Targeted mass analysis

Patent metadata

Field	Value
Publication number	US-10410847-B2
Application number	US-201715796515-A
Country	US
Kind code	B2
Filing date	Oct 27, 2017
Priority date	Sep 11, 2013
Publication date	Sep 10, 2019
Grant date	Sep 10, 2019

Abstract

A mass spectrometer comprises: an ion source that generates ions having an initial range of mass-to-charge ratios; an auxiliary ion detector, downstream from the ion source that receives a plurality of first ion samples derived from the ions generated by the ion source and determines a respective ion current measurement for each of the plurality of first ion samples; a mass analyzer, downstream from the ion source that receives a second ion sample derived from the ions generated by the ion source and to generate mass spectral data by mass analysis of the second ion sample; and an output stage that establishes an abundance measurement associated with at least some of the ions generated by the ion source based on the ion current measurements determined by the auxiliary ion detector.

First claim

I claim:

1. A mass spectrometer, comprising:
an ion source, arranged to generate ions having an initial range of mass-to-charge ratios;
an auxiliary ion detector, located downstream from the ion source and arranged to receive a plurality of first ion samples having a reduced range of mass-to-charge ratios that is narrower than the initial range derived from the ions generated by the ion source and to determine a respective ion current measurement for each of the plurality of first ion samples;
a mass analyzer, located downstream from the ion source and arranged to receive a second ion sample derived from the ions generated by the ion source and to generate mass spectral data by mass analysis of the second ion sample, wherein a resolution of the mass spectral data is high enough to mass resolve the ion current measurement determined by the auxiliary ion detector within the reduced range of mass-to-charge ratios; and
a processor configured to:
control reaction conditions in a reaction cell upstream of the auxiliary detector based on the mass spectral data; and
establish an abundance measurement associated with at least some of the ions generated by the ion source based on the ion current measurements determined by the auxiliary ion detector.

2. The mass spectrometer of claim 1 , further comprising:
a mass filter, arranged upstream from the auxiliary ion detector and configured to receive ions generated by the ion source and to transmit ions having a reduced range of mass-to-charge ratios, the reduced range being narrower than the initial range; and wherein the first and second ion samples are derived from the ions transmitted by the mass filter.

3. A method of mass spectrometry, comprising:
generating ions having an initial range of mass-to-charge ratios at an ion source;
filtering ions generated by the ion source at a mass filter, thereby transmitting ions having a reduced range of mass-to-charge ratios, the reduced range being narrower than the initial range;
determining, for each of a plurality of first ion samples, a respective ion current measurement at an auxiliary ion detector that is located downstream from the ion source, the first ion samples being derived from the ions generated by the ion source and transmitted by the mass filter;
performing mass analysis on a second ion sample, thereby generating mass spectral data, at a mass analyzer that is located downstream from the ion source, the second ion sample being derived from the ions generated by the ion source and transmitted by the mass filter, wherein a resolution of the mass spectral data is high enough to mass resolve the ion current measurement determined by the auxiliary ion detector within the reduced range of mass-to-charge ratios; and
establishing an abundance measurement associated with at least some of the ions generated by the ion source based on a combination of the mass spectral data generated by the mass analyzer and the ion current measurements determined by the auxiliary ion detector.

4. The method of claim 3 , wherein the step of determining a plurality of ion currents is carried out over a time period and wherein the step of performing a mass analysis comprises generating a single set of mass spectral data over the time period.

5. The method of claim 3 , wherein the average frequency of ion current measurement is higher than the average frequency of mass analysis.

6. The method of claim 5 , wherein the plurality of ion current measurements are determined with a time interval therebetween and wherein the step of performing mass analysis takes place over a time duration that is longer than the time interval between the plurality of ion current measurements.

7. The method of claim 3 , further comprising:
fragmenting at least some of the ions generated by the ion source.

8. The method of claim 7 , wherein:
the step of determining a plurality of ion current measurements comprises determining a respective ion current measurement for each of a plurality of first portions of the ions generated by the ion source;
the step of performing mass analysis comprising mass analyzing a first portion of the ions generated by the ion source;
the step of fragmenting comprises fragmenting a second portion of the ions generated by the ion source so as to generate fragment ions; and
the method further comprises performing mass analysis on the fragment ions.

9. The method of claim 3 , further comprising:
selectively controlling the path of ions downstream from the ion source, such that the ions are directed towards the auxiliary ion detector in a first mode.

10. The method of claim 9 , wherein the step of directing ions towards the auxiliary ion detector comprises changing the direction of the ions.

11. The method of claim 10 , wherein changing the direction of the ions comprises causing an orthogonal change in direction.

12. The method of claim 9 , further comprising:
selectively controlling the path of ions downstream from the ion source, such that the ions are directed towards a collision cell or a mass analyzer in a second mode.

13. The method of claim 12 , wherein the step of directing ions towards a collision cell or a mass analyzer in the second mode comprises controlling the path of the ions without changing their direction.

14. The method of claim 3 , further comprising:
storing ions for analysis by the mass analyzer in an ion storage device that is located upstream from the mass analyzer; and
ejecting at least some of the stored ions to the mass analyzer.

15. The method of claim 14 , wherein:
the step of filtering ions comprises selecting ions of a first range of mass-to-charge ratios at the mass filter;
the step of determining an ion current comprises determining an ion current for the ions of the first range of mass-to-charge ratios;
the step of storing ions comprises accumulating ions of the first range of mass-to-charge ratios in the ion storage device;
the method further comprises repeating the steps of selecting, determining and accumulating until a threshold quantity of ions of the first range of mass-to-charge ratios are stored in the ion storage device; and
the step of performing mass analysis comprises mass analyzing the ions stored in the ion storage device.

16. The method of claim 15 , further comprising:
selecting ions of a second range of mass-to-charge ratios at the mass filter;
determining an ion current for the ions of the second range of mass-to-charge ratios at the auxiliary ion detector;
accumulating ions of the second range of mass-to-charge ratios in the ion storage device; and
repeating the steps of selecting, determining and accumulating in respect of the ions of the second range of mass-to-charge ratios, until a threshold quantity of ions of the second range of mass-to-charge ratios are stored in the ion storage device; and
wherein the step of performing mass analysis comprises mass analyzing the ions stored in the ion storage device when the ion storage device stores the threshold quantity of ions of the first range of mass-to-charge ratios and the threshold quantity of ions of the second range of mass-to-charge ratios.

17. The method of claim 3 , wherein the step of establishing the abundance measurement comprises adjusting the mass spectral data generated by the mass analyzer on the basis of the ion current determined by the auxiliary ion detector.

18. The method of claim 3 , wherein the first and second ion samples are both samples of the same set of ions and the step of determining a plurality of ion current measurements

Assignees

• Thermo Fisher Scient Bremen Gmbh

Inventors

• Makarov Alexander Alekseevich

Classifications

• H01J49/40

  Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title

• H01J49/009

  Spectrometers having multiple channels, parallel analysis · CPC title

• H01J49/005 Primary

  by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field · CPC title

• H01J49/0036 Primary

  Step by step routines describing the handling of the data generated during a measurement · CPC title

• H01J49/425

  with a logarithmic radial electric potential, e.g. orbitraps · CPC title