Copper foil with carrier, coreless support with wiring layer, and method for producing printed circuit board

US10356915B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10356915-B2
Application numberUS-201716080442-A
CountryUS
Kind codeB2
Filing dateFeb 21, 2017
Priority dateFeb 29, 2016
Publication dateJul 16, 2019
Grant dateJul 16, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

There is provided a copper foil provided with a carrier exhibiting a high peeling resistance against the developer in the photoresist developing process and achieving high stability of mechanical peel strength of the carrier. The copper foil provided with a carrier comprises a carrier; an interlayer disposed on the carrier, the interlayer having a first surface adjacent to the carrier and containing 1.0 atom % or more of at least one metal selected from the group consisting of Ti, Cr, Mo, Mn, W and Ni and a second surface remote from the carrier and containing 30 atom % or more of Cu; a release layer disposed on the interlayer; and an extremely-thin copper layer disposed on the release layer.

First claim

Opening claim text (preview).

The invention claimed is: 1. A copper foil provided with a carrier, comprising: a carrier composed of glass or ceramics; an interlayer disposed on the carrier, the interlayer having a first surface adjacent to the carrier and containing 1.0 atom % or more at least one metal selected from the group consisting of Ti, Cr, Mo, Mn, W and Ni and a second surface remote from the carrier and containing 30 atom % or more of Cu; a release layer disposed on the interlayer; and an extremely-thin copper layer disposed on the release layer. 2. The copper foil provided with a carrier according to claim 1 , wherein the interlayer has a thickness of 5 to 1000 nm. 3. The copper foil provided with a carrier according to claim 1 , wherein the interlayer comprises; an adhesive metal layer provided on the carrier and composed of at least one metal selected from the group consisting of Ti, Cr, Mo, Mn, W and Ni; and a release assisting layer disposed on the adhesive metal layer and composed of copper. 4. The copper foil provided with a carrier according to claim 3 , wherein the adhesive metal layer has a thickness of 5 to 500 nm. 5. The copper foil provided with a carrier according to claim 3 , wherein the release assisting layer has a thickness of 5 to 500 nm. 6. The copper foil provided with a carrier according to claim 1 , wherein the interlayer is an intermediate alloy layer composed of a copper alloy containing 1.0 atom % or more at least one metal selected from the group consisting of Ti, Cr, Mo, Mn, W and Ni and 30 atom % or more copper. 7. The copper foil provided with a carrier according to claim 6 , wherein the intermediate alloy layer has a thickness of 5 to 500 nm. 8. The copper foil provided with a carrier according to claim 1 , wherein the release layer mainly contains carbon. 9. The copper foil provided with a carrier according to claim 1 , wherein the release layer has a thickness of 1 to 20 nm. 10. The copper foil provided with a carrier according to claim 1 , wherein the surface remote from the release layer of the extremely-thin copper layer has an arithmetic average roughness Ra of 1.0 to 100 nm, measured in accordance with JIS B 0601-2001. 11. The copper foil provided with a carrier according to claim 1 , wherein the surface adjacent to the interlayer of the carrier has an arithmetic average roughness Ra of 0.1 to 70 nm, measured in accordance with JIS B 0601-2001. 12. The copper foil provided with a carrier according claim 1 , wherein the carrier is composed of glass. 13. The copper foil provided with a carrier according to claim 1 , wherein at least the extremely-thin copper layer extends to end faces of the carrier and covers the end faces. 14. A method for manufacturing a coreless support provided with a wiring layer, comprising the steps of: providing the copper foil provided with a carrier according to claim 1 as a support; forming a photoresist layer with a predetermined pattern on the surface of the extremely-thin copper layer; forming an electrolytic copper plating layer on the exposed surface of the extremely-thin copper layer; peeling off the photoresist layer; and removing an unnecessary portion of the extremely-thin copper layer by copper flash etching to prepare a coreless support provided with a wiring layer. 15. A method for manufacturing a printed wiring board, comprising the steps of: manufacturing a coreless support provided with a wiring layer by the method according to claim 14 ; forming a build-up layer on a surface having the wiring layer of the coreless support provided with a wiring layer to prepare a laminate with a build-up layer; separating the laminate with a build-up layer at the release layer to prepare a multilayer wiring board including the build-up layer; and processing the multilayer wiring board to prepare a printed wiring board.

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What does patent US10356915B2 cover?
There is provided a copper foil provided with a carrier exhibiting a high peeling resistance against the developer in the photoresist developing process and achieving high stability of mechanical peel strength of the carrier. The copper foil provided with a carrier comprises a carrier; an interlayer disposed on the carrier, the interlayer having a first surface adjacent to the carrier and conta…
Who is the assignee on this patent?
Mitsui Mining & Smelting Co
What technology area does this patent fall under?
Primary CPC classification C23C14/0605. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Jul 16 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).