X-ray imaging based on image data from a photon-counting multi-bin X-ray detector

Patent metadata

Field	Value
Publication number	US-9867580-B2
Application number	US-201415504159-A
Country	US
Kind code	B2
Filing date	Nov 10, 2014
Priority date	Nov 10, 2014
Publication date	Jan 16, 2018
Grant date	Jan 16, 2018

Abstract

There is provided a method and corresponding system and apparatus for image reconstruction based on image data from a photon-counting multi-bin x-ray detector. The method includes determining (S 1 ) parameter(s) of a given functional form of the relationship between comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum. The method also includes performing (S 2 ) image reconstruction based on the image data and the determined parameter(s). In this way, efficient high-quality image reconstruction can be achieved.

First claim

The invention claimed is:

1. A method of image reconstruction based on image data from a photon-counting multi-bin x-ray detector, wherein said method comprises:
determining parameter(s) of a given functional form of the relationship between comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum;
performing image reconstruction based on the image data and the determined parameter(s).

2. The method of claim 1 , wherein the determined parameter(s) is/are used for adjustments in the image reconstruction procedure.

3. The method of claim 1 , wherein the reference pulse height spectrum is expressed in units of energy and the measured pulse height spectrum is expressed in units of voltage.

4. The method of claim 1 , wherein the first set of data representative of a measured pulse height spectrum is based on a measured x-ray spectrum, and the second set of data representative of a reference pulse height spectrum is based on a previously acquired reference x-ray spectrum or a simulated x-ray spectrum.

5. The method of claim 4 , wherein the fitting procedure is performed between a measured accumulated x-ray spectrum and a simulated accumulated x-ray spectrum, taking physical detector characteristics into consideration in the simulation.

6. The method of claim 4 , wherein the fitting procedure is performed between a measured accumulated x-ray spectrum and a previously acquired accumulated x-ray spectrum.

7. The method of claim 4 , wherein the first set of data representative of a measured pulse height spectrum corresponds to a differentiated version of a measured accumulated x-ray spectrum, and the second set of data representative of a reference pulse height spectrum corresponds to a differentiated version of an accumulated reference x-ray spectrum.

8. The method of claim 7 , wherein a measured accumulated x-ray spectrum, and a corresponding accumulated reference x-ray spectrum are differentiated, and the fitting procedure is performed between the differentiated measured accumulated x-ray spectrum and the differentiated reference accumulated x-ray spectrum.

9. The method of claim 8 , wherein the number of measurement points and their setting in voltage are chosen so that the corresponding differentiated x-ray spectrum is a histogram of counts in each detection bin, and the parameter(s) is/are determined based on histogram data for each of a number of channels in the read-out chain of the x-ray detector and corresponding reference histogram data.

10. The method of claim 1 , wherein a broad x-ray spectrum of an x-ray source associated with the imaging modality is used to acquire an accumulated spectrum of counts as a function of comparator voltage, and the first set of data representative of a measured pulse height spectrum is based on the acquired accumulated spectrum of counts.

11. The method of claim 1 , wherein the parameter(s) include an array p i of one or more parameters relating the voltage U i of the measured pulse height spectrum with the energy E i of the reference pulse height spectrum according to U i =f(E i ; p i ), where f is a given function and the subscript i denotes the read-out channel.

12. The method of claim 1 , wherein the parameters include gain g i and offset m i relating the voltage U i of the measured pulse height spectrum with the energy E i of the reference pulse height spectrum according to U i =g i E i +m i , where the subscript i denotes the read-out channel.

13. The method of claim 1 , wherein the fitting procedure is performed for each of a number of channels in the read-out chain of the x-ray detector.

14. An apparatus configured to perform image reconstruction based on image data from a photon-counting multi-bin x-ray detector,
wherein said apparatus is configured to determine parameters of a given functional form of the relationship between assigned comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum, and
wherein said apparatus is configured to perform image reconstruction based on the image data and the determined parameters.

15. The apparatus of claim 14 , wherein said apparatus comprises a processor and a memory, said memory comprising instructions executable by the processor, whereby the processor is operative to determine the parameters and perform the image reconstruction.

16. A computer-program product comprising a computer-readable medium having stored thereon a computer program for use with a photon-counting multi-bin x-ray detector, said computer program comprising instructions, which when executed by at least one processor, cause the at least one processor to:
determine parameters of a given functional form of the relationship between assigned comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum, and
perform image reconstruction based on image data from the x-ray detector and the determined parameters.

17. An apparatus for supporting image reconstruction based on image data from a photon-counting x-ray detector, wherein said apparatus comprises:
a determination module for determining parameters of a given functional form of the relationship between assigned comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum, and
an output module for outputting the determined parameters to an image reconstruction system for enabling adjustments in the image reconstruction procedure based on the determined parameters.

Assignees

• Prismatic Sensors Ab

Inventors

• Danielsson Mats
• Bornefalk Hans
• Liu Xuejin
• Huber Ben
• Chen Han

Classifications

• A61B6/585

  Calibration of detector units · CPC title

• A61B6/583

  using calibration phantoms · CPC title

• G01T1/171

  Compensation of dead-time counting losses · CPC title

• A61B6/5205

  involving processing of raw data to produce diagnostic data · CPC title

• G01T1/24

  with semiconductor detectors · CPC title