Angular velocity sensor and manufacturing method therefor
US-9702698-B2 · Jul 11, 2017 · US
US10353503B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10353503-B2 |
| Application number | US-201514926265-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 29, 2015 |
| Priority date | Oct 29, 2015 |
| Publication date | Jul 16, 2019 |
| Grant date | Jul 16, 2019 |
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An integrated force sensing element includes a piezoelectric sensor formed in an integrated circuit (IC) chip and a strain gauge at least partially overlying the piezoelectric sensor, where the piezoelectric sensor is able to flex. A human-machine interface using the integrated force sensing element may include a conditioning circuit, temperature gauge, FRAM and a processor core.
Opening claim text (preview).
What is claimed is: 1. An integrated force sensing element comprising: a silicon layer having opposite first and second surfaces; a first dielectric layer on the second surface; a piezoelectric sensor including: a first electrode on the first dielectric layer, a piezoelectric material on the first electrode, and a second electrode on the piezoelectric material; a second dielectric layer on the second electrode; a strain gauge on the second dielectric layer, the strain gauge at least partially overlying the piezoelectric sensor, the strain gauge including four thin film resistors forming a Wheatstone bridge; a printed circuit board: and a lead frame mounted to the printed circuit board, the first surface of the silicon layer being attached to the lead frame, with a cavity interposed between the printed circuit board and the piezoelectric sensor. 2. The integrated force sensing element of claim 1 , wherein the silicon layer having a thickness of 75 microns or less. 3. The integrated force sensing element of claim 2 , wherein the silicon layer having a thickness of 50 microns or less. 4. The integrated force sensing element of claim 1 , wherein at least part of the cavity extends through the lead frame to the first surface. 5. The integrated force sensing element of claim 1 , wherein the cavity is interposed between the printed circuit board and the lead frame. 6. The integrated force sensing element of claim 1 , wherein at least part of the cavity is formed by etching the lead frame. 7. The integrated force sensing element of claim 1 , further comprising a mold compound encapsulating at least the second dielectric layer and the strain gauge. 8. The integrated force sensing element of claim 1 , wherein the piezoelectric sensor includes a ferroelectric material selected from a group consisting of: lead zirconate titanate (PZT), aluminum nitride (AlN), and zinc oxide (ZnO). 9. The integrated force sensing element of claim 1 , wherein the strain gauge includes silicon chromium (SiCr). 10. The integrated force sensing element of claim 1 , wherein the silicon layer includes a signal conditioning circuit, the signal conditioning circuit including: a first input coupled to the piezoelectric sensor; a second input coupled to the strain gauge; and a conditioned signal output. 11. A human machine interface (HMI) comprising: an integrated force sensor including: a silicon layer having opposite first and second surfaces; a first dielectric layer on the second surface; a piezoelectric sensor including a first electrode on the first dielectric layer, a piezoelectric material on the first electrode, and a second electrode on the piezoelectric material; a second dielectric layer on the second electrode; and a strain gauge on the second dielectric layer, the strain gauge at least partially overlying the piezoelectric sensor, the strain gauge including four thin film resistors forming a Wheatstone bridge; a printed circuit board; and a lead frame mounted to the printed circuit board, the first surface of the silicon layer being attached to the lead frame, with a cavity interposed between the printed circuit board and the piezoelectric sensor; a processor core; and a conditioning circuit including: a first input coupled to the piezoelectric sensor; a second input coupled to the strain gauge and a conditioned signal output counted to the processor core. 12. The HMI of claim 11 , wherein the silicon layer having a thickness of 75 microns or less. 13. The HMI of claim 11 , wherein at least part of the cavity extends through the lead frame to the first surface. 14. The HMI of claim 11 , wherein the cavity is interposed between the printed circuit board and the lead frame. 15. The HMI of claim 11 , wherein at least part of the cavity is formed by etching the lead frame. 16. The HMI of claim 11 , further comprising a mold compound encapsulating at least the second dielectric layer and the strain gauge. 17. The HMI of claim 11 , wherein the piezoelectric sensor includes a ferroelectric material selected from a group consisting of: lead zirconate titanate (PZT), aluminum nitride (AlN), and zinc oxide. 18. The HMI of claim 11 , wherein the strain gauge includes silicon chromium (SiCr). 19. The HMI of claim 11 , wherein at least one of the processor core, the conditioning circuit, a random access memory (RAM), a temperature sensor or a communications interface is formed in the silicon layer.
using force sensing means to determine a position · CPC title
Control or interface arrangements specially adapted for digitisers · CPC title
using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact · CPC title
by capacitive means · CPC title
using resistance strain gauges · CPC title
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