Wet-dry integrated wafer processing system
US-2017271180-A1 · Sep 21, 2017 · US
US10361104B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10361104-B2 |
| Application number | US-201715660784-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 26, 2017 |
| Priority date | Mar 3, 2017 |
| Publication date | Jul 23, 2019 |
| Grant date | Jul 23, 2019 |
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Methods and apparatus for processing a substrate are provided herein. In one implementation, the apparatus includes a load lock chamber coupled to a transfer chamber. The transfer chamber is coupled to a thermal process chamber and a substrate is transferred between each of the load lock chamber, the transfer chamber, and the thermal process chamber. In other implementations, a process platform having a load lock chamber, a transfer chamber, and a thermal process chamber is disclosed. Methods of measuring oxygen concentration in a load lock chamber via evacuation of a transfer chamber are also described herein.
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What is claimed is: 1. A substrate processing apparatus, comprising: a factory interface; a substrate transfer module, comprising: a load lock chamber coupled to the factory interface, wherein the load lock chamber comprises: a chamber body defining a process volume; an exhaust port and a purge gas port in fluid communication with the process volume; and a pedestal disposed in the process volume, wherein the pedestal has a plurality of cooling fluid conduits formed therein; a transfer chamber directly coupled to the load lock chamber, the transfer chamber having a chamber body defining a transfer volume and an oxygen sensor in fluid communication with the transfer volume, the transfer chamber and the load lock chamber configured to generate a substantially inert environment at about atmospheric pressure; and a process module coupled to the substrate transfer module, wherein the process module comprises a plurality of process chambers. 2. The apparatus of claim 1 , wherein the factory interface further comprises: a plurality of front opening unified pods coupled to the factory interface. 3. The apparatus of claim 1 , wherein the substrate transfer module further comprises a second load lock chamber. 4. The apparatus of claim 1 , wherein the substrate transfer module further comprises a second transfer chamber. 5. The apparatus of claim 1 , wherein the load lock chamber has a first slit valve formed in the chamber body adjacent to the factory interface and a first slit valve door coupled to the chamber body adjacent to the first slit valve. 6. The apparatus of claim 5 , wherein the load lock chamber has a second slit valve formed in the chamber body adjacent to the transfer chamber and a second slit valve door coupled to the chamber body adjacent to the second slit valve. 7. The apparatus of claim 6 , wherein a second transfer chamber comprises: a chamber body; an exhaust port disposed in the chamber body; and an exhaust conduit coupled to the chamber body and extending from the exhaust port. 8. A substrate processing apparatus, comprising: a factory interface; a substrate transfer module, comprising: a load lock chamber coupled to the factory interface, the load lock chamber having a chamber body defining a process volume and a purge gas port in fluid communication with the process volume; and a transfer chamber directly coupled to the load lock chamber, the transfer chamber having a chamber body defining a transfer volume and an oxygen sensor in fluid communication with the transfer volume, the transfer chamber and the load lock chamber configured to generate a substantially inert environment at about atmospheric pressure; and a process module coupled to the substrate transfer module, wherein the process module comprises a plurality of process chambers, wherein each of the process chambers is a rapid thermal process chamber. 9. The apparatus of claim 8 , wherein each of the rapid thermal process chambers is a laser thermal process chamber. 10. The apparatus of claim 9 , wherein each of the laser thermal process chambers is operated at about atmospheric pressure. 11. A substrate processing apparatus, comprising: a factory interface, wherein the factory interface comprises: a first transfer chamber having a first robot disposed therein; a substrate transfer module comprising: a load lock chamber coupled to the first transfer chamber; and a second transfer chamber having a second robot disposed therein, the second transfer chamber directly coupled to the load lock chamber, the second transfer chamber having a chamber body defining a transfer volume and an oxygen sensor in fluid communication with the transfer volume, the second transfer chamber and the load lock chamber configured to generate a substantially inert environment at about atmospheric pressure; and a process module coupled to the substrate transfer module, wherein the process module comprises a process chamber, wherein the process chamber is coupled to the second transfer chamber, and wherein the process chamber is selected from the group consisting of a laser thermal process chamber, a deposition chamber, and an etch chamber. 12. The apparatus of claim 11 , wherein the load lock chamber comprises: a chamber body defining a process volume; a purge gas port in fluid communication with the process volume; and an exhaust port in fluid communication with the process volume. 13. A substrate processing apparatus, comprising: a factory interface, wherein the factory interface comprises: a first transfer chamber having a first robot disposed therein; a substrate transfer module comprising: a load lock chamber coupled to the first transfer chamber, wherein the load lock chamber comprises: a chamber body defining a process volume; a purge gas port in fluid communication with the process volume; an exhaust port in fluid communication with the process volume; and a pedestal disposed in the process volume, wherein the pedestal has a plurality of cooling fluid conduits formed therein; a second transfer chamber having a second robot disposed therein, the second transfer chamber directly coupled to the load lock chamber, the second transfer chamber having a chamber body defining a transfer volume and an oxygen sensor in fluid communication with the transfer volume, the second transfer chamber and the load lock chamber configured to generate a substantially inert environment at about atmospheric pressure; and a process module coupled to the substrate transfer module, wherein the process module comprises a process chamber, wherein the process chamber is coupled to the second transfer chamber.
comprising a chamber adapted to a particular process · CPC title
characterised by the construction of the load-lock chamber · CPC title
characterised by the presence of two or more transfer chambers · CPC title
characterised by the layout of the process chambers · CPC title
mainly by convection · CPC title
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