Systems and methods for optimizing amplifier operations

Patent metadata

Field	Value
Publication number	US-10601377-B2
Application number	US-201816166020-A
Country	US
Kind code	B2
Filing date	Oct 19, 2018
Priority date	Mar 14, 2013
Publication date	Mar 24, 2020
Grant date	Mar 24, 2020

Abstract

Methods and systems for optimizing amplifier operations are described. The described methods and systems particularly describe a feed-forward control circuit that may also be used as a feed-back control circuit in certain applications. The feed-forward control circuit provides a control signal that may be used to configure an amplifier in a variety of ways.

First claim

What is claimed is:

1. A system for optimizing amplifier operations, including:
(a) a scalable periphery amplifier configured to receive a radio frequency input signal, the scalable periphery amplifier including a plurality of selectable unit cells for providing an adjustable amount of gain to the input signal by applying the input signal to a selection of one or more of the plurality of selectable unit cells; and
(b) a feed-forward control circuit, coupled to the scalable periphery amplifier and to the input signal, configured to receive the input signal and generate a control signal that is derived from at least one characteristic of the input signal and which is provided to the scalable periphery amplifier for adjusting the amount of gain of the scalable periphery amplifier.

2. The system of claim 1 , wherein the at least one characteristic of the input signal includes an amplitude of the input signal, and wherein adjusting the amount of gain includes applying the control signal to the scalable periphery amplifier to enable or disable selected ones of the one or more plurality of unit cells of the scalable periphery amplifier and/or to modify a bias point in the scalable periphery amplifier.

3. A system for optimizing amplifier operations, including:
(a) an amplifier configured to receive an input signal and a control signal, and generate an output signal in response to the input signal and the control signal, the output signal having a desired characteristic that includes at least one of a power level, amplifier gain, a voltage range, or a current level;
(b) a temperature probe placed at a monitoring point in the amplifier and configured to output a data representing a temperature;
(c) a measurement circuit coupled to the temperature probe and including at least a temperature detector configured to measure a temperature based on the temperature probe output data and to output a derived data signal as a function of such temperature measurement; and
(d) a feed-forward control circuit including a look-up table, the feed-forward control circuit coupled to the amplifier, to the input signal, and to the measurement circuit, the feed-forward control circuit configured to receive the derived data signal and to receive and analyze the input signal, apply the analyzed input signal and the derived data signal to the look-up table to generate the control signal, and provide the control signal to the amplifier to modify at least one operating characteristic of the amplifier as a function of at least temperature, thereby altering the desired characteristic of the output signal.

4. The system of claim 3 , further including a configurable load matching block, coupled to the feed-forward control circuit, for modifying at least one of amplifier gain, amplifier phase, and/or amplifier compression points as a function of the control signal.

5. A system for optimizing amplifier operations, including:
(a) an amplifier configured to receive an input signal and a control signal, and generate an output signal in response to the input signal and the control signal, the output signal having a desired characteristic that includes at least one of a power level, amplifier gain, a voltage range, or a current level;
(b) a measurement circuit including at least one detector or analyzer configured to measure a selected characteristic of at least one data or monitored signal input and to output a derived data signal as a function of such measurement; and
(c) a feed-forward control circuit including a look-up table, the feed-forward control circuit coupled to the amplifier, to the input signal, and to the measurement circuit, the feed-forward control circuit configured to receive the derived data signal and to receive and analyze the input signal, apply the analyzed input signal and the derived data signal to the look-up table to generate the control signal, and provide the control signal to the amplifier to modify at least one operating characteristic of the amplifier, thereby altering the desired characteristic of the output signal.

6. The system of claim 5 , wherein the measurement circuit includes at least a power level detector configured to measure a power level represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

7. The system of claim 5 , wherein the measurement circuit includes at least a frequency detector configured to measure a frequency represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

8. The system of claim 5 , wherein the measurement circuit includes at least a voltage level detector configured to measure a voltage represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

9. The system of claim 5 , wherein the measurement circuit includes at least a temperature detector configured to measure a temperature represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

10. The system of claim 5 , wherein the measurement circuit includes at least a bandwidth detector configured to measure a bandwidth represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

11. The system of claim 5 , wherein the measurement circuit includes at least a spectral analyzer configured to measure spectral data represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

12. The system of claim 5 , wherein the measurement circuit includes at least a Voltage Standing Wave Ratio (VSWR) detector configured to measure a VSWR represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

13. The system of claim 5 , wherein the measurement circuit includes at least a load mismatch detector configured to measure a load mismatch represented by the at least one data or monitored signal input and to output the derived data signal as a function of such measurement.

14. The system of claim 5 , wherein the measurement circuit includes at least a circuit element detector configured to measure at least one parameter of a circuit component, where such at least one parameter is represented by the at least one data or monitored signal input, and to output the derived data signal as a function of such measurement.

15. The system of claim 5 , wherein the at least one data or monitored signal input includes signals or data representing one or more of: an output power level from the amplifier, temperature data, power supply data, battery data, biasing data, signal level data, voltage level data, frequency data, power level data, logic level conditions, switch position data, physical location data, mode of operation of the amplifier, a modulation format of the output signal, and/or load mismatch data.

16. The system of claim 5 , wherein the amplifier includes a signal modification block, and wherein the control signal configures the signal modification block.

17. The system of claim 16 , wherein the signal modification block includes one or more of: a gain stage block, an attenuator block, a bias adjustment block, a power supply control block, a signal delay block, or a path modifier block, wherein at least one included block has one or more parameters alterable by the control signal input to reconfigure the signal

Assignees

• Psemi Corp

Inventors

• Nobbe Dan William
• Halchin David

Classifications

• H03F2200/468

  the temperature being sensed · CPC title

• H03F1/0205

  in transistor amplifiers · CPC title

• H03F3/193

  with field-effect devices (H03F3/195 takes precedence) · CPC title

• H03G3/3036

  in high-frequency amplifiers or in frequency-changers (H03G3/3052, H03G3/32, H03G3/34 take precedence) · CPC title

• H03F1/30

  Modifications of amplifiers to reduce influence of variations of temperature or supply voltage {or other physical parameters (in differential amplifiers H03F3/45479)} · CPC title