Statistical temperature sensor calibration apparatus and methodology

Patent metadata

Field	Value
Publication number	US-10768057-B2
Application number	US-201715695883-A
Country	US
Kind code	B2
Filing date	Sep 5, 2017
Priority date	Mar 30, 2017
Publication date	Sep 8, 2020
Grant date	Sep 8, 2020

Abstract

A method and apparatus for calibrating a temperature sensor is disclosed. In one embodiment, a method comprises generating first and second digital values based respectively on first and second voltages applied to a portion of a temperature sensor circuit. An arithmetic circuit may derive the value of the second voltage based on the first and second digital values. The method further comprises determining an initial value of a constant based on values of the first and second voltages, and determining a final value of the constant based on the initial voltage and at least one voltage offset. The constant may then be used in determining temperature readings for the temperature sensor.

First claim

What is claimed is:

1. A method comprising:
generating first and second digital values based respectively on first and second voltages applied to a portion of a first temperature sensor implemented on an integrated circuit (IC);
deriving a value of the second voltage based on the first and second digital values;
determining an initial value of a constant based at least partly on the value of the second voltage derived from the first and second digital values;
determining a final value of the constant based on the initial value of the constant and at least one voltage offset that is separate from the first and second voltages; and
subsequent to determining the final value, using the constant to calculate temperatures sensed by the first temperature sensor.

2. The method as recited in claim 1 , further comprising:
determining the at least one voltage offset by solving a system of N equations with N unknown variables, wherein N is an integer value; and
determining the final value of the constant by multiplying the initial value by a ratio of the value of the second voltage derived from the first and second digital values to a difference between the first voltage and the at least one voltage offset.

3. The method as recited in claim 1 , wherein the value of the first voltage is a known voltage, and wherein the value of the second voltage is unknown prior to deriving.

4. The method as recited in claim 1 , wherein the first voltage is provided from a source external to the IC, and wherein the second voltage is provided from a source internal to the IC.

5. The method as recited in claim 1 , further comprising:
repeating said generating, said deriving, and said determining an initial value of a constant for a second temperature sensor implemented on the IC in close proximity to the first temperature sensor; and
determining final values of corresponding constants for each of the first and second temperature sensors based on the at least one voltage offset, the at least one voltage offset being associated with the first temperature sensor, and a second voltage offset associated with the second temperature sensor.

6. The method as recited in claim 1 , wherein deriving the value of the second voltage comprises multiplying the value of the first voltage by a ratio of the second digital value to the first digital value.

7. The method as recited in claim 1 , further comprising an arithmetic circuit receiving the first and second digital values, deriving the value of the second voltage, and determining the initial and the final value of the constant.

8. The method as recited in claim 1 , further comprising:
obtaining third and fourth digital values based on third and fourth voltages, respectively, wherein the third and fourth voltages are provided by a bandgap circuit of the temperature sensor.

9. The method as recited in claim 8 , further comprising:
determining a difference between the third and fourth digital values;
determining a quotient of the difference divided by the second digital value; and
determining a temperature reading by multiplying the final value of the constant by the quotient.

10. The method as recited in claim 8 , further comprising:
the bandgap circuit generating the third voltage across a first diode junction; and
the bandgap circuit generating the fourth voltage across a second diode junction;
wherein the second diode junction is larger than the first diode junction.

11. An integrated circuit (IC) comprising:
a selection circuit coupled to receive first, second, third, and fourth voltages on first, second, third, and fourth inputs, respectively;
a bandgap circuit coupled to provide the third and fourth voltages to the selection circuit;
analog-to-digital conversion circuitry configured to generate first, second, third and fourth digital values based on the first, second, third and fourth voltages, respectively, as received from the selection circuit; and
arithmetic circuitry configured to:
derive a value of the second voltage based on the first and second digital values;
determine an initial value of a constant based on the second voltage;
determine a final value of the constant based on the initial value and a first voltage offset that is separate from the first and second voltages, the voltage offset being associated with a first temperature sensor that comprises the selection circuit, the bandgap circuit, and the analog-to-digital conversion circuitry; and
subsequent to determining the final value of the constant, determine a temperature based on the third and fourth digital values and the final value of the constant.

12. The integrated circuit as recited in claim 11 , wherein the first voltage is provided from a source external to the IC, wherein a value of the first voltage is known, wherein the value of the second voltage is unknown prior to being derived by the arithmetic circuit, and wherein the second voltage is provided from a source internal to the IC.

13. The integrated circuit as recited in claim 11 , wherein the bandgap circuit includes a first diode junction configured to generate the first voltage and a second diode junction configured to generate the second voltage, wherein the second diode junction is larger than the first diode junction.

14. The integrated circuit as recited in claim 11 , wherein the arithmetic circuit is configured to determine the temperature by:
calculating a difference between the third and fourth digital values;
calculating a quotient of the difference divided by the second digital value; and
calculating the temperature by multiplying the final value of the constant by the quotient.

15. The integrated circuit as recited in claim 11 , wherein the IC further includes a second temperature sensor that is substantially identical and in close proximity to the first temperature sensor, and wherein the arithmetic circuitry is further configured to:
determine a second voltage offset associated with the second temperature sensor; and
determine the final value of the constant, for the first temperature sensor, and determine a final value of a constant for the second temperature sensor based on the first voltage offset and the second voltage offset.

16. The integrated circuit as recited in claim 11 , further comprising a control circuit configured to generate selection signals applied to the selection circuit, wherein the control circuit is configured to cause selection of one of the first, second, third, or fourth inputs.

17. The integrated circuit as recited in claim 11 , wherein the arithmetic circuit is configured to calculate the temperature by:
calculating a difference between the third and fourth digital values;
calculating a quotient of the difference divided by the second digital value; and
calculating the temperature by multiplying the final value of the constant by the quotient.

18. A method comprising:
applying a first voltage to a portion of a first temperature sensor, wherein the first voltage is provided from a source external to an integrated circuit (IC) upon which the temperature sensor is implemented, and wherein a value of the first voltage is a known value;
applying a second voltage to the portion of the temperature sensor, wherein the second voltage is provided from a source on the IC, and wherein a value of the second voltage is initially unknown;
generating first and second digital values based on applying the first and second voltages, respectively;
deriving a value of the second voltage based on the first and second digital values;
calculatin

Assignees

• Oracle Int Corp

Inventors

• Turullols Sebastian
• Pham Ha
• Hwang Changku
• Yanggong Yifan
• Xie Qing

Classifications

• G01K15/005 Primary

  Calibration · CPC title

• G01K7/01

  using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence) · CPC title