Single-crystal diamond and method of manufacturing the same
US-2024175167-A1 · May 30, 2024 · US
US10480097B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10480097-B2 |
| Application number | US-201916352934-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 14, 2019 |
| Priority date | Dec 22, 2009 |
| Publication date | Nov 19, 2019 |
| Grant date | Nov 19, 2019 |
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The present disclosure relates to methods for synthesizing synthetic CVD diamond material and high quality synthetic CVD diamond materials.
Opening claim text (preview).
The invention claimed is: 1. A chemical vapour deposition (CVD) method for synthesizing diamond material on a substrate in a synthesis environment, said method comprising: providing the substrate; providing a source gas; dissociating the source gas; and allowing homoepitaxial diamond synthesis on the substrate; wherein the synthesis environment comprises nitrogen at an atomic concentration of from about 0.4 ppm to about 50 ppm; and and wherein the source gas comprises: a) an atomic fraction of hydrogen, H f , from about 0.40 to about 0.75; b) an atomic fraction of carbon, C f , from about 0.15 to about 0.30; c) an atomic fraction of oxygen, O f , from about 0.13 to about 0.40; wherein H f C f O f =1; wherein the ratio of atomic fraction of carbon to the atomic fraction of oxygen, C f :O f , satisfies the ratio of about 0.45:1<C f :O f <about 1.25:1; wherein the source gas comprises hydrogen atoms added as hydrogen molecules, H 2 , at an atomic fraction of the total number of hydrogen, oxygen and carbon atoms present of between 0.05 and 0.40; and wherein the atomic fractions H f , C f and O f are fractions of the total number of hydrogen, oxygen and carbon atoms present in the source gas. 2. The method according to claim 1 , wherein the process is carried out at a pressure greater than P lower Torr, where P lower =P arc −Y and P arc =170(H f +0.25)+X, where Y=50 Torr and X is from about 20 to about −50 and P arc is the pressure of the onset of unipolar arcing in the process. 3. The method according to claim 1 , wherein the source gas is dissociated by microwaves. 4. The method according to claim 3 , wherein the frequency of the microwaves is from about 800 MHz to about 1000 MHz. 5. The method according to claim 1 , wherein the substrate is maintained at a temperature of from about 750° C. to about 1000° C.
Preparation (by using ultra-high pressure B01J3/06; by crystal growth C30B29/04) · CPC title
the substrate being of the same materials as the epitaxial layer · CPC title
the flow of the reactive gases · CPC title
being specially pre-treated by, e.g. chemical or physical means · CPC title
Diamond · CPC title
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