RF front-end with power sensor calibration

Patent metadata

Field	Value
Publication number	US-10128962-B2
Application number	US-201615145485-A
Country	US
Kind code	B2
Filing date	May 3, 2016
Priority date	May 4, 2015
Publication date	Nov 13, 2018
Grant date	Nov 13, 2018

Abstract

One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.

First claim

The invention claimed is:

1. A system comprising:
a monolithic microwave integrated circuit (MMIC) that includes at least one radio frequency (RF) signal path for an RF signal, at least one power sensor coupled to the RF signal path, and a circuit node for receiving an RF test signal,
wherein the at least one power sensor is configured to receive the RF test signal via the circuit node and a needle probe, and
wherein the at least one power sensor is configured to provide a sensor signal representing a power level of the RF test signal; and

an automatic testing equipment (ATE) configured to generate the RF test signal and feed the RF test signal into the circuit node,
wherein the ATE is configured to receive the sensor signal and to calculate at least one calibration parameter based on a known power level of the RF test signal and the sensor signal, and
wherein the ATE is configured to communicate the at least one calibration parameter to the MMIC.

2. The system of claim 1 ,
wherein the MMIC further includes a controller unit configured to communicate with the ATE.

3. The system of claim 1 ,
wherein the ATE is configured to receive the power level of the RF test signal, and to calculate at least one calibration parameter based on the power level of the RF test signal and the sensor signal.

4. The system of claim 1 , further comprising:
a memory for storing the at least one calibration parameter.

5. The system of claim 1 ,
wherein the at least one calibration parameter is utilized to correct the sensor signal.

6. A method for calibrating one or more power sensors included in a monolithic microwave integrated circuit (MMIC), the method comprising:
generating a radio frequency (RF) test signal having a desired power level;
feeding the RF test signal to the one or more power sensors included in the MMIC via a circuit node and a needle probe,
a power sensor, of the one or more power sensors, providing a respective sensor signal representing a power level of the RF test signal;

receiving, by an automatic test equipment (ATE), the respective sensor signal;
calculating, by the ATE, at least one calibration parameter based on the desired power level of the RF test signal and the respective sensor signal;
communicating, by the ATE, the at least one calibration parameter to the MMIC; and
storing the at least one calibration parameter in a memory.

7. The method of claim 6 ,
wherein the RF test signal is generated by the ATE which is separate from the MMIC.

8. The method of claim 7 ,
wherein feeding the RF test signal to the one or more power sensors comprises:
connecting the needle probe to a chip pad of the MMIC and feeding the RF test signal to the circuit node coupled to the one or more power sensors via the needle probe and the chip pad.

9. The method of claim 7 ,
wherein the RF test signal is generated by an on-chip signal generator included in the MMIC.

10. The method of claim 7 ,
wherein the at least one calibration parameter is calculated by the ATE.

11. The method of claim 6 ,
wherein the memory is included in the MMIC.

12. The method of claim 6 , wherein the at least one calibration parameter is utilized to correct the respective sensor signal.

Assignees

• Infineon Technologies Ag

Inventors

• Dominizi Karl
• Frank Oliver
• Jaeger Herbert
• Knapp Herbert
• Li Hao
• Starzer Florian
• Stuhlberger Rainer
• Wursthorn Jonas

Classifications

• H04B17/18

  Monitoring during normal operation · CPC title

• H04B17/11

  for calibration · CPC title

• H04B1/0466 Primary

  Fault detection or indication (H04B1/0483 takes precedence) · CPC title

• H04B17/0085 Primary

  using test signal generators · CPC title

• H04B17/102

  Power radiated at antenna · CPC title