Forging method
US-9555505-B2 · Jan 31, 2017 · US
US10658262B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10658262-B2 |
| Application number | US-201816206269-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 30, 2018 |
| Priority date | Feb 27, 2018 |
| Publication date | May 19, 2020 |
| Grant date | May 19, 2020 |
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Interconnection systems and methods are provided. An interconnector as disclosed allows for a first component having a first coefficient of thermal expansion to be joined to a second component having a second coefficient of thermal expansion securely, and while maintaining a precise alignment between the components. The interconnector generally includes a plurality of pins that each have a free end that is adhered to the first component for imaging, sensing, tracking, processing, and other applications.
Opening claim text (preview).
What is claimed is: 1. An interconnector comprising: a base; a pin array including a plurality of pins; and a base pedestal, wherein the base pedestal is formed on the base, wherein the pins extend from the base pedestal, wherein a surface of the base pedestal is non-planar, wherein at least some of the pins in the plurality of pins include a free end at a first distance from a surface of the base that defines a base reference plane, wherein each of the plurality of pins are spaced apart from one another, and wherein a pin near a center of the pin array has length to width ratio that is less than a length to width ratio of a pin proximal to an edge of the pin array. 2. The interconnector of claim 1 , wherein at least three of the plurality of pins each have a free end that is a second distance from the surface of the base that defines the base reference plane, and wherein the second distance is greater than the first distance. 3. The interconnector of claim 2 , wherein a length of each of the at least three pins, measured from surface of the base that defines the base reference plane to the free end of the at least three pins, is the same. 4. The interconnector of claim 3 , wherein a length of each of the remainder of the pins, measured from the surface of the base that defines the base reference plane to the free end of the remainder of the pins, is the same. 5. The interconnector of claim 1 , wherein a length of any of the pins is measured from the surface of the base that defines the base reference plane to a free end of the respective pin, wherein a length of at least a first pin located proximal to a center of the pin array is less than a length of at least a second pin that, relative to the first pin, is located proximal to an edge of the pin array. 6. The interconnector of claim 1 , wherein the surface of the base pedestal is curved. 7. The interconnector of claim 1 , wherein the base and the pins are formed from a single piece of thermally conductive material. 8. The interconnector of claim 1 , wherein side surfaces of at least some of the pins are parallel to one another. 9. A method of manufacturing a detector assembly, the method comprising: forming an interconnector comprising a base, providing a pin array on the base, wherein providing the pin array comprises forming a plurality of pins by making a plurality of cuts in a first direction and a plurality of cuts in a second direction; wherein at least some of the plurality of pins comprise a free end on an opposing end of the pin relative to the base; wherein each of the plurality of pins are spaced apart from an adjacent pin; providing a detector assembly comprising an optical sub-assembly and at least one of a Complementary Metal Oxide Semiconductor device and a Charged Coupled device; providing an adhesive or joining material, wherein the adhesive is in contact with a free end of at least some of the pins; and securing at least a portion of the detector assembly to the pin array via the adhesive. 10. The method of claim 9 , further comprising a step of forming a capillary stop in at least one of the plurality of pins. 11. The method of claim 9 , wherein the first direction and the second direction are orthogonal to one another. 12. The method of claim 9 , wherein the plurality of pins comprises a first set of pins, wherein the free end of each of the pins in the first set of pins is a first distance from a plane of the base; and a second set of pins, wherein the free end of each of the pins in the second set of pins is a second distance from a plane of the base. 13. The method of claim 9 , wherein at least some of the pins comprise a rectilinear cross section. 14. The method of claim 9 , wherein the base and the pins are formed from a single piece of thermally conductive material.
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