Method for in-situ measuring electrical properties of carbon nanotubes
US-10132767-B2 · Nov 20, 2018 · US
Method for detecting surface electric field distribution of nanostructures
US10429425B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10429425-B2 |
| Application number | US-201715598227-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 17, 2017 |
| Priority date | May 20, 2016 |
| Publication date | Oct 1, 2019 |
| Grant date | Oct 1, 2019 |
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Abstract
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The disclosure relates to a method for detecting surface electric field distribution of nanostructures. The method includes the following steps of: providing a sample located on an insulated surface of a substrate; spraying first charged nanoparticles to the insulated surface; and blowing vapor to the insulated surface to observe a distribution of the first charged nanoparticles via an optical microscope.
First claim
Opening claim text (preview).
What is claimed is: 1. A method for detecting surface electric field distribution of nanostructures, the method comprising the following steps of: providing a nanostructure sample located on an insulated surface of a substrate; spraying first charged nanoparticles to the insulated surface; and blowing vapor to the insulated surface to image the first charged nanoparticles via an optical microscope. 2. The method as claimed in claim 1 , wherein the nanostructure sample is zero-dimensional nanomaterials, one-dimensional nanomaterials, or two-dimensional nanomaterials. 3. The method as claimed in claim 2 , wherein the nanostructure sample is carbon nanotubes. 4. The method as claimed in claim 1 , wherein the substrate is a silicon substrate with a silicon dioxide layers located on a surface of the silicon substrate. 5. The method as claimed in claim 1 , wherein a diameter of the first charged nanoparticles ranges from about 0.5 nanometers to about 5 nanometers. 6. The method as claimed in claim 1 , wherein a first charged nanoparticle are crystals difficult to sublimate. 7. The method as claimed in claim 1 , wherein the first charged nanoparticles are all positively charged or all negatively charged. 8. The method as claimed in claim 1 , wherein the first charged nanoparticles are charged glucose nanoparticles, charged sucrose nanoparticles or charged metal salt nanoparticles. 9. The method as claimed in claim 1 , wherein the vapor is water vapor or ethanol vapor. 10. A method for detecting surface electric field distribution of nanostructures, the method comprising the following steps of: providing a nanostructure sample located on an insulated surface of a substrate, and a vapor-condensation-assisted optical microscope system comprising a vapor-condensation-assisted device and an optical microscope comprising a stage, wherein the vapor-condensation-assisted device configured to provide vapor; locating a sample on the stage; spraying first charged nanoparticles to the insulated surface; and blowing vapor to the insulated surface to image the first charged nanoparticles via an optical microscope. 11. The method as claimed in claim 10 , wherein the vapor-condensation-assisted device comprises an air blowing device, a vapor producing device and a guide pipe connected with each other; and the air blowing device blows air through the vapor producing device into the guide pipe.
Assignees
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Classifications
Arrangements for measuring quantities of charge · CPC title
- G02B21/0004Primary
specially adapted for specific applications · CPC title
Electrostatic instruments · CPC title
Measuring electromagnetic field characteristics · CPC title
- G01R29/14Primary
Measuring field distribution · CPC title
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- What does patent US10429425B2 cover?
- The disclosure relates to a method for detecting surface electric field distribution of nanostructures. The method includes the following steps of: providing a sample located on an insulated surface of a substrate; spraying first charged nanoparticles to the insulated surface; and blowing vapor to the insulated surface to observe a distribution of the first charged nanoparticles via an optical …
- Who is the assignee on this patent?
- Univ Tsinghua, Hon Hai Prec Ind Co Ltd
- What technology area does this patent fall under?
- Primary CPC classification G02B21/0004. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Oct 01 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).