Proximity probe interchange compensation

Patent metadata

Field	Value
Publication number	US-10534104-B2
Application number	US-201816057055-A
Country	US
Kind code	B2
Filing date	Aug 7, 2018
Priority date	Mar 26, 2015
Publication date	Jan 14, 2020
Grant date	Jan 14, 2020

Abstract

A system includes a proximity probe. The system also includes a probe information element. The probe information element is coupled to the proximity probe. The probe information element includes first data corresponding to one or more first error characteristics of the proximity probe.

First claim

The invention claimed is:

1. A system, comprising:
a proximity probe;
a probe information element coupled to the proximity probe, wherein the probe information element includes first data corresponding to one or more determined first error characteristics of the proximity probe within probe working standard ranges, and wherein the determined first error characteristics are derived from a first test of the proximity probe and includes a linearity error of the proximity probe; and
a processor is configured to determine an interchange error of the system based at least in part on the determined first error characteristics received from the probe information element.

2. The system of claim 1 , wherein the linearity error is a maximum deviation between measurements acquired by the proximity probe and a best fit straight line of the proximity probe measurements.

3. The system of claim 1 , wherein the first data comprises an encoded serial number for the proximity probe.

4. The system of claim 3 , wherein the probe information element comprises a physical tag disposed on an exterior surface of the proximity probe.

5. The system of claim 1 , wherein the probe information element comprises a digital encoder, a memory unit, or a radio-frequency identification tag.

6. The system of claim 1 , wherein the probe information element comprises second data corresponding to a length of the proximity probe and manufacturing information of the proximity probe.

7. The system of claim 1 , comprising:
an extension cable configured to couple to the proximity probe; and
a cable information element coupled to the extension cable, wherein the cable information element includes second data corresponding to one or more determined second error characteristics of the extension cable within extension cable working standard ranges, wherein the determined second error characteristics are derived from a second test of the extension cable;
wherein the processor is configured to determine the interchange error of the system based at least in part on the determined first error characteristics of the proximity probe and the determined second error characteristics of the extension cable.

8. The system of claim 7 , comprising a controller configured to couple to the extension cable, wherein the controller includes:
signal generating circuitry configured to provide a driving signal to the proximity probe to cause the proximity probe to generate a first magnetic field; and
signal processing circuitry configured to receive a feedback signal from the proximity probe based at least in part on a second magnetic field received by the proximity probe, and to process the feedback signal to generate an output signal based at least in part on a difference between the first magnetic field and the second magnetic field, wherein the difference is based at least in part on a distance between a conductive target object and the proximity probe.

9. The system of claim 8 , further comprising a monitor operatively coupled to the controller, wherein the monitor includes the processor configured to,
receive the first data of the probe information element relating to the one or more first error characteristics and the second data of the cable information element relating to the one or more second error characteristics,
determine the one or more first error characteristics of the proximity probe from the first data and the one or more second error characteristics of the extension cable from the second data,
receive the output signal from the controller, and
determine the distance between the conductive target object and the proximity probe based at least in part upon the output signal, the one or more first error characteristics of the proximity probe, and the one or more second error characteristics of the extension cable.

10. The system of claim 9 , wherein the probe information element and the cable information element each comprise an encoded serial number, and wherein the monitor includes a user interface configured to receive an input relating to the encoded serial numbers for the probe information element and the cable information element.

11. A method, comprising:
determining one or more first error characteristics of a proximity probe of a proximity probe system;
determining one or more second error characteristics of a second component of the proximity probe system;
encoding, via a processor-based monitor, first data corresponding to the one or more first error characteristics of the proximity probe;
storing the encoded first data in a probe information element;
encoding, via the processor-based monitor, second data corresponding to the one or more second error characteristics of the second component;
storing the encoded second data in a second information element;
associating the probe information element with the proximity probe; and
associating the second probe information element with the second component.

12. The method of claim 11 , wherein the one or more first error characteristics of the proximity probe include a first linearity error of the proximity probe, and wherein the one or more second error characteristics of the second component includes a second linearity error of the second component.

13. The method of claim 11 , wherein the probe information element comprises a first encoded serial number and the second information element comprises a second encoded serial number.

14. The method of claim 12 , wherein determining the first linearity error comprises:
generating testing data by each of the proximity probe and the second component;
performing a best-fit straight line to each of the proximity probe testing data and the second component testing data;
determining the first linearity error as the maximum deviation of the proximity probe testing data from the best-fit straight line to the proximity probe testing data; and
determining the second linearity error as the maximum deviation of the second component testing data from the best-fit straight line to the second component testing data.

15. The method of claim 11 , wherein the second component of the proximity probe system comprises an extension cable or a controller.

16. A system, comprising:
a proximity probe system, having,
a proximity probe;
a first physical tag disposed on the proximity probe, wherein the first physical tag includes first data relating to one or more determined first error characteristics of the proximity probe within probe working standard ranges derived from a first test of the proximity probe;
a controller coupled to the proximity probe, wherein the controller is configured to determine an output signal based at least in part upon a feedback signal received from the proximity probe related to a distance between the proximity probe and a conductive target object; and
a monitor including a processor configured to,
receive the output signal and the determined first error characteristics of the proximity probe from the controller,
determine an interchange error of the proximity probe system based at least in part on the determined first error characteristics, and
display the interchange error.

17. The system of claim 16 , comprising:
an extension cable coupled to the proximity probe; and
a second physical tag disposed on the extension cable, wherein the second physical tag comprises second data relating to one or more determined second error characteristics of the extension cable;
wherein the processor of the monitor is configured to,
receive the determined second error characteristics of the exten

Assignees

• Gen Electric

Inventors

• Turnbeaugh Lysle

Classifications

• G01D5/2449

  using hard-stored calibration data · CPC title

• G01V3/10 Primary

  using induction coils · CPC title

• G01D5/20

  by varying inductance, e.g. by a movable armature · CPC title