Self-cleaning film system and method of forming same
US-2018333709-A1 · Nov 22, 2018 · US
US10754067B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10754067-B2 |
| Application number | US-201715598838-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 18, 2017 |
| Priority date | May 18, 2017 |
| Publication date | Aug 25, 2020 |
| Grant date | Aug 25, 2020 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A self-cleaning film system includes a substrate and an anti-reflection film disposed on the substrate. The anti-reflection film includes a first sheet formed from titanium dioxide, a second sheet formed from silicon dioxide and disposed on the first sheet, and a third sheet formed from titanium dioxide and disposed on the second sheet. The system includes a self-cleaning film disposed on the anti-reflection film and including a monolayer disposed on the third sheet and formed from a fluorinated material selected from the group consisting of fluorinated organic compounds, fluorinated inorganic compounds, and combinations thereof. The self-cleaning film includes a first plurality of regions disposed within the monolayer such that each of the first plurality of regions abuts and is surrounded by the fluorinated material and includes a photocatalytic material.
Opening claim text (preview).
What is claimed is: 1. A self-cleaning film system comprising: a substrate; and an anti-reflection film disposed on the substrate and including: a first sheet formed from titanium dioxide; a second sheet formed from silicon dioxide and disposed on the first sheet; and a third sheet formed from titanium dioxide and disposed on the second sheet; a self-cleaning film disposed on the anti-reflection film and including: a monolayer disposed on the third sheet and formed from a fluorinated material selected from the group consisting of fluorinated organic compounds, fluorinated inorganic compounds, and combinations thereof; and a first plurality of regions disposed within the monolayer such that each of the first plurality of regions abuts and is surrounded by the fluorinated material, wherein each of the first plurality of regions includes a photocatalytic material. 2. The self-cleaning film system of claim 1 , wherein the fluorinated material is fluorinated diamond-like carbon. 3. The self-cleaning film system of claim 1 , wherein the monolayer has a texture defined by a combination of a plurality of microstructures and a plurality of nanostructures. 4. The self-cleaning film system of claim 1 , wherein the anti-reflection film further includes a fourth layer disposed on the third layer and formed from silicon dioxide. 5. The self-cleaning film system of claim 1 , wherein the first sheet has a first thickness, the second sheet has a second thickness that is greater than the first thickness, and the third sheet has a third thickness that is greater than the first thickness and the second thickness. 6. The self-cleaning film system of claim 1 , wherein the self-cleaning film has a first surface and a second surface spaced opposite the first surface and abutting the anti-reflection film, and further wherein the first surface is substantially free from squalene and water. 7. The self-cleaning film system of claim 6 , wherein the substrate has: a proximal surface abutting the anti-reflection film; a distal surface spaced opposite the proximal surface; a first edge connecting the proximal surface and the distal surface; and a second edge spaced opposite the first edge; and further including a light source disposed adjacent the first edge and configured for emitting electromagnetic radiation. 8. The self-cleaning film system of claim 7 , wherein the electromagnetic radiation has a wavelength of from 400 nm to 100 nm. 9. The self-cleaning film system of claim 7 , wherein the electromagnetic radiation has a wavelength of from 740 nm to 380 nm. 10. The self-cleaning film system of claim 1 , wherein the self-cleaning film defines a contact angle with water of greater than 140°. 11. The self-cleaning film system of claim 1 , wherein the photocatalytic material is titanium dioxide and present in the first plurality of regions in a rutile form. 12. The self-cleaning film system of claim 1 , wherein the photocatalytic material is titanium dioxide and is present in the first plurality of regions in an anatase form. 13. The self-cleaning film system of claim 1 , wherein the photocatalytic material is titanium dioxide and is present in the first plurality of regions as a combination of a rutile form and an anatase form. 14. The self-cleaning film system of claim 1 , wherein the photocatalytic material is doped with silver. 15. The self-cleaning film system of claim 1 , further including a second plurality of regions disposed within the monolayer such that each of the second plurality of regions abuts and is surrounded by the fluorinated material, wherein each of the second plurality of regions includes silver. 16. A self-cleaning film system comprising: a substrate; and an anti-reflection film disposed on the substrate and including: a first sheet formed from titanium dioxide; a second sheet formed from silicon dioxide and disposed on the first sheet; and a third sheet formed from titanium dioxide and disposed on the second sheet; a self-cleaning film disposed on the anti-reflection film and including: a monolayer disposed on the third sheet and formed from a fluorinated material selected from the group consisting of fluorinated organic compounds, fluorinated inorganic compounds, and combinations thereof; wherein the monolayer has a texture defined by: a plurality of microstructures spaced apart from one another along the monolayer; and a plurality of nanostructures disposed on each of the plurality of microstructures; and a first plurality of regions disposed within the monolayer such that each of the first plurality of regions abuts and is surrounded by the fluorinated material, wherein each of the first plurality of regions includes a photocatalytic material. 17. The self-cleaning film system of claim 16 , wherein each of the plurality of microstructures has a conical shape and a first height of from 0.5 μm to 2 μm and further wherein each of the plurality of nanostructures has a second height of from 1 nm to 4 nm. 18. The self-cleaning film system of claim 16 , wherein the anti-reflection film further includes a fourth layer disposed on the third layer and formed from silicon dioxide. 19. A method of forming a self-cleaning film system, the method comprising: depositing an anti-reflection film on a substrate, wherein the anti-reflection film includes: a first sheet formed from titanium dioxide; a second sheet formed from silicon dioxide and disposed on the first sheet; and a third sheet formed from titanium dioxide and disposed on the second sheet; magnetron sputtering a self-cleaning film on the anti-reflection film, wherein the self-cleaning film includes: a monolayer disposed on the third sheet and formed from a fluorinated material selected from the group consisting of fluorinated organic compounds, fluorinated inorganic compounds, and combinations thereof; and a first plurality of regions disposed within the monolayer such that each of the first plurality of regions abuts and is surrounded by the fluorinated material, wherein each of the first plurality of regions includes a photocatalytic material; and after magnetron sputtering, reactive ion etching the self-cleaning film with SF 6 —O 2 gas to produce a texture defined by: a plurality of microstructures spaced apart from one another along the monolayer; and a plurality of nanostructures disposed on each of the plurality of microstructures. 20. The method of claim 19 , wherein reactive ion etching includes forming each of the plurality of microstructures to have a conical shape and a first height of from 0.5 μm to 2 μm and forming each of the plurality of nanostructures to have a second height of from 1 nm to 4 nm.
of zinc, germanium, cadmium, indium, tin, thallium or bismuth · CPC title
Treatment with charged particles (C23C14/582 takes precedence) · CPC title
Characterised by the use of polycarbonates; Derivatives of polycarbonates · CPC title
the surface having a microscopic surface pattern to achieve the same effect as a lotus flower · CPC title
Irradiation by, or application of, electric, magnetic or wave energy, e.g. ultrasonic waves {; Ionic sputtering; Flame or plasma spraying; Particle radiation} · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.