Displacement measurement device, measurement system, and displacement measurement method

Patent metadata

Field	Value
Publication number	US-10444360-B2
Application number	US-201815893702-A
Country	US
Kind code	B2
Filing date	Feb 12, 2018
Priority date	Sep 26, 2017
Publication date	Oct 15, 2019
Grant date	Oct 15, 2019

Abstract

A displacement measurement device and a measurement method are provided. A displacement measurement device includes a light projecting unit configured to generate a light beam; a sensor head configured to emit the light beam to a measurement target object and receive a light beam reflected at the measurement target surface within the emitted light beam; a storage unit configured to store a function using a distance between the sensor head and the measurement target surface as a variable; and a control unit configured to calculate the distance based on a wavelength of the light received by the sensor head. The control unit calculates a value of the function using a distance between the sensor head and the measurement target surface of the measurement target object as a value of the variable. The control unit corrects the calculated distance using the calculated value of the function.

First claim

What is claimed is:

1. A displacement measurement device comprising:
a light projector configured to generate a light beam;
a sensor head configured to emit the light beam to a measurement target object of which a measured value and an actual displacement are nonlinear so that a focus is formed on a measurement target surface of the measurement target object, and receive a light beam that is reflected at the measurement target surface within the emitted light beam;
a memory configured to store a mathematical function using a distance between the sensor head and the measurement target surface as a variable; and
a processor configured to calculate the distance based on a wavelength of the light beam received by the sensor head, wherein the distance comprises a first distance, and the measurement target object comprises a first measurement target object, and the processor is further configured to calculate a value of the mathematical function by using the first distance between the sensor head and a measurement target surface of the first measurement target object as a value of the variable, and corrects the calculated first distance using the calculated value of the mathematical function.

2. The displacement measurement device according to claim 1 ,
wherein the distance further comprises a second distance, and the measurement target object further comprises a second measurement target object,
wherein the first measurement target object as the measurement target object and the second measurement target object as the measurement target object have a thin film causing interference, and
wherein the processor is further configured to calculate the second distance that is a distance between the sensor head and a front surface of the thin film by moving a stage to a plurality of positions while the second measurement target object is mounted on the stage that is movable in a direction of the sensor head, and
to generate the mathematical function on the basis of the second distance calculated at each of the plurality of positions and a reference distance that serves as a reference between the sensor head and the front surface when the second distance is calculated.

3. The displacement measurement device according to claim 2 , wherein the processor is further configured to generate the mathematical function based on the second distance and a difference between the second distance and the reference distance.

4. The displacement measurement device according to claim 3 ,
wherein the processor is configured to divide a numerical value range of the variable in a plurality of sections using the second distance calculated at each of the plurality of positions, and
to generate the mathematical function for each of the plurality of sections.

5. The displacement measurement device according to claim 4 , wherein the mathematical function of each of the sections is a linear mathematical function.

6. A measurement system including the displacement measurement device according to claim 5 , and an information processing device that is communicatively connected to the displacement measurement device,
wherein the information processing device receives a user operation by which the second distance that is calculated at each of the plurality of positions and the reference distance is inputted to the information processing device, and
transmits the second distance that is calculated at each of the plurality of positions and the reference distance to the displacement measurement device.

7. A measurement system including the displacement measurement device according to claim 4 , and an information processing device that is communicatively connected to the displacement measurement device,
wherein the information processing device receives a user operation by which the second distance that is calculated at each of the plurality of positions and the reference distance is inputted to the information processing device, and
transmits the second distance that is calculated at each of the plurality of positions and the reference distance to the displacement measurement device.

8. A measurement system including the displacement measurement device according to claim 3 , and an information processing device that is communicatively connected to the displacement measurement device,
wherein the information processing device receives a user operation by which the second distance that is calculated at each of the plurality of positions and the reference distance is inputted to the information processing device, and
transmits the second distance that is calculated at each of the plurality of positions and the reference distance to the displacement measurement device.

9. A measurement system including the displacement measurement device according to claim 2 , and an information processing device that is communicatively connected to the displacement measurement device,
wherein the information processing device receives a user operation by which the second distance that is calculated at each of the plurality of positions and the reference distance is inputted to the information processing device, and
transmits the second distance that is calculated at each of the plurality of positions and the reference distance to the displacement measurement device.

10. The displacement measurement device according to claim 1 ,
wherein the distance further comprises a second distance, and the measurement target object further comprises a second measurement target object,
wherein the measurement target object is an object having a first surface as the measurement target surface and a second surface that is further away from the sensor head than the first surface and causing wavelength dispersion,
wherein the processor is configured to calculate the second distance between the sensor head and the measurement target surface of the second measurement target object by moving a stage to a plurality of positions while the second measurement target object that is the measurement target object is mounted on the stage that is movable in a direction of the sensor head, and
to generate the mathematical function on the basis of the second distance calculated at each of the plurality of positions and a reference distance when the second distance is calculated, and
wherein the reference distance is a distance obtained by adding an ideal thickness of the measurement target object to a distance from the sensor head to the first surface.

11. The displacement measurement device according to claim 10 , wherein the processor is further configured to generate generates the mathematical function based on the second distance and a difference between the second distance and the reference distance.

12. A measurement system including the displacement measurement device according to claim 10 , and an information processing device that is communicatively connected to the displacement measurement device,
wherein the information processing device receives a user operation by which the second distance that is calculated at each of the plurality of positions and the reference distance is inputted to the information processing device, and
transmits the second distance that is calculated at each of the plurality of positions and the reference distance to the displacement measurement device.

13. A displacement measurement device comprising:
a light projector configured to generate a light beam having a predetermined wavelength width;
a sensor head configured to emit the light beam through a member by which wavelength dispersion occurs according to a refractive index so that a focus is formed on a measurement target surface of a m

Assignees

• Omron Tateisi Electronics Co

Inventors

• Kondo Tomonori
• Suzuki Yuta
• Matoba Kenichi

Classifications

• G01S7/4811

  common to transmitter and receiver · CPC title

• G01B11/0608

  Height gauges · CPC title

• G01B2210/50

  Using chromatic effects to achieve wavelength-dependent depth resolution · CPC title

• G01B21/042

  Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title

• G01B21/045

  Correction of measurements (G01B9/02055 takes precedence) · CPC title