RF front-end with power sensor calibration

US10574367B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10574367-B2
Application numberUS-201816174867-A
CountryUS
Kind codeB2
Filing dateOct 30, 2018
Priority dateMay 4, 2015
Publication dateFeb 25, 2020
Grant dateFeb 25, 2020

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  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.

First claim

Opening claim text (preview).

The invention claimed is: 1. A circuit comprising: at least one RF signal path, in a RF transceiver chip, for a RF signal; at least one power sensor coupled to the RF signal path and configured to generate a sensor signal representing power of the RF signal during normal operation of the circuit, the at least one power sensor being included in the RF transceiver chip; an on-chip signal generator configured to generate a RF test signal, the on-chip signal generator being included in the RF transceiver chip; and a circuit node for receiving the RF test signal during calibration operation of the circuit, the circuit node being coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal. 2. The circuit of claim 1 , further comprising: a memory for storing one or more calibration parameters, which are calculated based on the power indicated by the sensor signal and the power of the RF test signal. 3. The circuit of claim 2 , further comprising: a controller unit coupled to the memory and configured to receive the sensor signal and, during normal operation, to correct the sensor signal based on the one or more stored calibration parameters. 4. The circuit of claim 1 , further comprising: at least one directional coupler or power divider to connect the at least one power sensor with a respective signal path of the at least one RF signal path. 5. The circuit of claim 1 , further comprising: a controller unit configured to receive the sensor signal and to calculate at least one calibration parameter based on a power level of the RF signal during normal operation and the sensor signal. 6. The circuit of claim 5 , wherein the controller unit is configured to communicate the at least one calibration parameter. 7. The circuit of claim 1 , wherein the circuit is a monolithic microwave integrated circuit. 8. A method comprising: generating, by at least one power sensor coupled to a RF signal path in a RF transceiver chip, for a RF signal, a sensor signal representing a power of the RF signal during normal operation of a circuit, the at least one power sensor being included in the RF transceiver chip; generating, by an on-chip signal generator included in the RF transceiver chip, a RF test signal; and receiving, by a circuit node included in the circuit, the RF test signal during calibration operation of the circuit, the RF test signal being received additionally or alternatively to the RF signal. 9. The method of claim 8 , further comprising: storing, by a memory, one or more calibration parameters, which are calculated based on the power indicated by the sensor signal and the power of the RF test signal. 10. The method of claim 9 , further comprising: correcting, by a controller unit, the sensor signal based on the one or more stored calibration parameters. 11. The method of claim 8 , further comprising: receiving, by a controller unit, the sensor signal; and calculating, by the controller unit, at least one calibration parameter based on a power level of the RF signal during normal operation and the sensor signal. 12. The method of claim 11 , further comprising: communicating, by the controller unit, the at least one calibration parameter. 13. The method of claim 8 , wherein the circuit is a monolithic microwave integrated circuit.

Assignees

Inventors

Classifications

  • Monitoring during normal operation · CPC title

  • using test signal generators · CPC title

  • Arrangements for measuring electric power or power factor (G01R7/12 takes precedence) · CPC title

  • Power radiated at antenna · CPC title

  • for calibration · CPC title

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Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10574367B2 cover?
One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signa…
Who is the assignee on this patent?
Infineon Technologies Ag
What technology area does this patent fall under?
Primary CPC classification H04B17/0085. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 25 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).