Multilayer ceramic capacitor

Patent metadata

Field	Value
Publication number	US-10431384-B2
Application number	US-201715457026-A
Country	US
Kind code	B2
Filing date	Mar 13, 2017
Priority date	Jun 20, 2016
Publication date	Oct 1, 2019
Grant date	Oct 1, 2019

Abstract

A multilayer ceramic capacitor includes: a pair of external electrodes; a first internal electrode containing a base metal and coupled to one of the external electrodes; a dielectric layer stacked on the first internal electrode and containing the base metal and a ceramic material mainly composed of barium titanate; and a second internal electrode stacked on the dielectric layer, containing the base metal, and coupled to another one of the external electrodes, wherein a concentration of the base metal in each of five regions, which are equally divided regions between locations 50 nm away from the first and second internal electrodes in a stacking direction between the first and second internal electrodes, is within ±20% of an average of the concentrations of the base metal in the five regions, and an atomic concentration ratio of Mg to Ti is 0 or greater and less than 0.002 in the dielectric layer.

First claim

What is claimed is:

1. A multilayer ceramic capacitor comprising:
a pair of external electrodes;
a first internal electrode that contains a base metal and is coupled to one of the pair of external electrodes;
a dielectric layer that is stacked on the first internal electrode and contains the base metal and a ceramic material mainly composed of barium titanate, wherein a main component of the dielectric layer is the ceramic material; and
a second internal electrode that is stacked on the dielectric layer, contains the base metal, and is coupled to another one of the pair of external electrodes, wherein a concentration of the base metal in each of five regions is within ±20% of an average of the concentrations of the base metal in the five regions, each of the five regions including the base metal, the five regions being obtained by dividing a region from a location 50 nm away from the first internal electrode of the dielectric layer to a location 50 nm away from the second internal electrode of the dielectric layer in a stacking direction between the first internal electrode and the second internal electrode equally into five, wherein abundance of Ba and Ti in each of the five regions is more than 90% as measured by measuring abundance of Ba atoms and Ti atoms by a transmission electron microscope,
an atomic concentration ratio of Mg to Ti is equal to or greater than 0 and less than 0.002 in the dielectric layer, and
the region located from the location 50 nm away from the first internal electrode to the location 50 nm away from the second internal electrode includes both a crystal grain of the ceramic material and a crystal grain boundary of the crystal grain.

2. The multilayer ceramic capacitor according to claim 1 , wherein
the concentration of the base metal in each of the five regions is within ±10% of the average of the concentrations of the base metal in the five regions.

3. The multilayer ceramic capacitor according to claim 1 , wherein
the concentration of the base metal in each of the five regions is within ±5% of the average of the concentrations of the base metal in the five regions.

4. The multilayer ceramic capacitor according to claim 1 , wherein
the dielectric layer has a thickness of 0.4 μm or greater and 1.0 μm or less.

5. The multilayer ceramic capacitor according to claim 1 , wherein
the ceramic material is BaTiO 3 , and
the base metal is Ni.

6. The multilayer ceramic capacitor according to claim 1 , wherein
a plurality of dielectric layers are stacked across an internal electrode, and
80% or more of the plurality of dielectric layers are the dielectric layer.

7. The multilayer ceramic capacitor according to claim 1 , wherein the concentration of the base metal is measured by TEM (Transmission Electron Microscope).

8. The multilayer ceramic capacitor according to claim 1 , wherein the concentration of the base metal in the crystal grain is within ±20% of the concentration of the base metal in the crystal grain boundary.

Assignees

• Taiyo Yuden Kk

Inventors

• Morita Koichiro
• Taniguchi Katsuya
• Ryu Minoru
• Iwazaki Yoshiki

Classifications

• H01G4/012

  Form of non-self-supporting electrodes · CPC title

• H01G4/0085

  Fried electrodes · CPC title

• H01G4/1227 Primary

  based on alkaline earth titanates · CPC title

• H01G4/2325

  characterised by the material of the terminals · CPC title

• H01G4/30 Primary

  Stacked capacitors (H01G4/33 takes precedence) · CPC title