Sample testing systems and methods with automated cleaning

Patent metadata

Field	Value
Publication number	US-9810622-B2
Application number	US-201615094227-A
Country	US
Kind code	B2
Filing date	Apr 8, 2016
Priority date	Apr 9, 2015
Publication date	Nov 7, 2017
Grant date	Nov 7, 2017

Abstract

A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member.

First claim

The invention claimed is:

1. A sample testing system, comprising:
a test receptacle support structure;
an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure;
a cleaning member; and
an automated transport arm configured to
detachably couple the cleaning member,
move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and
decouple the cleaning member.

2. The sample testing system of claim 1 , wherein the automated transport arm is configured to deposit the decoupled cleaning member into a waste output.

3. The sample testing system of claim 1 , wherein the automated transport arm comprises an articulating arm.

4. The sample testing system of claim 1 , wherein the cleaning member comprises a proximal coupling element joined to a distal cleaning element, the coupling element having a proximal end portion configured to releasably mate with a distal working end portion of the automated transport arm.

5. The sample testing system of claim 4 , wherein the coupling element and the cleaning element are separately molded components.

6. The sample testing system of claim 5 , wherein a distal portion of the coupling element forms an interference fit with a proximal portion of the cleaning element.

7. The sample testing system of claim 5 , wherein a distal portion of the coupling element forms a frictional fit with a proximal portion of the cleaning element.

8. The sample testing system of claim 4 , wherein the coupling element and the cleaning element are co-molded as a single component.

9. The sample testing system of claim 4 , wherein the automated transport arm is configured to move the detachably-coupled cleaning member into a position such that the cleaning element is inserted into a test receptacle well of the test receptacle support structure, and wherein the cleaning element is dimensioned such that an outer surface of the cleaning element conforms to an interior surface of the test receptacle well.

10. The sample testing system of claim 9 , wherein the outer surface of the cleaning element and the interior surface of the test receptacle well have complementary frustoconical shapes.

11. The sample testing system of claim 9 , wherein the cleaning element cleans, decontaminates and/or sterilizes the interior surface of the test receptacle well when inserted therein.

12. The sample testing system of claim 4 , wherein:
the test receptacle well has an open bottom;
the optical element comprises an optical fiber having an end positioned proximate to the open bottom of the test receptacle well; and
the cleaning element cleans, decontaminates and/or sterilizes the end of the optical fiber when inserted into the test receptacle well.

13. The sample testing system of claim 4 , wherein the cleaning element comprises an adhesive material.

14. The sample testing system of claim 13 , wherein the adhesive material is selected from the group consisting of silicone, platinum cured silicone, thermoplastic polyurethane, thermoplastic elastomer, thermoplastic rubber, and a gel.

15. The sample testing system of claim 4 , wherein the cleaning element comprises a material that generates a static attraction to particulates and/or other materials that can interfere with the transmission by the optical element of electromagnetic radiation emitted or reflected by the sample.

16. The sample testing system of claim 15 , wherein the material that generates a static attraction is selected from the group consisting of silicon, polyvinyl chloride, polypropylene, polyethylene, polyurethane, polyester and polystyrene.

17. The sample testing system of claim 4 , wherein the cleaning element comprises an absorbent material capable of retaining a fluid substance.

18. The sample testing system of claim 17 , wherein the cleaning element retains the fluid substance, and wherein the fluid substance is selected from the group comprising isopropyl alcohol, ethyl alcohol, diluted hydrochloric acid, oxalic acid, diluted sodium hydroxide and diluted sodium hypochlorite.

19. The sample testing system of claim 1 , further comprising a controller that controls operation of the automated transport arm for causing the automated transport arm to detachably couple with the cleaning member, and to move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element based upon one or both of a (i) predetermined cleaning schedule, and (ii) sensed presence of particulates and/or other materials disposed on or over the optical element.

20. The sample testing system of claim 1 , further comprising one or more cleaning member holders, the cleaning member being one of a plurality of cleaning members, each of the cleaning members being held in a respective one of the one or more cleaning member holders.

21. The sample testing system of claim 20 , wherein the automated transport arm is configured to selectively deposit the decoupled cleaning member into the same or a different cleaning member holder from which the decoupled cleaning member was removed.

22. A sample testing system, comprising:
one or more test receptacle holders, each test receptacle holder comprising a plurality of test receptacle wells, each test receptacle well having an open bottom end and configured to have a test receptacle seated therein;
a plurality of optical fibers arranged with respect to the one or more test receptacle holders, such that an end of a respective optical fiber is positioned proximate to the open bottom end of each test receptacle well to allow for transmission of electromagnetic radiation emitted or reflected by a sample contained in a test receptacle seated in the test receptacle well;
a cleaning member holder comprising a plurality of cleaning member wells, each of a plurality of the cleaning member wells configured for having a cleaning member seated therein; and
an automated transport arm configured to
detachably couple a cleaning member located in one of the cleaning member wells,
remove the detachably-coupled cleaning member from the respective cleaning member well,
insert a distal portion of the detachably-coupled cleaning member into one of the test receptacle wells, such that a distal end of the cleaning member is positioned proximate to or contacting the end of the optical fiber positioned proximate to the open bottom end of the respective test receptacle well,
remove the detachably-coupled cleaning member from the respective test receptacle, and
decouple the cleaning member.

23. A cleaning member for use in a sample testing system, comprising:
a proximal coupling element; and
a distal cleaning element, the coupling element having a proximal end portion configured to releasably mate with an automated transport arm.

24. A method of operating a sample testing system, the system comprising a test receptacle support structure and an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, the method comprising using an automated transport arm to:
detachably couple a cleaning member to a working end of the transport arm;
move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, such t

Assignees

• Gen Probe Inc

Inventors

• Hagen Norbert D
• Knight Byron J
• Opalsky David

Classifications

• G01N2035/0429

  Sample carriers adapted for special purposes · CPC title

• B08B9/00

  Cleaning hollow articles by methods or apparatus specially adapted thereto · CPC title

• G02B6/3866

  Devices, tools or methods for cleaning connectors (cleaning in general B08B) · CPC title

• G01N35/0092

  Scheduling · CPC title

• B08B2240/02

  Optical fibers or optical fiber connectors · CPC title