Increased spatial resolution for photon-counting edge-on x-ray detectors

Patent metadata

Field	Value
Publication number	US-10575800-B2
Application number	US-201715453315-A
Country	US
Kind code	B2
Filing date	Mar 8, 2017
Priority date	Mar 8, 2017
Publication date	Mar 3, 2020
Grant date	Mar 3, 2020

Abstract

There is provided a method and an arrangement for determining a position of interaction of a photon in an individual detector diode of a photon-counting x-ray detector. The method includes determining the position of interaction in the detector diode based on pulse characteristics of a pulse generated by the individual detector diode in response to the photon interaction.

First claim

The invention claimed is:

1. A method for determining a position of interaction of a photon in an individual detector diode of a photon-counting edge-on x-ray detector having detector diodes extending in the depth direction of the photon-counting edge-on x-ray detector, assuming an x-ray enters through an edge of the photon-counting edge-on x-ray detector, each individual detector diode of the detector diodes having a thickness, in a direction substantially perpendicular to the depth direction, corresponding to a width of the individual detector diode, the method comprising:
determining the position of interaction in the line of thickness of the individual detector diode by identifying, in which one sub-region of at least two different sub-regions of the individual detector diode, photon interaction occurred, based on pulse characteristics of a pulse generated by the individual detector diode in response to the photon interaction,
wherein the at least two different sub-regions are located in different width sections of the individual detector diode, and the width sections are located between an anode and a cathode of the detector diode.

2. The method of claim 1 , wherein the position of interaction is determined by performing signal processing of the pulse based on at least one matched filter.

3. The method of claim 1 , wherein the determining the position of interaction in the individual detector diode comprises:
performing signal processing of the pulse by applying at least one matched filter configured for a specific pulse type corresponding to a specific position or sub-region of photon interaction in the individual detector diode to generate a filtered output signal of the at least one matched filter, and
identifying whether the pulse matches the pulse type based on the filtered output signal of said at least one matched filter to decide whether the position of interaction corresponds to the specific position or sub-region of the specific pulse type for which said at least one matched filter is configured.

4. The method of claim 1 , wherein the position of interaction is determined by performing signal processing of the pulse based on at least two matched filters that are configured to mimic characteristic responses for different positions or sub-regions of photon interaction in the individual detector diode.

5. The method of claim 1 , wherein the determining the position of interaction in the individual detector diode comprises:
performing signal processing of the pulse by applying at least two matched filters configured for different pulse types corresponding to different positions or sub-regions of photon interaction in the individual detector diode to generate filtered output signals of the matched filters, and
identifying the position of interaction in the individual detector diode based on the filtered output signals of the matched filters.

6. The method of claim 1 , wherein the at least two different regions comprise a front side or a front section and a back side or a back section of the individual detector diode.

7. The method of claim 1 , wherein the at least two different regions comprise a front side or a front section, a mid-section, and a back side or a back section of the individual detector diode.

8. The method of claim 1 , wherein the position of interaction is estimated from the pulse characteristics of the pulse generated at the cathode or the anode of the individual detector diode.

9. The method of claim 1 , wherein the position of interaction in the individual detector diode is determined based on pulse amplitude, pulse width, and/or pulse timing.

10. A system configured to determine a position of interaction of a photon in an individual detector diode of a photon-counting edge-on x-ray detector having detector diodes extending in the depth direction of the photon-counting edge-on x-ray detector, assuming an x-ray enters through an edge of the photon-counting edge-on x-ray detector, each individual detector diode of the detector diodes having a thickness, in a direction substantially perpendicular to the depth direction, corresponding to a width of the individual detector diode, the system comprising:
one or more processors configured to determine the position of interaction in the line of the thickness of the individual detector diode by identifying, in which one sub-region of at least two different sub-regions of the individual detector diode, photon interaction occurred, based on pulse characteristics of a pulse generated by the individual detector diode in response to the photon interaction,
wherein the at least two different sub-regions are located in different width sections of the individual detector diode, and the width sections are located between an anode and a cathode of the detector diode.

11. The system of claim 10 , wherein the one or more processors is configured to perform signal processing of the pulse based on at least one matched filter to determine the position of interaction.

12. The system of claim 10 , wherein the one or more processors is configured to perform signal processing of the pulse by applying at least one matched filter configured for a specific pulse type corresponding to a specific position or sub-region of photon interaction in the individual detector diode to generate a filtered output signal of the at least one matched filter, and identify whether the pulse matches the pulse type based on the filtered output signal of said at least one matched filter to decide whether the position of interaction corresponds to the specific position or sub-region of the specific pulse type for which said at least one matched filter is configured.

13. The system of claim 10 , wherein the one or more processors is configured to perform signal processing of the pulse based on at least two matched filters that are configured to mimic characteristic responses for different positions or sub-regions of photon interaction in the individual detector diode.

14. The system of claim 10 , wherein the one or more processors is configured to perform signal processing of the pulse by applying at least two matched filters adapted for different pulse types corresponding to different positions or sub-regions of photon interaction in the individual detector diode to generate filtered output signals of the matched filters, and identify the position of interaction in the individual detector diode based on the filtered output signals of the matched filters.

15. The system of claim 10 , wherein the at least two different regions comprises a front side or front section and a back side or back section of the diode.

16. The system of claim 10 , wherein the at least two different regions comprise a front side or front section, a mid-section, and a back side or a back section of the individual detector diode.

17. The system of claim 10 , wherein the one or more processors is configured to determine the position of interaction from the pulse characteristics of the pulse generated at the cathode or the anode of the individual detector diode.

18. The system of claim 10 , wherein the one or more processors is configured to determine the position of interaction in the individual detector diode based on pulse amplitude, pulse width, and/or pulse timing.

19. An x-ray detector system comprising:
the system of claim 10 .

20. An x-ray imaging system comprising:
the system of claim 10 .

Assignees

• Prismatic Sensors Ab

Inventors

• Danielsson Mats
• Wikner Jacob J

Classifications

• A61B6/482

  involving multiple energy imaging · CPC title

• A61B6/502

  for diagnosis of breast, i.e. mammography · CPC title

• G01B15/045

  by measuring absorption · CPC title

• G01T1/24

  with semiconductor detectors · CPC title

• A61B6/4241 Primary

  using energy resolving detectors, e.g. photon counting · CPC title