Diagnostic waveguide for optical chip testing

US10732029B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10732029-B2
Application numberUS-201816178840-A
CountryUS
Kind codeB2
Filing dateNov 2, 2018
Priority dateAug 10, 2012
Publication dateAug 4, 2020
Grant dateAug 4, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A photonics system includes a transmit photonics module and a receive photonics module. The photonics system also includes a transmit waveguide coupled to the transmit photonics module, a first optical switch integrated with the transmit waveguide, and a diagnostics waveguide optically coupled to the first optical switch. The photonics system further includes a receive waveguide coupled to the receive photonics module and a second optical switch integrated with the receive waveguide and optically coupled to the diagnostics waveguide.

First claim

Opening claim text (preview).

What is claimed is: 1. A system for optical communication, the system comprising: a chip; a transmitter, wherein: the transmitter is on the chip; and the transmitter generates light; a receiver, wherein: the receiver is on the chip; and the receiver is an optical receiver; and a diagnostics waveguide, wherein: the diagnostics waveguide is on the chip; and the diagnostics waveguide optically couples light from the transmitter with the receiver. 2. The system of claim 1 , further comprising a photodetector integrated on the chip and optically coupled with the transmitter. 3. The system of claim 2 , further comprising a tap that couples the photodetector with the diagnostics waveguide, such that the photodetector is optically coupled with the transmitter. 4. The system of claim 2 , wherein the photodetector provides data on optical power, wavelength, spectral characteristics, and/or compliance with modulation or communication standards of light generated by the transmitter. 5. The system of claim 1 , wherein the chip is part of an undiced wafer. 6. The system of claim 1 , further comprising: a transmit waveguide, wherein: the transmit waveguide is on the chip; and the transmit waveguide is coupled with the transmitter; and a receive waveguide, wherein: the receive waveguide is on the chip; the receive waveguide is coupled with the receiver; and the diagnostics waveguide optically couples light from the transmitter with the receiver by optically coupling the transmit waveguide with the receive waveguide. 7. The system of claim 6 , further comprising a variable coupler between the transmit waveguide and the diagnostics waveguide. 8. The system of claim 7 , wherein the variable coupler is a Mach-Zehnder interferometer. 9. The system of claim 1 , further comprising an out-of-plane coupler optically coupled with the diagnostics waveguide. 10. A method for testing optical communication, the method comprising: generating an optical signal using a transmitter, wherein the transmitter is on a chip; coupling at least a part of the optical signal into a diagnostics waveguide to provide a diagnostics signal, wherein the diagnostics waveguide is on the chip; transmitting the diagnostics signal through the diagnostics waveguide; and receiving the diagnostics signal at a receiver, wherein: the receiver is an optical receiver; and the receiver is on the chip. 11. The method of claim 10 , further comprising coupling light into a photodetector on the chip. 12. The method of claim 11 , wherein a tap is used to couple at least a portion of the diagnostics signal from the diagnostics waveguide with the photodetector. 13. The method of claim 11 , further comprising receiving from the photodetector data on optical power, wavelength, spectral characteristics, and/or compliance with modulation or communication standards of light generated by the transmitter. 14. The method of claim 10 , wherein the chip is part of a wafer that is undiced, and the method further comprises dicing the wafer after receiving the diagnostics signal at the receiver. 15. The method of claim 10 , wherein the optical signal is generated in accordance with a test pattern using circuitry on the chip. 16. The method of claim 10 , further comprising coupling light from off the chip into the diagnostics waveguide. 17. A system for optical testing, the system comprising: a chip; a transmitter, wherein: the transmitter is on the chip; and the transmitter generates light; a receiver, wherein: the receiver is on the chip; and the receiver is an optical receiver; a photodetector; and a diagnostics waveguide, wherein the diagnostics waveguide optically couples light from the transmitter with the receiver and with the photodetector. 18. The system of claim 17 , further comprising a branching coupler that couples the photodetector with the diagnostics waveguide, such that the photodetector is optically coupled with the transmitter. 19. The system of claim 17 , wherein the chip is part of an undiced wafer. 20. The system of claim 17 , further comprising a test circuit on the chip.

Assignees

Inventors

Classifications

  • Testing or characterisation of optical devices, e.g. amplifiers · CPC title

  • Monitoring line transmitter or line receiver equipment · CPC title

  • for testing lamps or other light sources · CPC title

  • using service channels; using auxiliary channels · CPC title

  • Built-in tests · CPC title

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Frequently asked questions

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What does patent US10732029B2 cover?
A photonics system includes a transmit photonics module and a receive photonics module. The photonics system also includes a transmit waveguide coupled to the transmit photonics module, a first optical switch integrated with the transmit waveguide, and a diagnostics waveguide optically coupled to the first optical switch. The photonics system further includes a receive waveguide coupled to the …
Who is the assignee on this patent?
Skorpios Tech Inc
What technology area does this patent fall under?
Primary CPC classification H04B10/0731. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 04 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).