Sample testing methods with automated cleaning

Patent metadata

Field	Value
Publication number	US-10656077-B2
Application number	US-201715709200-A
Country	US
Kind code	B2
Filing date	Sep 19, 2017
Priority date	Apr 9, 2015
Publication date	May 19, 2020
Grant date	May 19, 2020

Abstract

A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member.

First claim

The invention claimed is:

1. A method of operating a sample testing system, the system comprising a test receptacle support structure and an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, the method comprising using an automated transport arm to:
detachably couple a cleaning member to a working end of the transport arm, wherein the cleaning member comprises a proximal coupling element and a distal cleaning element;
move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, such that the cleaning element thereby cleans and/or sterilizes the optical element; and
decouple the cleaning member from the working end of the transport arm.

2. The method of claim 1 , wherein the system comprises a cleaning member holder having a plurality of cleaning member receptacles, wherein the cleaning member is one of a plurality of cleaning members held in respective cleaning member receptacles of the cleaning member holder, and wherein the automated transport arm detachably couples the cleaning member while the cleaning member is held in the respective cleaning member receptacle.

3. The method of claim 1 , wherein the automated arm detachably couples the cleaning member to the working end portion of the transport arm by:
detachably coupling a proximal end portion of the coupling element to the working end of the transport arm, and
inserting a distal end connector of the coupling element into a recessed proximal portion of the cleaning element to thereby attach the cleaning element to the coupling element.

4. The method of claim 3 , wherein the distal end connector of the coupling element forms an interference fit with the proximal recessed portion of the cleaning element.

5. The method of claim 3 , wherein the distal end connector of the coupling element forms a frictional fit with the proximal recessed portion of the cleaning element.

6. The method of claim 3 , wherein the system comprises a cleaning element holder having a plurality of cleaning element receptacles, wherein the cleaning element is one of a plurality of cleaning elements held in respective cleaning element receptacles of the cleaning element holder.

7. The method of claim 6 , wherein the cleaning element is substantially environmentally sealed in the respective cleaning element receptacle by a frangible sealing member that is pierced when the distal end connector of the coupling element is inserted into the recessed proximal portion of the cleaning element.

8. The method of claim 6 , wherein the automated transport arm inserts the distal end connector of the coupling element into the recessed proximal portion of the cleaning element while the cleaning element is held in the respective cleaning element receptacle.

9. The method of claim 1 , further comprising using the automated transport arm to move the detachably-coupled cleaning member into a position such that the cleaning element is inserted into a test receptacle well of the test receptacle support structure, wherein the cleaning element is dimensioned such that an outer surface of the cleaning element conforms to an interior surface of the test receptacle well.

10. The method of claim 9 , wherein the cleaning element cleans, decontaminates and/or sterilizes the interior surface of the test receptacle well when inserted therein.

11. The method of claim 9 , wherein the test receptacle well has an open bottom, and the optical element comprising an optical fiber having an end positioned proximate to the open bottom of the test receptacle well, and wherein the cleaning element cleans, decontaminates and/or sterilizes the end of the optical fiber when inserted into the test receptacle well.

12. The method of claim 9 , wherein the detachably-coupled cleaning member comprises a first cleaning member, and wherein the cleaning element of the first cleaning member comprises a first cleaning element, the method further comprising, after decoupling the first cleaning member from the working end of the automated transport arm, using the automated transport arm to:
detachably couple a second cleaning member to the working end of the automated transport arm, the second cleaning member comprising a second cleaning element; and
move the detachably-coupled second cleaning member into a position such that the second cleaning element is inserted into the same test receptacle well of the test receptacle support structure.

13. The method of claim 12 , wherein the first cleaning element is made of a different material than the second cleaning element.

14. The method of claim 1 , wherein the cleaning element comprises an adhesive material.

15. The method of claim 1 , wherein the cleaning element comprises a material that generates a static attraction to particulates and/or other materials that can interfere with the transmission by the optical element of electromagnetic radiation emitted or reflected by the sample.

16. The method of claim 1 , wherein the cleaning element comprises an absorbent material capable of retaining a fluid substance.

17. The method of claim 1 , wherein the system comprises a controller that controls operation of the automated transport arm for causing the automated transport arm to detachably couple with a respective cleaning member, and to move the respective detachably-coupled cleaning member into a position proximate to and/or contacting the optical element based upon one or both of a (i) predetermined cleaning schedule, and (ii) sensed presence of particulates and/or other materials disposed on or over the optical element.

18. The method of claim 17 , wherein the controller causes the automated transport arm to deposit respective decoupled cleaning members into a system waste output or a designated used cleaning member holder.

Assignees

• Gen Probe Inc

Inventors

• Hagen Norbert D
• Knight Byron J
• Opalsky David

Classifications

• G01N21/15 Primary

  Preventing contamination of the components of the optical system or obstruction of the light path · CPC title

• G01N2021/152

  Scraping; Brushing; Moving band · CPC title

• B08B9/00

  Cleaning hollow articles by methods or apparatus specially adapted thereto · CPC title

• G01N35/04 Primary

  Details of the conveyor system {(G01N35/021 - G01N35/028 take precedence)} · CPC title

• G02B6/3866

  Devices, tools or methods for cleaning connectors (cleaning in general B08B) · CPC title