Composition for forming a resist upper-layer film and method for producing a semiconductor device using the composition
US-2017205711-A1 · Jul 20, 2017 · US
US10663864B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10663864-B2 |
| Application number | US-201815904438-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 26, 2018 |
| Priority date | Sep 30, 2015 |
| Publication date | May 26, 2020 |
| Grant date | May 26, 2020 |
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The pattern forming method includes forming an actinic ray-sensitive or radiation-sensitive film using an actinic ray-sensitive or radiation-sensitive composition, forming an upper layer film on the actinic ray-sensitive or radiation-sensitive film using a composition for forming an upper layer film, exposing the actinic ray-sensitive or radiation-sensitive film having the upper layer film formed thereon, and developing the exposed actinic ray-sensitive or radiation-sensitive film using a developer, in which the composition for forming an upper layer film includes a solvent and a crosslinking agent; and in which the content of a solvent having a hydroxyl group is 80% by mass or less with respect to all the solvents included in the composition for forming an upper layer film. The method for manufacturing an electronic device includes the pattern forming method. The laminate has an actinic ray-sensitive or radiation-sensitive film, and an upper layer film including a crosslinking agent.
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What is claimed is: 1. A pattern forming method comprising: (a) forming an actinic ray-sensitive or radiation-sensitive film using an actinic ray-sensitive or radiation-sensitive composition; (b) forming an upper layer film on the actinic ray-sensitive or radiation-sensitive film using a composition for forming an upper layer film; (c) exposing the actinic ray-sensitive or radiation-sensitive film having the upper layer film formed thereon; and (d) developing the exposed actinic ray-sensitive or radiation-sensitive film using a developer, wherein the composition for forming an upper layer film includes a solvent and a crosslinking agent; wherein the content of a solvent having a hydroxyl group is 80% by mass or less with respect to all the solvents included in the composition for forming an upper layer film, and wherein the developer includes at least one solvent selected from the group consisting of an ester-based solvent, a ketone-based solvent, an ether-based solvent, and a hydrocarbon-based solvent. 2. The pattern forming method according to claim 1 , wherein the crosslinking agent is a crosslinking agent having two or more methylol groups, a crosslinking agent having two or more alkoxymethyl groups, or a crosslinking agent having one or more methylol groups and one or more alkoxymethyl groups. 3. The pattern forming method according to claim 1 , wherein the content of the crosslinking agent is 5% by mass or more with respect to the total solid content of the composition for forming an upper layer film. 4. The pattern forming method according to claim 1 , wherein the composition for forming an upper layer film includes a resin containing a repeating unit having an aromatic ring. 5. The pattern forming method according to claim 1 , wherein the developer is an alkali developer. 6. The pattern forming method according to claim 1 , wherein the exposure is carried out using electron beams or extreme ultraviolet rays. 7. The pattern forming method according to claim 1 , further comprising (e) rinsing the developed actinic ray-sensitive or radiation-sensitive film using a rinsing liquid after the step (d). 8. The pattern forming method according to claim 1 , wherein the solvent contains a non-fluorinated alcohol. 9. The pattern forming method according to claim 1 , wherein the crosslinking agent includes at least one compound selected from the group consisting of the following compounds and a compound represented by General Formula (CI), in the formulae, L 1 to L 8 each independently represent a hydrogen atom, a hydroxymethyl group, a methoxymethyl group, an ethoxymethyl group, or an alkyl group having 1 to 6 carbon atoms, and in General Formula (CI), R 1 and R 6 each independently represent a hydrogen atom or a hydrocarbon group having 5 or less carbon atoms, R 2 and R 5 each independently represent an alkyl group, a cycloalkyl group, an aryl group, or an acyl group, and R 3 and R 4 each independently represent a hydrogen atom, or an organic group having 2 or more carbon atoms, R 3 and R 4 may be bonded to each other to form a ring. 10. A method for manufacturing an electronic device, comprising the pattern forming method according to claim 1 . 11. A laminate comprising: an actinic ray-sensitive or radiation-sensitive film; and an upper layer film including a crosslinking agent, wherein the crosslinking agent includes at least one compound selected from the group consisting of the following compounds and a compound represented by General Formula (CI), in the formulae, L 1 to L 8 each independently represent a hydrogen atom, a hydroxymethyl group, a methoxymethyl group, an ethoxymethyl group, or an alkyl group having 1 to 6 carbon atoms, and in General Formula (CI), R 1 and R 6 each independently represent a hydrogen atom or a hydrocarbon group having 5 or less carbon atoms, R 2 and R 5 each independently represent an alkyl group, a cycloalkyl group, an aryl group, or an acyl group, and R 3 and R 4 each independently represent a hydrogen atom, or an organic group having 2 or more carbon atoms, R 3 and R 4 may be bonded to each other to form a ring.
Aqueous alkaline compositions · CPC title
Macromolecular compounds which are rendered insoluble or differentially wettable (G03F7/075 takes precedence; macromolecular azides G03F7/012; macromolecular diazonium compounds G03F7/021) · CPC title
Exposure; Apparatus therefor (photographic printing apparatus for making copies G03B27/00) · CPC title
Treatment after imagewise removal, e.g. baking · CPC title
having cover layers or intermediate layers, e.g. subbing layers {(G03F7/091 - G03F7/093, B41N3/03 take precedence)} · CPC title
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