Imaging apparatus and methods using diffraction-based illumination

US10459241B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10459241-B2
Application numberUS-201415307759-A
CountryUS
Kind codeB2
Filing dateApr 30, 2014
Priority dateApr 30, 2014
Publication dateOct 29, 2019
Grant dateOct 29, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Imaging apparatus and methods using diffraction-based illumination are disclosed. An example apparatus includes a diffraction grating to redirect light from a light source toward a sample to thereby illuminate the sample. The example apparatus also includes an image sensor to detect a diffraction pattern created by the illuminated sample.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus comprising: a diffraction grating to redirect light from a light source toward a sample supported on a planar surface to thereby illuminate an area of the sample, the diffraction grating to be substantially parallel to the planar surface and aligned with the area of the sample when the light is redirected; and an image sensor to detect a diffraction pattern created by the illuminated sample the image sensor to be substantially parallel to the planar surface and aligned with the area of the sample when the light is redirected by the diffraction grating. 2. The apparatus of claim 1 , further including a processor to analyze the diffraction pattern to generate an image of the sample. 3. The apparatus of claim 1 , wherein the light is to provide directional illumination of the sample. 4. The apparatus of claim 1 , further including a slab waveguide to carry the light from the light source to the diffraction grating. 5. The apparatus of claim 4 , wherein the diffraction grating is adjacent a surface of the slab waveguide to face away from the sample. 6. The apparatus of claim 4 , wherein the diffraction grating is adjacent a surface of the slab waveguide to face toward the sample. 7. The apparatus of claim 4 , further including a collimating lens to collimate the light from the light source, the collimating lens to direct the light into the slab waveguide at an angle. 8. The apparatus of claim 7 , wherein a position of the light source is adjustable relative to the collimating lens to vary the angle. 9. The apparatus of claim 1 , further including: a microfluidic channel to contain the sample; and a pump to force the sample through the microfluidic channel. 10. The apparatus of claim 1 , further including a housing containing the diffraction grating and the image sensor, the housing having a total height of one centimeter or less. 11. The apparatus of claim 1 , wherein the image sensor includes a sensor array, the area of the sample corresponding to a size of the sensor array. 12. The apparatus of claim 1 , further including a slab waveguide extending substantially parallel to and supporting the diffraction grating. 13. An apparatus comprising: a diffraction grating to diffract light toward a sample, the light from a light source, the light diffracted by the diffraction grating to be directional light such that different rays of the light diffracted by the diffraction grating are substantially parallel to one another; a slab waveguide to transmit the light from the light source to the diffraction grating, the diffraction grating positioned along a surface of the slab waveguide, the slab waveguide positioned adjacent the sample with the surface of the slab waveguide substantially parallel to a surface supporting the sample; and an image sensor to detect a diffraction pattern created from interference between a first portion of the directional light transmitted through the sample and a second portion of the directional light scattered by the sample. 14. The apparatus of claim 13 , wherein the diffraction grating includes circular arced grooves. 15. The apparatus of claim 14 , wherein the grooves are concentric about a central axis, the light source to be positioned on the central axis. 16. The apparatus of claim 15 , wherein spacing between adjacent ones of the grooves is defined by a distance of the adjacent ones of the grooves from the light source. 17. The apparatus of claim 13 , wherein the image sensor includes a sensor array, the sensor array being substantially parallel to the diffraction grating. 18. A method comprising: transmitting light through a slab waveguide toward a diffraction grating, the diffraction grating positioned along a surface of the slab waveguide; generating directional light via the diffraction grating to illuminate a sample, the directional light generated from the light transmitted through the waveguide, the light transmitted through the waveguide originating from a light source adjacent the diffraction grating; detecting, via an image sensor, a diffraction pattern created by the sample when illuminated by the directional light, the light to travel from the diffraction grating to the image sensor without passing through a lens, the image sensor being substantially parallel to the waveguide; and generating an image of the sample based on the diffraction pattern.

Assignees

Inventors

Classifications

  • provided with illuminating means · CPC title

  • G02B27/425Primary

    in illumination systems (mask illumination systems in photolithographic systems G03F7/70158) · CPC title

  • Means for illuminating specimens · CPC title

  • Particular recording light; Beam shape or geometry (G03H1/06 takes precedence) · CPC title

  • Surface relief holograms (replicating hologram without interference recording G03H1/0276) · CPC title

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What does patent US10459241B2 cover?
Imaging apparatus and methods using diffraction-based illumination are disclosed. An example apparatus includes a diffraction grating to redirect light from a light source toward a sample to thereby illuminate the sample. The example apparatus also includes an image sensor to detect a diffraction pattern created by the illuminated sample.
Who is the assignee on this patent?
Hewlett Packard Development Co
What technology area does this patent fall under?
Primary CPC classification G02B27/425. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 29 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).