Infrared microscope with adjustable connection optical system

Patent metadata

Field	Value
Publication number	US-10641659-B2
Application number	US-201816103238-A
Country	US
Kind code	B2
Filing date	Aug 14, 2018
Priority date	Aug 14, 2018
Publication date	May 5, 2020
Grant date	May 5, 2020

Abstract

An infrared microscope includes an illumination optical system which guides infrared red to an analysis position on a sample; a connection optical system which guides infrared light, supplied from an infrared spectrophotometer, to said illumination optical system; a visible light source unit which outputs visible light to a region including said analysis position on the sample; an image acquisition unit which inputs visible light from the region including said analysis position on the sample to a detection surface and acquires a visible light image; and a detection unit which detects infrared light from said analysis position on the sample. The connection optical system can be positionally adjusted, and said image acquisition unit is capable of acquiring an infrared light image by inputting infrared light to a detection surface.

First claim

What is claimed is:

1. An infrared microscope system, comprising:
an infrared microscope comprising:
an illumination optical system which guides infrared light to an analysis position on a sample;
a connection optical system which guides infrared light, supplied from an infrared spectrophotometer, to said illumination optical system;
a visible light source unit which outputs visible light to a region including said analysis position on the sample;
an image acquisition unit which inputs visible light from the region including said analysis position on the sample to a detection surface and acquires a visible light image; and
a detection unit which detects infrared light from said analysis position on the sample; and

the infrared spectrophotometer, wherein
said connection optical system is configured to be positionally adjusted, and
said image acquisition unit is configured to acquire an infrared light image by inputting infrared light to a detection surface.

2. The infrared microscope system as set forth in claim 1 , wherein said connection optical system comprises a first plane mirror, a second plane mirror, and an adjustment mechanism which rotationally moves said first plane mirror.

3. The infrared microscope system as set forth in claim 1 , wherein said visible light source unit is a white LED.

4. The infrared microscope system as set forth in claim 1 , wherein said infrared spectrophotometer comprises an infrared light source which outputs infrared light, and a Jacquinot stop arranged in front of said infrared light source.

5. The infrared microscope system as set forth in claim 1 , further comprising a control unit which controls said infrared microscope and said infrared spectrophotometer, wherein said control unit controls said connection optical system based on said infrared light image.

6. The infrared microscope system as set forth in claim 4 , wherein said infrared light image, that said image acquisition unit is configured to acquire, includes an image of an aperture of said Jacquinot stop.

7. The infrared microscope system as set forth in claim 1 , wherein said image acquisition unit is configured to acquire an infrared light image by inputting infrared light to a detection surface of a camera of said image acquisition unit.

Assignees

• Shimadzu Corp

Inventors

• Ueda Atsushi

Classifications

• G01J3/0237

  Adjustable, e.g. focussing · CPC title

• G01J3/0289

  Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking · CPC title

• G01N2021/3595

  using FTIR · CPC title

• G01J2003/4534

  Interferometer on illuminating side · CPC title

• G01J3/2889

  Rapid scan spectrometers; Time resolved spectrometry · CPC title