High-speed and low-power pipelined ADC using dynamic reference voltage and 2-stage sample-and-hold
US-10411722-B2 · Sep 10, 2019 · US
US10608657B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10608657-B2 |
| Application number | US-201616330105-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 28, 2016 |
| Priority date | Oct 28, 2016 |
| Publication date | Mar 31, 2020 |
| Grant date | Mar 31, 2020 |
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An AD conversion apparatus includes an AD conversion unit; a reference voltage switching unit that is disposed between an output of a sensor and an analog input terminal of the AD conversion unit and is connectable to the output of the sensor and a plurality of reference voltage lines; and a control unit to control switching the reference voltage input to the AD conversion unit by connecting the reference voltage switching unit to one of the reference voltage lines and to the output of the sensor. An analog output value of the sensor is input to the analog input terminal of the AD conversion unit via the reference voltage switching unit and is converted into a digital value.
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The invention claimed is: 1. An analog-to-digital conversion apparatus comprising: an analog-to-digital converter; a reference voltage switch disposed between an output of a sensor and an analog input terminal of the analog-to-digital converter and connectable to an output of the sensor and a plurality of reference voltage lines; and control circuitry to control switching a reference voltage input to the analog-to-digital converter by connecting the reference voltage switch to one of the reference voltage lines and to the output of the sensor, wherein an analog output value of the sensor is input to the analog input terminal of the analog-to-digital converter via the reference voltage switch and is converted into a digital value, and an output of the analog-to-digital converter is multiplied by a gain and is output. 2. The analog-to-digital conversion apparatus according to claim 1 , wherein the sensor has a characteristic that sensitivity varies depending on a usage environment, and the reference voltage switch is set such that the reference voltage is switched depending on the sensitivity of the sensor. 3. An analog-to-digital conversion apparatus comprising: an analog-to-digital converter; a reference voltage switch disposed between an output of a sensor and an analog input terminal of the analog-to-digital converter and connectable to an output of the sensor and a plurality of reference voltage lines; and control circuitry to control switching a reference voltage input to the analog-to-digital converter by connecting the reference voltage switch to one of the reference voltage lines and to the output of the sensor, wherein an analog output value of the sensor is input to the analog input terminal of the analog-to-digital converter via the reference voltage switch and is converted into a digital value, the analog-to-digital conversion apparatus further comprising constant voltage generation circuitry, wherein the reference voltage lines include a first reference voltage line, which has a first reference voltage, and a second reference voltage line, which has a second reference voltage higher than the first reference voltage. 4. The analog-to-digital conversion apparatus according to claim 3 , wherein the first reference voltage line is a ground line, and the second reference voltage line is connected to an output of the constant voltage generation circuitry. 5. The analog-to-digital conversion apparatus according to claim 1 , further comprising: constant voltage generation circuitry, wherein: an output value of the constant voltage generation circuitry is a full scale upper limit value, and a switching point at which the reference voltage is switched is set to a percentage of the full scale upper limit value. 6. The analog-to-digital conversion apparatus according to claim 5 , wherein a first analog-to-digital conversion result, which is output from the analog-to-digital converter connected to the output of the sensor and the first reference voltage line, and a second analog-to-digital conversion result, which is output from the analog-to-digital converter connected to the output of the sensor and the second reference voltage line, are calculated, and the first analog-to-digital conversion result or the second analog-to-digital conversion result is output as a percentage of the full scale upper limit value. 7. The analog-to-digital conversion apparatus according to claim 5 , wherein a first analog-to-digital conversion result, which is output from the analog-to-digital converter connected to the output of the sensor and the first reference voltage line, and a second analog-to-digital conversion result, which is output from the analog-to-digital converter connected to the output of the sensor and the second reference voltage line, are calculated, and the first analog-to-digital conversion result and the second analog-to-digital conversion result are computed and a conversion result is output. 8. An analog-to-digital conversion method to convert an analog output value from a sensor into a digital value and compare the converted digital value with a first reference voltage or a second reference voltage, the analog-to-digital conversion method comprising: determining whether the analog output value from the sensor is equal to or greater than a preset reference voltage switching threshold value; converting the analog output value into a digital value using the first reference voltage as a reference voltage when the analog output value is not equal to or greater than the reference voltage switching threshold value; and converting the analog output value into a digital value using the second reference voltage, which is higher than the first reference voltage, as a reference voltage when the analog output value is equal to or greater than the reference voltage switching threshold value. 9. The analog-to-digital conversion method according to claim 8 , further comprising: setting the reference voltage switching threshold value based on a sensitivity characteristic of the sensor that varies depending on a usage environment. 10. The analog-to-digital conversion method according to claim 8 , wherein the first reference voltage line is a ground line. 11. The analog-to-digital conversion apparatus according to claim 1 , wherein the reference voltage switch is set such that the reference voltage is switched depending on an output of the sensor and a predetermined reference voltage switching threshold. 12. The analog-to-digital conversion apparatus according to claim 9 , further comprising: a memory circuit configured to store the predetermined reference voltage switching threshold.
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