Scan method, scan system and radiation scan controller

US10495776B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10495776-B2
Application numberUS-201615289206-A
CountryUS
Kind codeB2
Filing dateOct 10, 2016
Priority dateDec 23, 2015
Publication dateDec 3, 2019
Grant dateDec 3, 2019

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  5. First independent claim

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Abstract

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This invention provides a scan method, scan system and radiation scan controller, and relates to the field of radiation. Wherein, the scan method of this invention comprises: obtaining detection data of an object to be inspected under radiation scanning using a detector; adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data. With this method, working conditions of the accelerator of the radiation emission device may be adjusted according to the detection data detected by the detector, so that for a region having a larger mass thickness, a higher output beam dose rate or a higher electron beam output energy level is adopted to guarantee satisfied imaging technical indexes, for a region having a smaller mass thickness, a lower output beam dose rate or a lower electron beam output energy level is adopted to reduce the environmental dose level while guaranteeing satisfied imaging technical indexes.

First claim

Opening claim text (preview).

What is claimed is: 1. A scan method, comprising: acquiring detection data of an object to be inspected under radiation scanning using a detector, comprising: dividing data acquired by the detector into sections according to a predetermined detection granularity; using an average value of the data acquired by the detector from the same section as a sampling value, or extract a minimum value of the data acquired by the detector from the same section as a sampling value; and using the sampling value as the detection data; adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data, comprising: comparing the sampling value with a predetermined sampling threshold value; if the sampling value is below a predetermined lower sampling threshold value, increasing the accelerator output beam dose rate and/or the output electron beam energy level; if the sampling value is above a predetermined upper sampling threshold value, decreasing the accelerator output beam dose rate and/or the output electron beam energy level. 2. The method according to claim 1 , wherein adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data comprises: during a movement of the object to be inspected relative to the radiation emission device and the detector, adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to real-time detection data obtained by the detector from a scanning region of the object to be inspected. 3. The method according to claim 1 , wherein adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data comprises: acquiring overall scanning data of the object to be inspected using the detector; analyzing the overall scanning data to determine a main scanning region of the object to be inspected, wherein the main scanning region comprises a low penetration region or a region suspected to be a contraband item; determine an accelerator output beam dose rate and/or an output electron beam energy level according to detection data of the main scanning region, to scan the main scanning region. 4. The method according to claim 1 , wherein adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data comprises: determining an ideal output beam dose rate and/or an ideal output electron beam energy level according to a conversion policy for converting the detection data to the ideal accelerator output beam dose rate and/or the ideal output electron beam energy level; adjusting the accelerator output beam dose rate and/or the output electron beam energy level to the ideal output beam dose rate and/or the ideal output electron beam energy level. 5. The method according to claim 1 , wherein the accelerator of the radiation emission device comprises multiple output beam dose rate levels and/or multiple output electron beam energy levels, each level having a fixed output beam dose rate and/or a fixed output electron beam energy value; adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data comprises: adjusting the accelerator output beam dose rate and/or the output electron beam energy level of the radiation emission device to a certain level according to the detection data. 6. A radiation scan controller, characterized in comprising: a data acquisition module for acquiring detection data of an object to be inspected under radiation scanning using a detector, comprising: dividing data acquired by the detector into sections according to a predetermined detection granularity; using an average value of the data acquired by the detector from the same section as a sampling value, or extract a minimum value of the data acquired by the detector from the same section as a sampling value; and, using the sampling value as the detection data; an adjustment module for adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data, wherein the adjustment module comprises: a comparison unit for comparing the sampling value with a predetermined sampling threshold value; an emission adjustment unit for, if the sampling value is below a predetermined lower sampling threshold value, increasing the accelerator output beam dose rate and/or the output electron beam energy level; if the sampling value is above a predetermined upper sampling threshold value, decreasing the accelerator output beam dose rate and/or the output electron beam energy level. 7. The controller according to claim 6 , wherein the adjustment module is further used for: during a movement of the object to be inspected relative to the radiation emission device and the detector, adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to real-time detection data obtained by the detector from a scanning region of the object to be inspected. 8. The controller according to claim 6 , wherein the adjustment module is further used for: acquire overall scanning data of the object to be inspected; analyzing the overall scanning data to determine a main scanning region of the object to be inspected, wherein the main scanning region comprises a low penetration region or a region suspected to be a contraband item; determine an accelerator output beam dose rate and/or an output electron beam energy level according to detection data of the main scanning region, to scan the main scanning region. 9. The controller according to claim 6 , wherein the adjustment module further comprises: an ideal value determination unit for determining an ideal output beam dose rate and/or an ideal output electron beam energy level according to a conversion policy for converting the detection data to the ideal accelerator output beam dose rate and/or the ideal output electron beam energy level; an emission adjustment unit for adjusting the accelerator output beam dose rate and/or the output electron beam energy level to the ideal output beam dose rate and/or the ideal output electron beam energy level. 10. The controller according to claim 6 , wherein the accelerator of the radiation emission device comprises multiple output beam dose rate levels and/or multiple output electron beam energy levels, each level having a fixed output beam dose rate and/or a fixed output electron beam energy value; the adjustment module is further used to adjust the accelerator output beam dose rate and/or the output electron beam energy level of the radiation emission device to a certain level according to the detection data. 11. A scan system, comprising: a radiation scan controller, comprising: a data acquisition module for acquiring detection data of an object to be inspected under radiation scanning using a detector, comprising: dividing data acquired by the detector into sections according to a predetermined detection granularity; using an average value of the data acquired by the detector from the same section as a sampling value, or extract a minimum value of the data acquired by the detector from the same section as a sampling value; and, using the sampling value as the detection data; a detector; and a radiation emitter; wherein the detector is used to send detection data to the radiatio

Assignees

Inventors

Classifications

  • Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation · CPC title

  • and forming images of the material · CPC title

  • G01N23/10Primary

    the material being confined in a container, e.g. in a luggage X-ray scanners · CPC title

  • G01V5/0016Primary

    Physics · mapped topic

  • G01V5/22Primary

    Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays · CPC title

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What does patent US10495776B2 cover?
This invention provides a scan method, scan system and radiation scan controller, and relates to the field of radiation. Wherein, the scan method of this invention comprises: obtaining detection data of an object to be inspected under radiation scanning using a detector; adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device acc…
Who is the assignee on this patent?
Nuctech Co Ltd, Univ Tsinghua
What technology area does this patent fall under?
Primary CPC classification G01N23/10. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 03 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).