Measuring probe

Patent metadata

Field	Value
Publication number	US-10422628-B2
Application number	US-201715422794-A
Country	US
Kind code	B2
Filing date	Feb 2, 2017
Priority date	Mar 5, 2015
Publication date	Sep 24, 2019
Grant date	Sep 24, 2019

Abstract

A measuring probe includes a stylus having a contact part, an axial motion mechanism, and a rotary motion mechanism. The axial motion mechanism includes first diaphragm structures and a moving member that allows the contact part to move in an axial direction. The rotary motion mechanism includes a second diaphragm structure and a rotating member that allows the contact part to move along a plane perpendicular to the axial direction. The first diaphragm structures are disposed at a symmetric distance with respect to the second diaphragm structure, and the second diaphragm structure is disposed between the first diaphragm structures in the axial direction. The axial motion mechanism supports the rotary motion mechanism, or the rotary motion mechanism supports the axial motion mechanism.

First claim

The invention claimed is:

1. A measuring probe, comprising:
a stylus having a contact part;
an axial motion mechanism having a moving member that allows the contact part to move in an axial direction; and
a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction, wherein
the axial motion mechanism includes a plurality of first diaphragm structures that allow the moving member to be displaced, and the rotary motion mechanism includes a second diaphragm structure that allows the rotating member to be displaced,
the second diaphragm structure is disposed between the plurality of first diaphragm structures in the axial direction,
the first diaphragm structures are disposed at a symmetric distance with respect to the second diaphragm structure, and
the axial motion mechanism supports the rotary motion mechanism, or the rotary motion mechanism supports the axial motion mechanism.

2. The measuring probe according to claim 1 , wherein
when a particular type of the stylus is supported by the rotating member, a center of gravity of members supported by the second diaphragm structure coincides with a rotation center of the rotary motion mechanism.

3. The measuring probe according to claim 1 , wherein
the rotating member includes a balancing member on a side opposite to the stylus with respect to a rotation center of the rotary motion mechanism, and
a distance between the rotation center and the balancing member is adjustable.

4. The measuring probe according to claim 1 , further comprising
a balance weight corresponding to a mass of the stylus, and
a counterbalance mechanism supported by an axial element housing member for supporting the axial motion mechanism, the counterbalance mechanism keeping the stylus and the balance weight in balance.

5. The measuring probe according to claim 1 , further comprising an axial element housing member that supports the axial motion mechanism, wherein
the axial element housing member is provided with a displacement detector for detecting displacement of the moving member.

6. The measuring probe according to claim 5 , wherein the displacement detector outputs a relative position detection signal that allows detection of a relative position of the moving member.

7. The measuring probe according to claim 5 , wherein the displacement detector outputs an absolute position detection signal that allows detection of an absolute position of the moving member.

8. The measuring probe according to claim 5 , wherein
the axial element housing member is provided with an interference optical system including an interference light source, a reference mirror for reflecting light from the interference light source, and a target mirror disposed in the moving member for reflecting light from the interference light source, the interference optical system capable of causing interference of reflected light from the reference mirror and the target mirror to generate a plurality of interference fringes, and
the displacement detector can detect a phase shift of the plurality of interference fringes generated in the interference optical system.

9. The measuring probe according to claim 1 , further comprising a preceding housing member that detachably couples and supports a housing member that supports both of the moving member and the rotating member with an engagement part capable of positioning the housing member, wherein
a reference member is provided on an end, opposite to the stylus, of any of the rotating member and a member supported by the rotating member, and an orientation detector for detecting displacement of the reference member corresponding to a rotary movement of the stylus is housed in the preceding housing member.

10. The measuring probe according to claim 1 , further comprising
a reference member provided on an end, opposite to the stylus, of any of the rotating member and a member supported by the rotating member, and
an orientation detector for detecting displacement of the reference member corresponding to a rotary movement of the stylus is housed in a housing member that supports both of the moving member and the rotating member.

11. The measuring probe according to claim 9 , wherein
the reference member is a reflecting mirror for reflecting light,
the measuring probe includes a light source for causing light to be incident on the reflecting mirror along an optical axis, and
the orientation detector detects displacement of reflected light, reflected from the reflecting mirror, from the optical axis.

12. The measuring probe according to claim 11 , wherein the optical axis is provided to pass through the rotation center of the rotary motion mechanism.

13. The measuring probe according to claim 1 , further comprising a limiting member for limiting an amount of deformation in the plurality of first diaphragm structures within a range of elastic deformation.

14. The measuring probe according to claim 1 , further comprising a limiting member for limiting an amount of deformation in the second diaphragm structure within a range of elastic deformation.

15. The measuring probe according to claim 1 , wherein at least part of a gap between a wall member, which is disposed to face the moving member and to be integral with the axial element housing member for supporting the axial motion mechanism, and the moving member, is filled with a viscous material.

16. The measuring probe according to claim 1 , wherein at least part of a gap between a wall member, which is disposed to be integral with a rotary element housing member for supporting the rotary motion mechanism, and any of the second diaphragm structure and the rotating member, is filled with a viscous material.

Assignees

• Mitutoyo Corp

Inventors

• Shimaoka Atsushi
• Miyazaki Tomoyuki
• Hidaka Kazuhiko

Classifications

• G01B5/012 Primary

  Contact-making feeler heads therefor · CPC title

• G01B11/007 Primary

  feeler heads therefor · CPC title