Cobalt (Co) and platinum (Pt)-based multilayer thin film having inverted structure and method for manufacturing same
US-9705075-B2 · Jul 11, 2017 · US
US10566522B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10566522-B2 |
| Application number | US-201715410535-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 19, 2017 |
| Priority date | May 22, 2012 |
| Publication date | Feb 18, 2020 |
| Grant date | Feb 18, 2020 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A multilayer thin film for magnetic random access memory that includes thin platinum layers and thin cobalt-copper layers, and more particularly, to a multilayer thin film having magnetic layers including non-magnetic material copper that replaces a portion of the magnetic material cobalt.
Opening claim text (preview).
What is claimed is: 1. A perpendicular magnetic anisotropy multilayer thin film for a magnetic random access memory, comprising: a platinum layer and a cobalt-copper layer alternately deposited to form a multilayer thin film over a substrate, wherein the cobalt-copper layer is thicker than the platinum layer; wherein a content atomic ratio of cobalt:copper in the cobalt-copper layers is 50:50 to 90:10; wherein the multilayer thin film including the platinum layer and the cobalt-copper layer is repeatedly stacked over the substrate 2-10 turns; wherein the multilayer thin film has a total thickness of 0.3 nm-12.5 nm; and wherein the multilayer thin film has a perpendicular magnetic anisotropy (PMA) energy density of 0.23˜5.66×10 6 erg/cm 3 at 300˜500 Celsius degrees, and a saturation magnetization value of 735 emu/cc or less. 2. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein a thickness f the platinum layer in the multilayer thin film ranges from 0.15 nm to 0.25 nm. 3. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein the thickness ratio of the cobalt-copper layer to the platinum layer is 1.1:1˜4.0:1. 4. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , further comprising: a stack of a buffer layer and a seed layer, which are provided between the substrate and the multilayer thin film, and a protective layer deposited over the multilayer thin film. 5. The perpendicular magnetic anisotropy multilayer thin film of claim 4 , wherein each of the buffer layer, the seed layer, and the protective layer independently includes gold (Au), palladium (Pd), copper (Cu), platinum (Pt), tantalum (Ta), ruthenium (Ru), or a combination thereof. 6. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein a critical current value required for a perpendicular magnetization switching is 1 MA/cm 2 or less. 7. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein the platinum layer has a thickness of 0.2 nm and the cobalt-copper layer has a thickness of 0.4, or 0.5 or 0.6 nm. 8. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein a content atomic ratio of cobalt:copper in the cobalt-copper layer is 85/15 to 70/30. 9. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein a thickness of the platinum layer in the multilayer thin film ranges from 0.15 nm to 0.25 nm and a ratio of a thickness of the cobalt-copper layer to the thickness of the platinum layer is 0.6:1 to 4.0:1. 10. The perpendicular magnetic anisotropy multilayer thin film of claim 1 , wherein the multilayer thin film has a total thickness of 0.96 nm-12.5 nm. 11. The perpendicular magnetic anisotropy multilayer thin of claim 1 , wherein the substrate is made of a material selected from the group consisting of silicon, glass, sapphire and magnesium oxide. 12. A magnetic random access memory device comprising the perpendicular magnetic anisotropy multilayer thin film of claim 1 .
Exchange coupled hard/soft multilayers, e.g. CoPt/Co or NiFe/CoSm (nanocomposite spring magnets H01F1/0579) · CPC title
Electricity · mapped topic
made of a noble metal, e.g.(Co/Pt) n multilayers having perpendicular anisotropy (H01F10/3286 takes precedence) · CPC title
Materials of the active region · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.