Adhesive composition, electronic-component-mounted substrate and semiconductor device using the adhesive composition

Patent metadata

Field	Value
Publication number	US-10504864-B2
Application number	US-201514963292-A
Country	US
Kind code	B2
Filing date	Dec 9, 2015
Priority date	Oct 3, 2007
Publication date	Dec 10, 2019
Grant date	Dec 10, 2019

Abstract

There are provided are an adhesive composition that keeps storage stability and further gives a cured product wherein metallic bonds are formed in the state that the cured product wets its components and is satisfactorily spread between the components (or parts), thereby turning excellent in adhesive property, electroconductivity, and reliability for mounting such as TCT resistance or high-temperature standing resistance; an electronic-component-mounted substrate using the same; and a semiconductor device. The adhesive composition comprises electroconductive particles (A) and a binder component (B), wherein the electroconductive particles (A) include a metal (a1) having a melting point equal to or higher than the reflow temperature and containing no lead, and a metal (a2) having a melting point lower than the reflow temperature and containing no lead, and the binder component (B) includes a thermosetting resin composition (b1) and an aliphatic dihydroxycarboxylic acid (b2).

First claim

The invention claimed is:

1. An electronic component structure that two or more electronic components are bonded to each other through an adhesive composition, wherein the adhesive composition comprises electroconductive particles (A) and a binder component (B),
wherein the electroconductive particles (A) comprise a metal (a1) having a melting point equal to or higher than a reflow temperature and containing no lead, and a metal (a2) having a melting point lower than the reflow temperature and containing no lead, and
the binder component (B) comprises a thermosetting resin composition (b1) and an aliphatic dihydroxycarboxylic acid (b2) represented by the following general formula (1):

wherein R 1 is an alkyl group which may have a substituent, and n and m are each an integer of 0 to 5,
wherein the thermosetting resin composition (b1) comprises an epoxy resin, and
wherein the content of the aliphatic dihydroxycarboxylic acid (b2) is 0.1 part or more by weight and 20 parts or less by weight for 100 parts by weight of the metal (a2) having the melting point lower than the reflow temperature and containing no lead.

2. The electronic component structure according to claim 1 , wherein R 1 in the general formula (1) is an alkyl group having 1 to 5 carbon atom.

3. The electronic component structure according to claim 1 , wherein the aliphatic dihydroxycarboxylic acid (b2) includes any of 2,2-bishydroxymethylpropionic acid, 2,2-bishydroxymethylbutanoic acid, and 2,2-bishydroxymethylpentanoic acid.

4. The electronic component structure according to claim 1 , wherein the reflow temperature is a temperature for mounting with SnAgCu cream solder.

5. The electronic component structure according to claim 1 , wherein the reflow temperature is 260° C.

6. The electronic component structure according to claim 1 , wherein the epoxy resin is derived from bisphenol F.

7. The electronic component structure according to claim 1 , wherein the metal (a1) having the melting point equal to or higher than the reflow temperature and containing no lead is silver-coated copper powder, and the metal (a2) having the melting point lower than the reflow temperature and containing no lead is Sn42-Bi58.

8. The electronic component structure according to claim 1 , further having a substrate bonding to the electronic component structure according to claim 1 .

9. The electronic component structure according to claim 1 , wherein the electronic components include a passive component and the other component including a semiconductor element.

10. The electronic component structure according to claim 1 , wherein a ratio of the metal (a1) having the melting point equal to or higher than the reflow temperature and containing no lead: the metal (a2) having the melting point lower than the reflow temperature and containing no lead is 90 to 1% by weight: 10 to 99% by weight.

11. The electronic component structure according to claim 1 , wherein a ratio of the metal (a1) having the melting point equal to or higher than the reflow temperature and containing no lead: the metal (a2) having the melting point lower than the reflow temperature and containing no lead is 70 to 5% by weight: 30 to 95% by weight.

12. The electronic component structure according to claim 1 , wherein a ratio of the metal (a1) having the melting point equal to or higher than the reflow temperature and containing no lead: the metal (a2) having the melting point lower than the reflow temperature and containing no lead is 60 to 10% by weight: 40 to 90% by weight.

Assignees

• Hitachi Chemical Co Ltd

Inventors

• Konno Kaoru
• Hayashi Hiroki
• Kawamori Takashi

Classifications

• C08K3/017

  Antistatic agents · CPC title

• H10W90/728

  between a chip and a stacked discrete passive device, e.g. resistors, capacitors or inductors · CPC title

• H10W90/724

  between a chip and a stacked insulating package substrate, interposer or RDL · CPC title

• H10W72/9415

  relative to the surface, e.g. recessed, protruding · CPC title

• H10W72/07251

  characterised by changes in properties of the bump connectors during connecting · CPC title