Proximity probe interchange compensation

Patent metadata

Field	Value
Publication number	US-2016282497-A1
Application number	US-201514669677-A
Country	US
Kind code	A1
Filing date	Mar 26, 2015
Priority date	Mar 26, 2015
Publication date	Sep 29, 2016
Grant date	—

Abstract

A system includes a proximity probe. The system also includes a probe information element. The probe information element is coupled to the proximity probe. The probe information element includes first data corresponding to one or more first error characteristics of the proximity probe.

First claim

1 . A system, comprising:
a proximity probe; and a probe information element coupled to the proximity probe, wherein the probe information element comprises first data corresponding to one or more first error characteristics of the proximity probe.

2 . The system of claim 1 , wherein the one or more first error characteristics of the proximity probe comprises a gain error of the proximity probe and an offset error of the proximity probe.

3 . The system of claim 1 , wherein the first data comprises an encoded serial number for the proximity probe.

4 . The system of claim 3 , wherein the probe information element comprises a physical tag disposed on an exterior surface of the proximity probe.

5 . The system of claim 1 , wherein the probe information element comprises a digital encoder, a memory unit, or a radio-frequency identification tag.

6 . The system of claim 1 , wherein the probe information element comprises second data corresponding to a length of the proximity probe and manufacturing information of the proximity probe.

7 . The system of claim 1 , comprising:
an extension cable configured to couple to the proximity probe; and a cable information element coupled to the extension cable, wherein the cable information element comprises second data corresponding to one or more second error characteristics of the extension cable.

8 . The system of claim 7 , comprising a controller configured to couple to the extension cable, wherein the controller comprises:
signal generating circuitry configured to provide a driving signal to the proximity probe to cause the proximity probe to generate a first magnetic field; and signal processing circuitry configured to receive a feedback signal from the proximity probe based at least in part on a second magnetic field received by the proximity probe, and the signal processing circuitry is configured to process the feedback signal to generate an output signal based at least in part on a difference between the first magnetic field and the second magnetic field, wherein the difference is based at least in part on a distance between a conductive target object and the proximity probe.

9 . The system of claim 8 , comprising a monitor operatively coupled to the controller, wherein the monitor comprises:
a processor configured to:
receive the first data of the probe information element relating to the one or more first error characteristics and the second data of the cable information element relating to the one or more second error characteristics;
determine the one or more first error characteristics of the proximity probe from the first data and the one or more second error characteristics of the extension cable from the second data;
receive the output signal from the controller; and
determine the distance between the conductive target object and the proximity probe based at least in part upon the output signal, the one or more error first characteristics of the proximity probe, and the one or more second error characteristics of the extension cable.

10 . The system of claim 9 , wherein the probe information element and the cable information element each comprise an encoded serial number, and wherein the monitor comprises a user interface configured to receive an input relating to the encoded serial numbers for the probe information element and the cable information element.

11 . A method, comprising:
decoding, via a processor-based monitor, first data of a probe information element corresponding to one or more first error characteristics of a proximity probe of a proximity probe system to determine the one or more first error characteristics of the proximity probe; decoding, via the processor-based monitor, second data of a second information element relating to one or more second error characteristics of second component of the proximity probe system to determine the one or more second error characteristics of the second component; receiving, via the processor-based monitor, an output signal from a controller of the proximity probe system, wherein the output signal is related to a distance between the proximity probe and a conductive target object; and determining, via the processor-based monitor, the distance between the proximity probe and the conductive target object based at least in part upon the output signal, the one or more first error characteristics of the proximity probe, and the one or more second error characteristics of the second component.

12 . The method of claim 11 , wherein the one or more first error characteristics of the proximity probe comprise a first gain error and a first offset error of the proximity probe, and wherein the one or more second error characteristics of the second component comprise a second gain error and a second offset error of the second component.

13 . The method of claim 11 , wherein the probe information element comprises a first encoded serial number and the second information element comprises a second encoded serial number.

14 . The method of claim 11 , comprising:
determining, via the processor-based monitor, an interchange error of the proximity probe system based at least in part upon the one or more first error characteristics of the proximity probe and the one or more second error characteristics of the second component; determining, via the processor-based monitor, whether the interchange error exceeds a predetermined threshold; and providing, via the processor-based monitor, a user-perceivable indication relating to the interchange error in response to a determination that the interchange error exceeds a predetermined threshold.

15 . The method of claim 11 , wherein the second component of the proximity probe system comprises an extension cable or a controller.

16 . A system, comprising:
a proximity probe system, comprising:
a proximity probe;
a first physical tag disposed on the proximity probe, wherein the first physical tag comprises first data relating to one or more first attributes of the proximity probe;
a controller coupled to the proximity probe, wherein the controller is configured to determine an output signal based at least in part upon a feedback signal received from the proximity probe related to a distance between the proximity probe and a conductive target object; and
a monitor comprising a processor configured to:
receive the output signal from the controller;
decode the first data to determine the one or more first attributes of the proximity probe; and
determine the distance between the proximity probe and the conductive target object based at least in part upon the output signal and the one or more first attributes.

17 . The system of claim 16 , comprising:
an extension cable coupled to the proximity probe; a second physical tag disposed on the extension cable, wherein the second physical tag comprises second data relating to one or more second attributes of the extension cable; and wherein the processor is configured to decode the second data to determine the one or more second attributes of the proximity probe and to determine the distance between the proximity probe and the conductive target object based at least in part upon the one or more second attributes.

18 . The system of claim 16 , wherein the first physical tag comprises a first encoded serial number, a first barcode, or a first radio-frequency identification (RFID) tag having the one or more first attributes.

19 . The system of claim 16 , wherein the first data comprises one or more first error characteri

Assignees

• Gen Electric

Inventors

• Turnbeaugh Lysle R

Classifications

• G01V3/10 Primary

  using induction coils · CPC title

• G01D5/20

  by varying inductance, e.g. by a movable armature · CPC title

• G01D5/2449

  using hard-stored calibration data · CPC title