Measuring apparatus

Patent metadata

Field	Value
Publication number	US-10352690-B2
Application number	US-201715845976-A
Country	US
Kind code	B2
Filing date	Dec 18, 2017
Priority date	Dec 18, 2017
Publication date	Jul 16, 2019
Grant date	Jul 16, 2019

Abstract

A measuring apparatus for measuring surface topography of the slides to be measured of a guide rail is provided. The measuring apparatus includes a plurality of detecting probe and at least one moving device. The detecting probes are mounted on a probe support according to the surface topography of the slides to be measured. The moving device shifts the probe support or the slides to be measured on the cross section of the guide rail so that the detecting probe has a displacement relative to the slides to be measured. Each of the detecting probes has a corresponding coordinate system, and the corresponding coordinate system is different from each other. A standard part is utilized to correct deviations among the corresponding coordinate systems to the same coordinate system, and then the same coordinate system as a benchmark to measure the surface topography of the slides to be measured.

First claim

What is claimed is:

1. A measuring apparatus, configured to measure a plurality of surface profiles of a plurality of to-be-measured guiding rail parts of a slide rail, comprising:
a plurality of measuring probes fixed on a probe holding seat, and the plurality of measuring probes disposed on the probe holding seat according to the plurality of surface profiles of the plurality of to-be-measured guiding rail parts; and
at least one moving device moving the probe holding seat along a cross-section of the plurality of to-be-measured guiding rail parts or the plurality of to-be-measured guiding rail parts, such that there is a relative displacement between the plurality of measuring probes and the plurality of to-be-measured guiding rail parts;
wherein, each of the plurality of measuring probes has a corresponding coordinate system which is different from that of another one of the plurality of measuring probes, and the plurality of surface profiles of the plurality of to-be-measured guiding rail parts are measured by the plurality of measuring probes after the corresponding coordinate systems are calibrated to a same coordinate system through a standard workpiece.

2. The measuring apparatus according to claim 1 , wherein the plurality of measuring probes are contact type linear displacement transducers.

3. The measuring apparatus according to claim 1 , wherein the plurality of measuring probes are optical measuring probes, pneumatic measuring probes or electromagnetic measuring probes.

4. The measuring apparatus according to claim 1 , further comprising:
an absorbing device configured to absorb and fix the slide rail;
a lateral leaning surface, the measuring apparatus leaning on a side of the slide rail with the lateral leaning surface; and
a lateral clamping member configured to clamp the other side of the slide rail with a clamping surface.

5. The measuring apparatus according to claim 4 , wherein the absorbing device is a magnetic absorbing device or a pneumatic absorbing device.

Assignees

• Ind Tech Res Inst

Inventors

• Chen Chien-Wen
• Huang Mao-Sheng

Classifications

• G01B11/24 Primary

  for measuring contours or curvatures · CPC title

• G01B9/0205

  of probe head · CPC title

• G01B21/047

  Accessories, e.g. for positioning, for tool-setting, for measuring probes · CPC title

• G01B5/207 Primary

  using a plurality of fixed, simultaneously operating transducers (G01B5/213 - G01B5/22 take precedence) · CPC title

• G01B5/213

  for measuring radius of curvature · CPC title