Fan-out semiconductor package

US10770403B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10770403-B2
Application numberUS-201816197764-A
CountryUS
Kind codeB2
Filing dateNov 21, 2018
Priority dateMay 4, 2018
Publication dateSep 8, 2020
Grant dateSep 8, 2020

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  1. Title

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  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A fan-out semiconductor package includes a connection member including an insulating layer and a redistribution layer, a semiconductor chip disposed on the connection member, an encapsulant encapsulating the semiconductor chip, and an electromagnetic radiation blocking layer disposed above the semiconductor chip and including a base layer in which a plurality of degassing holes are formed and a porous blocking portion filled in the plurality of degassing holes.

First claim

Opening claim text (preview).

What is claimed is: 1. A fan-out semiconductor package comprising: a connection member including an insulating layer and a redistribution layer; a semiconductor chip disposed on the connection member; an encapsulant encapsulating the semiconductor chip; and an electromagnetic radiation blocking layer disposed above the semiconductor chip and including a base layer in which a plurality of degassing holes are formed and a porous blocking portion filled in the plurality of degassing holes. 2. The fan-out semiconductor package of claim 1 , wherein the porous blocking portion has a form in which a plurality of particles are agglomerated. 3. The fan-out semiconductor package of claim 1 , wherein the porous blocking portion is a porous plating layer. 4. The fan-out semiconductor package of claim 1 , wherein the base layer comprises metal thin film. 5. The fan-out semiconductor package of claim 1 , wherein the base layer comprises a Cu plating layer. 6. The fan-out semiconductor package of claim 1 , wherein the electromagnetic radiation blocking layer includes a first region and a second region, and a density of the degassing holes is higher in the first region than in the second region. 7. The fan-out semiconductor package of claim 6 , wherein the second region is disposed in a region corresponding to the semiconductor chip. 8. The fan-out semiconductor package of claim 6 , further comprising a core member including a through-hole in which the semiconductor chip is accommodated and a metal layer covering walls forming the through-hole. 9. The fan-out semiconductor package of claim 8 , wherein the metal layer of the core member and the electromagnetic radiation blocking layer are connected to each other by a conductive via penetrating through the encapsulant. 10. The fan-out semiconductor package of claim 6 , further comprising a plurality of passive components disposed on the connection member. 11. The fan-out semiconductor package of claim 10 , wherein the first region is disposed in a region corresponding to at least some of the plurality of passive components. 12. The fan-out semiconductor package of claim 11 , wherein distances from upper surfaces of at least some of the plurality of passive components to an upper surface of the encapsulant are different from each other, and a density of the degassing holes is higher in a region corresponding to a passive component having a larger distance from an upper surface thereof to the upper surface of the encapsulant among the plurality of passive components, the upper surfaces being surfaces of corresponding components and encapsulant away from the connection member. 13. The fan-out semiconductor package of claim 10 , wherein the plurality of passive components include a capacitor and an inductor, and a density of the degassing holes is higher in a region corresponding to the capacitor than in a region corresponding to the inductor. 14. A fan-out semiconductor package comprising: a connection member including an insulating layer and a redistribution layer; a semiconductor chip disposed on the connection member; an encapsulant encapsulating the semiconductor chip; and an electromagnetic radiation blocking layer disposed above the semiconductor chip and having a porous structure. 15. The fan-out semiconductor package of claim 14 , wherein the electromagnetic radiation blocking layer has a form in which a plurality of particles are agglomerated. 16. The fan-out semiconductor package of claim 14 , wherein the electromagnetic radiation blocking layer is a porous plating layer.

Assignees

Inventors

Classifications

  • shielding resins · CPC title

  • of the portions that connect to chips, wafers or package parts · CPC title

  • the semiconductor body being completely enclosed · CPC title

  • comprising multiple insulating layers · CPC title

  • the multiple chips being integrally enclosed · CPC title

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Frequently asked questions

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What does patent US10770403B2 cover?
A fan-out semiconductor package includes a connection member including an insulating layer and a redistribution layer, a semiconductor chip disposed on the connection member, an encapsulant encapsulating the semiconductor chip, and an electromagnetic radiation blocking layer disposed above the semiconductor chip and including a base layer in which a plurality of degassing holes are formed and a…
Who is the assignee on this patent?
Samsung Electronics Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10W70/611. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 08 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).