Apparatus, system and method for inspecting composite structures using quantitative infra-red thermography

US10473603B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10473603-B2
Application numberUS-201715490578-A
CountryUS
Kind codeB2
Filing dateApr 18, 2017
Priority dateApr 18, 2017
Publication dateNov 12, 2019
Grant dateNov 12, 2019

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

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A system and method for inspecting a surface of a structure for defects includes an inspection apparatus having a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device. A training system includes an expert system module configured to determine correlations between a set of thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements. A computer system communicatively coupled to the training system and the inspection apparatus, is adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system.

First claim

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What is claimed is: 1. A system for inspecting a surface of a structure for defects comprising: an inspection apparatus including a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device coupled to the controller; a training system including an expert system module configured to determine correlations between a set of thermographs, the thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements; and a computer system communicatively coupled to the training system and to the communication device of the inspection apparatus, the computer system adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system, wherein the quantitative parameters detected by the computer system include a location, a depth, an orientation, a defect type and an entrapped media type. 2. A system for inspecting a surface of a structure for defects comprising: an inspection apparatus including a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device coupled to the controller; a training system including an expert system module configured to determine correlations between a set of thermographs, the thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements; and a computer system communicatively coupled to the training system and to the communication device of the inspection apparatus, the computer system adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system, wherein parameters of each modeled structural element includes a location, defect type, defect size, defect orientation and entrapped media. 3. The system of claim 2 , wherein the defect type is one of delamination, unique void, matrix cracking, fiber-matrix de-bonding, multiple voids, and holes. 4. The system of claim 2 , wherein the entrapped media is liquid or gas selected for inspection. 5. A system for inspecting a surface of a structure for defects comprising: an inspection apparatus including a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device coupled to the controller; a training system including an expert system module configured to determine correlations between a set of thermographs, the thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements; and a computer system communicatively coupled to the training system and to the communication device of the inspection apparatus, the computer system adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system, wherein the training system further includes an optimized acquisition parameter module configured to automatically determine acquisition parameters for controlling the inspection apparatus based on material properties of the structure, environmental conditions, and a thermal analysis of a modeled structural element. 6. The system of claim 5 , wherein the acquisition parameters determined by the optimized acquisition parameter module include a heating mode, heating time and target heat flux level for operating the heating device, and an acquisition time for operating the infrared camera of the inspection apparatus. 7. The system of claim 5 , wherein the thermal analysis is performed on a modeled structural element having at least one of a smallest and a deepest defect. 8. A system for inspecting a surface of a structure for defects comprising: an inspection apparatus including a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device coupled to the controller; a training system including an expert system module configured to determine correlations between a set of thermographs, the thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements; and a computer system communicatively coupled to the training system and to the communication device of the inspection apparatus, the computer system adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system, wherein the computer system receives acquisition parameters from the training system and transmits the acquisition parameters to the inspection apparatus. 9. A system for inspecting a surface of a structure for defects comprising: an inspection apparatus including a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device coupled to the controller; a training system including an expert system module configured to determine correlations between a set of thermographs, the thermographs generated by a thermal simulation of modeled structural elements with defects, and parameters of the modeled structural elements; and a computer system communicatively coupled to the training system and to the communication device of the inspection apparatus, the computer system adapted to receive thermographs received from the inspection apparatus and to detect quantitative parameters of defects in the structure using the correlations obtained from the training system, wherein the inspection apparatus includes a clamp element for fixing the apparatus to the surface of the structure and a chassis unit for housing the heating element and infrared camera. 10. The system of claim 9 , wherein the chassis unit is slidingly coupled to the clamp element and rotatable circumferentially with respect to the surface of the structure. 11. The system of claim 9 , wherein the chassis unit and clamp element are coupled to rotatable and translatable wheels enabling the inspection apparatus to rotate circumferentially and translate longitudinally along the surface of the structure. 12. A system for inspecting a surface of a structure for defects comprising: an inspection apparatus including a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device coupled to the controller; a training system including an expert syste

Assignees

Inventors

Classifications

  • G01N25/72Primary

    Investigating presence of flaws · CPC title

  • Transforming infrared radiation (cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20) · CPC title

  • Investigating the presence of flaws or contamination · CPC title

  • from thermal infrared radiation · CPC title

  • Machine learning · CPC title

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What does patent US10473603B2 cover?
A system and method for inspecting a surface of a structure for defects includes an inspection apparatus having a heating device for heating a section of the surface of the structure, an infrared camera for receiving infrared radiation from the surface in response to heating, a controller configured to generate thermographs from the received infrared radiation, and a communication device. A tra…
Who is the assignee on this patent?
Saudi Arabian Oil Co
What technology area does this patent fall under?
Primary CPC classification G01N25/72. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 12 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).