another boost stage in the plurality of boost stages or to a source providing the input voltage; and wherein the output node for the boost stage is coupled to an input node of another boost stage in the plurality of boost stages or provides the output voltage. 12. The charge pump of claim 11 , further comprising: a boost gate comprising a first terminal coupled to the input node, a second terminal coupled to the output terminal of the second capacitor, and a gate coupled to the output node. 13. The charge pump of claim 11 , wherein each of the plurality of boost stages further comprises: a precharge gate comprising a first terminal coupled to a precharge voltage source, a gate coupled to the first terminal, and a second terminal coupled to the output node. 14. A charge pump for receiving an input voltage and generating an output voltage, the charge pump comprising: a clock doubling circuit for receiving a first clock signal and generating a second clock signal, wherein the second clock signal has the same frequency and phase as the first cloc

Assignees

Inventors

Classifications

  • using capacitors charged and discharged alternately by semiconductor devices with control electrode {, e.g. charge pumps} · CPC title

  • comprising cells containing a merged floating gate and select transistor · CPC title

  • Timing circuits · CPC title

  • Clock generating, synchronizing or distributing circuits within memory device · CPC title

  • G11C16/30Primary

    Power supply circuits · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10847227B2 cover?
Numerous embodiments of an improved charge pump design are disclosed for generating the high voltages necessary to perform erase and program operations in non-volatile flash memory devices. In these embodiments, each boost stage in the charge pump is modified to overcome a deficiency in prior art charge pumps whereby voltage actually would decrease in the final boost stage. These modifications …
Who is the assignee on this patent?
Silicon Storage Tech Inc
What technology area does this patent fall under?
Primary CPC classification G11C16/30. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 24 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).